KR970054502A - Vertical thin film transistor and its manufacturing method, and pixel array for ultra thin liquid crystal display device using same - Google Patents

Vertical thin film transistor and its manufacturing method, and pixel array for ultra thin liquid crystal display device using same Download PDF

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Publication number
KR970054502A
KR970054502A KR1019950054709A KR19950054709A KR970054502A KR 970054502 A KR970054502 A KR 970054502A KR 1019950054709 A KR1019950054709 A KR 1019950054709A KR 19950054709 A KR19950054709 A KR 19950054709A KR 970054502 A KR970054502 A KR 970054502A
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South Korea
Prior art keywords
source
insulating layer
drain electrodes
semiconductor layer
film transistor
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KR1019950054709A
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Korean (ko)
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KR0176179B1 (en
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김남덕
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김광호
삼성전자 주식회사
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Publication of KR970054502A publication Critical patent/KR970054502A/en
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    • H01L29/78642
    • H01L29/786

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  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)

Abstract

신규한 수직형 박막트랜지스터와 그 제조방법, 및 이를 이용한 초박막액정표시소자용 화소 어레이가 개시되어 있다. 투명한 기판 상에 화소전극이 형성된다. 상기 화소전극 상에는, 오믹 반도체층과 절연층을 사이에 두고 소오스 및 드레인 전극이 테이퍼 식각방법으로 수직구조로써 형성된다. 상기 소오스 및 드레인 전극 상에는 액티브 반도체층 및 게이트절연층이 차례로 형성된다. 상기 게이트절연층 상에는 게이트전극이 소오스 및 드레인 전극에 셀프-얼라인되어 형성된다.A novel vertical thin film transistor, a method of manufacturing the same, and a pixel array for an ultra-thin liquid crystal display device using the same are disclosed. The pixel electrode is formed on the transparent substrate. On the pixel electrode, source and drain electrodes are formed in a vertical structure by a tapered etching method with an ohmic semiconductor layer and an insulating layer interposed therebetween. The active semiconductor layer and the gate insulating layer are sequentially formed on the source and drain electrodes. On the gate insulating layer, a gate electrode is formed by self-aligning the source and drain electrodes.

소오스전극과 게이트전극 간에 오버랩 폭이 형성되지 않아 기생용량을 감소시킬 수 있다.Since an overlap width is not formed between the source electrode and the gate electrode, parasitic capacitance may be reduced.

Description

수직형 박막트랜지스터와 그 제조방법, 및 이를 이용한 초박막액정표시소자용 화소 어레이Vertical thin film transistor and its manufacturing method, and pixel array for ultra thin liquid crystal display device using same

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명에 의한 수직형 박막트랜지스터의 단면도.3 is a cross-sectional view of a vertical thin film transistor according to the present invention.

Claims (5)

투명한 기판; 상기 기판 상에 형성된 화소전극; 상기 화소전극 상에 위치하며, 오믹 반도체층과 절연층을 사이에 두고 테이퍼 식각방법으로 수직구조로써 형성된 소오스 및 드레인 전극; 상기 소오스 및 드레인 전극 상에 차례로 형성된 액티브 반도체층 및 게이트절연층; 및 상기 게이트절연층 상에 위치하며, 상기 소오스 및 드레인 전극에 셀프-얼라인되어 형성된 게이트전극을 구비하는 것을 특징으로 하는 박막트랜지스터.Transparent substrates; A pixel electrode formed on the substrate; Source and drain electrodes disposed on the pixel electrode and formed in a vertical structure by a tapered etching method with an ohmic semiconductor layer and an insulating layer interposed therebetween; An active semiconductor layer and a gate insulating layer sequentially formed on the source and drain electrodes; And a gate electrode disposed on the gate insulating layer and self-aligned to the source and drain electrodes. 제1항에 있어서, 상기 테이퍼 식각으로 형성된 소오스 및 드레인 전극으로 인해, 상기 액티브 반도체층의 경사가 낮아진 것을 특징으로 하는 박막트랜지스터.The thin film transistor of claim 1, wherein the active semiconductor layer is inclined due to the source and drain electrodes formed by the tapered etching. 제1항에 있어서, 상기 오믹 반도체층은 불순물이 도우프된 비정질실리콘으로 형성된 것을 특징으로 하는 박막트랜지스터.The thin film transistor of claim 1, wherein the ohmic semiconductor layer is formed of amorphous silicon doped with impurities. 투명한 기판 상에 화소전극을 형성하는 단계; 상기 결과물 상에 제1 금속층, 제1 오믹 반도체층, 제1 절연층, 제2 오믹 반도체층 및 제2 금속층을 차례로 증착하는 단계; 사진식각 공정으로 상기 적층된 층들을 테이퍼 식각하여 제1 금속층으로 이루어진 드레인전극 및 제2 금속층으로 이루어진 소오스전극을 형성하는 단계; 상기 결과물 상에 액티브 반도체층을 형성하는 단계; 상기 결과물 상에 게이트절연층 및 제2 절연층을 차례로 형성하는 단계; 상기 소오스 및 드레인 전극을 이용하여 백노광을 실시함으로써 상기 결과물 상에 포토레지스트 패턴을 형성하는 단계; 상기 포토레지스트 패턴을 마스크로 하여 상기 제2 절연층을 식각하는 단계; 상기 포토레지스트 패턴을 제거하는 단계; 및 상기 결과물 상에 게이트전극을 형성하는 단계를 구비하는 것을 특징으로 하는 박막트랜지스터의 제조방법.Forming a pixel electrode on the transparent substrate; Sequentially depositing a first metal layer, a first ohmic semiconductor layer, a first insulating layer, a second ohmic semiconductor layer, and a second metal layer on the resultant product; Tapering etching the stacked layers by a photolithography process to form a drain electrode formed of a first metal layer and a source electrode made of a second metal layer; Forming an active semiconductor layer on the resultant; Sequentially forming a gate insulating layer and a second insulating layer on the resultant product; Forming a photoresist pattern on the resultant by performing white exposure using the source and drain electrodes; Etching the second insulating layer using the photoresist pattern as a mask; Removing the photoresist pattern; And forming a gate electrode on the resultant product. 투명한 기판 상에 형성된 화소전극과, 상기 화소전극 상에 위치하며 오믹 반도체층과 절연층을 사이에 두고 테이퍼 식각방법으로 수직구조로써 형성된 소오스 및 드레인 전극과, 상기 소오스 및 드레인 전극 상에 차례로 형성된 액티브 반도체층 및 게이트절연층, 및 상기 게이트절연층 상에 위치하고, 상기 소오스 및 드레인 전극에 셀프-얼라인되어 형성된 게이트전극을 구비하는 박막트랜지스터; 상기 게이트전극에 접속된 게이트 버스라인; 상기 소오스 및 드레인 전극에 접속된 데이터 버스라인; 및 상기 박막트랜지스터 상에 형성되는 스토리지 커패시터를 구비하는 것을 특징으로 하는 초박막액정표시소자용 화소 어레이.A pixel electrode formed on the transparent substrate, a source and drain electrode positioned on the pixel electrode and having a vertical structure by a tapered etching method with an ohmic semiconductor layer and an insulating layer interposed therebetween, and an active layer formed on the source and drain electrodes in this order A thin film transistor having a semiconductor layer and a gate insulating layer and a gate electrode formed on the gate insulating layer and self-aligned to the source and drain electrodes; A gate bus line connected to the gate electrode; A data busline connected to the source and drain electrodes; And a storage capacitor formed on the thin film transistor. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950054709A 1995-12-22 1995-12-22 Vertical type thin film transistor KR0176179B1 (en)

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KR0176179B1 KR0176179B1 (en) 1999-03-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022257183A1 (en) * 2021-06-07 2022-12-15 惠州华星光电显示有限公司 Semiconductor device and method for manufacturing same

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KR101903565B1 (en) 2011-10-13 2018-10-04 삼성디스플레이 주식회사 Thin film transistor array panel and manufacturing method thereof
CN103022148B (en) * 2012-12-14 2016-01-13 京东方科技集团股份有限公司 A kind of array base palte and preparation method thereof, display unit
CN103560114B (en) * 2013-11-15 2017-07-18 京东方科技集团股份有限公司 A kind of tft array substrate and its manufacture method, display device
US10782580B2 (en) 2016-04-29 2020-09-22 Samsung Display Co., Ltd. Array substrate, liquid crystal display device having the same, and method for manufacturing array substrate
CN107331709A (en) * 2017-07-03 2017-11-07 京东方科技集团股份有限公司 Thin film transistor (TFT) and preparation method thereof, display base plate and display device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022257183A1 (en) * 2021-06-07 2022-12-15 惠州华星光电显示有限公司 Semiconductor device and method for manufacturing same

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