TW202024649A - Circuit and method for measuring signal period - Google Patents
Circuit and method for measuring signal period Download PDFInfo
- Publication number
- TW202024649A TW202024649A TW107147109A TW107147109A TW202024649A TW 202024649 A TW202024649 A TW 202024649A TW 107147109 A TW107147109 A TW 107147109A TW 107147109 A TW107147109 A TW 107147109A TW 202024649 A TW202024649 A TW 202024649A
- Authority
- TW
- Taiwan
- Prior art keywords
- clock
- signal
- period
- sampling
- value
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 10
- 238000005070 sampling Methods 0.000 claims abstract description 115
- 230000000737 periodic effect Effects 0.000 claims description 53
- 238000005259 measurement Methods 0.000 claims description 25
- 238000000691 measurement method Methods 0.000 claims description 11
- 230000001934 delay Effects 0.000 claims 1
- 101100328957 Caenorhabditis elegans clk-1 gene Proteins 0.000 description 7
- 101100113692 Caenorhabditis elegans clk-2 gene Proteins 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000012360 testing method Methods 0.000 description 5
- 230000006870 function Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/091—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal the phase or frequency detector using a sampling device
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
Landscapes
- Manipulation Of Pulses (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
- Measurement Of Unknown Time Intervals (AREA)
Abstract
Description
本發明係關於一種信號週期測量電路與方法,特別是關於一種將時脈分成不同相位,再分別進行信號週期測量的電路與方法。The present invention relates to a signal period measurement circuit and method, in particular to a circuit and method for dividing the clock into different phases and then separately measuring the signal period.
傳統的測試裝置要測量週期性的輸入信號時,只能藉由系統時脈(system clock)的正緣去抓取輸入信號,從而藉由標記抓到輸入信號的時間點,估計輸入信號的週期長短。然而,若是系統時脈頻率不高,常常有解析度不足的問題,無法正確估計輸入信號的週期長短。舉例來說,請參考圖1,圖1係繪示傳統的輸入信號與系統時脈的示意圖。如圖1所示,系統時脈clk於第1個週期抓到高位準的輸入信號S_in後,系統時脈clk於第10個週期再次抓到高位準的輸入信號S_in,則可以估計輸入信號的長度是9個系統時脈週期。如果某一個系統時脈的週期是5ns,輸入信號的長度也就是45ns。When the traditional test device wants to measure the periodic input signal, it can only capture the input signal by the positive edge of the system clock, so as to estimate the period of the input signal by marking the time point when the input signal is captured length. However, if the system clock frequency is not high, there is often a problem of insufficient resolution, and the period length of the input signal cannot be accurately estimated. For example, please refer to FIG. 1, which shows a schematic diagram of a traditional input signal and system clock. As shown in Figure 1, after the system clock clk catches the high-level input signal S_in in the first cycle, the system clock clk catches the high-level input signal S_in again in the tenth cycle, and then the input signal can be estimated The length is 9 system clock cycles. If the period of a certain system clock is 5ns, the length of the input signal is 45ns.
然而,從圖1可以看出,實際上輸入信號的長度更接近於8個系統時脈週期,誤差可以達到一個系統時脈。若輸入信號的週期更短,那麼顯然測量出來的週期誤差相對更大。因此,業界需要一種解析度更高的信號週期測量電路與方法。However, it can be seen from Figure 1 that the length of the input signal is actually closer to 8 system clock cycles, and the error can reach one system clock. If the period of the input signal is shorter, then obviously the measured period error is relatively larger. Therefore, the industry needs a signal period measurement circuit and method with higher resolution.
本發明提供了一種信號週期測量電路,可以將時脈分為多個不同相位的週期波形,並依據所述多個週期波形測量輸入信號的週期,從而可以有更高的解析度。The present invention provides a signal period measuring circuit, which can divide the clock into a plurality of periodic waveforms with different phases, and measure the period of an input signal according to the plurality of periodic waveforms, thereby having a higher resolution.
本發明提供一種信號週期測量電路,包含時脈計算模組、波形產生模組、信號取樣模組以及週期記錄模組。時脈計算模組於第一時脈的每一個週期產生時脈計數值。波形產生模組用以由第一時脈的每一個週期產生M個週期波形,所述M個週期波形對應第一時脈的M個相位。信號取樣模組電性連接波形產生模組,用以依據所述M個週期波形取樣輸入信號,以產生相位取樣值。週期記錄模組電性連接時脈計算模組與信號取樣模組,用以記錄目前的時脈計數值與對應的相位取樣值。其中M為大於1的自然數。The invention provides a signal period measurement circuit, which includes a clock calculation module, a waveform generation module, a signal sampling module, and a period recording module. The clock calculation module generates a clock count value in each cycle of the first clock. The waveform generating module is used for generating M periodic waveforms from each period of the first clock, and the M periodic waveforms correspond to the M phases of the first clock. The signal sampling module is electrically connected to the waveform generation module for sampling the input signal according to the M periodic waveforms to generate phase sampling values. The period recording module is electrically connected to the clock calculation module and the signal sampling module for recording the current clock count value and the corresponding phase sampling value. Where M is a natural number greater than 1.
於一些實施例中,波形產生模組可以依序延遲第一時脈以產生所述M個週期波形,其中第i個週期波形的正緣和第i+1個週期波形的正緣有一個時間間隔,i為自然數且i小於M。此外,相位取樣值可以對應所述M個週期波形分別取樣輸入信號的取樣結果。另外,相位取樣值可以具有M個位元,M個位元依序對應第一時脈的M個相位,相位取樣值的第j個位元可以對應第j個週期波形取樣輸入信號的取樣結果,j為自然數且j不大於M。In some embodiments, the waveform generation module may sequentially delay the first clock to generate the M periodic waveforms, where the positive edge of the i-th periodic waveform and the positive edge of the i+1th periodic waveform have a time Interval, i is a natural number and i is less than M. In addition, the phase sampling value may correspond to the sampling results of the input signal respectively sampling the M periodic waveforms. In addition, the phase sample value can have M bits, and the M bits correspond to the M phases of the first clock in sequence, and the jth bit of the phase sample value can correspond to the sampling result of the jth periodic waveform sampling input signal. , J is a natural number and j is not greater than M.
於一些實施例中,信號取樣模組更可以判斷相位取樣值於第一時脈的不同週期是否有變化,當信號取樣模組判斷相位取樣值有變化時,週期記錄模組記錄目前的時脈計數值與對應的相位取樣值。此外,週期記錄模組包含記憶體,記憶體用以儲存目前的時脈計數值與對應的相位取樣值。當信號取樣模組判斷相位取樣值沒有變化時,週期記錄模組不記錄目前的時脈計數值與對應的相位取樣值。In some embodiments, the signal sampling module can further determine whether the phase sampling value changes in different periods of the first clock. When the signal sampling module determines that the phase sampling value has changed, the period recording module records the current clock. The count value and the corresponding phase sampling value. In addition, the period recording module includes a memory, which is used to store the current clock count value and the corresponding phase sampling value. When the signal sampling module determines that the phase sampling value has not changed, the period recording module does not record the current clock count value and the corresponding phase sampling value.
本發明提供了一種信號週期測量方法,可以將時脈分為多個不同相位的週期波形,並依據所述多個週期波形測量輸入信號的週期,從而可以有更高的解析度。The present invention provides a signal period measurement method, which can divide the clock into a plurality of periodic waveforms with different phases, and measure the period of an input signal according to the plurality of periodic waveforms, so that a higher resolution can be achieved.
本發明提供一種信號週期測量方法,包含下列步驟。於第一時脈的每一個週期產生時脈計數值。由第一時脈的每一個週期產生M個週期波形,所述M個週期波形對應第一時脈的M個相位。依據所述M個週期波形取樣輸入信號,以產生相位取樣值。記錄目前的時脈計數值與對應的相位取樣值。其中M為大於1的自然數。The present invention provides a method for measuring signal period, which includes the following steps. The clock count value is generated every cycle of the first clock. Each cycle of the first clock generates M periodic waveforms, and the M periodic waveforms correspond to M phases of the first clock. The input signal is sampled according to the M periodic waveforms to generate phase samples. Record the current clock count value and the corresponding phase sampling value. Where M is a natural number greater than 1.
綜上所述,本發明提供的信號週期測量電路與方法,可以將時脈分為多個不同相位的週期波形,並利用每個週期波形取樣輸入信號,從而取樣次數更多且取樣間隔可以更加地縮短,從而可以更準確、更高解析度地判斷輸入信號的週期。In summary, the signal cycle measurement circuit and method provided by the present invention can divide the clock into multiple periodic waveforms with different phases, and use each periodic waveform to sample the input signal, so that the number of samples is greater and the sampling interval can be increased. The ground is shortened, so that the period of the input signal can be judged more accurately and with higher resolution.
下文將進一步揭露本發明之特徵、目的及功能。然而,以下所述者,僅為本發明之實施例,當不能以之限制本發明之範圍,即但凡依本發明申請專利範圍所作之均等變化及修飾,仍將不失為本發明之要意所在,亦不脫離本發明之精神和範圍,故應將視為本發明的進一步實施態樣。The features, objectives and functions of the present invention will be further disclosed below. However, the following are only examples of the present invention, and should not be used to limit the scope of the present invention, that is, all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention will still be the essence of the present invention. Without departing from the spirit and scope of the present invention, it should be regarded as a further embodiment of the present invention.
請參閱圖2,圖2係繪示依據本發明一實施例的信號週期測量電路的功能方塊圖。如圖2所示,本實施例揭露了信號週期測量電路1用來測量輸入信號S_in的週期,信號週期測量電路1包含時脈計算模組10、波形產生模組12、信號取樣模組14以及週期記錄模組16。實務上,信號週期測量電路1可以用來標記輸入信號S_in的信號開始時間點與信號結束時間點,並將所述信號開始時間點與信號結束時間點記錄起來,再交由其他的測試裝置換算出週期。換句話說,信號週期測量電路1可以組裝在其他的測試裝置中,或者外接到其他的測試裝置。當然,本實施例並不以此為限,例如,信號週期測量電路1也可以自己換算出輸入信號S_in的週期。以下從各個模組分別說明信號週期測量電路1的整體功能。Please refer to FIG. 2. FIG. 2 is a functional block diagram of a signal period measurement circuit according to an embodiment of the present invention. As shown in FIG. 2, this embodiment discloses that the signal
時脈計算模組10於第一時脈CLK的每一個週期產生時脈計數值。於一個例子中,第一時脈CLK可以是系統時脈(system clock)、基頻時脈或者任一指定的時脈,本實施例不加以限制。此外,時脈計算模組10接收到第一時脈CLK後,可以受第一時脈CLK的正緣觸發,而計數第一時脈CLK。於所屬技術領域具有通常知識者,應當可以明白正緣觸發或負緣觸發都可以達到同樣的效果,為了方便說明,以下實施例採用正緣觸發說明。為了方便說明,請一併參閱圖2與圖3,圖3係繪示依據本發明一實施例於取樣輸入信號的示意圖。如圖所示,時脈計算模組10產生的時脈計數值可以標示為CLK_count,初始值可以是任一自然數N。The
於一個例子中,時脈計算模組10計數第一時脈CLK時,可以累加於時脈計數值CLK_count,累加的數值可以是1或其他固定值,本實施例在此不加以限制。換句話說,在圖3繪示的例子中,時脈計算模組10一開始(例如第1個週期)可以傳送時脈計數值CLK_count為N給週期記錄模組16,於第一時脈CLK的下一個週期(例如第2個週期)時,可以傳送時脈計數值CLK_count為N+1給週期記錄模組16,以此類推。In an example, when the
波形產生模組12用以由第一時脈CLK的每一個週期產生M個週期波形,所述M個週期波形對應第一時脈的M個相位。在圖3繪示的例子中,波形產生模組12可以依據第一時脈CLK,產生4個週期波形CLK_1、CLK_2、CLK_3、CLK_4,每一個週期波形的相位相差90度。於一個例子中,波形產生模組12可以包含鎖相迴路(phase-locked loop,PLL),利用鎖相迴路延遲第一時脈CLK,以產生多個不同相位的週期波形。本實施例雖然以波形產生模組12產生4個週期波形為例,但不以此為限,例如波形產生模組12也可以產生8個或16個週期波形。The
信號取樣模組14電性連接波形產生模組12,用以依據所述M個週期波形取樣輸入信號S_in,以產生相位取樣值。於一個例子中,信號取樣模組14可以利用週期波形的正緣取樣輸入信號S_in。以圖3繪示的例子來說,在第一時脈CLK的第1個週期(時脈計數值CLK_count為N到N+1之間)時,信號取樣模組14可以判斷週期波形CLK_1沒有取樣到輸入信號S_in,因為在週期波形CLK_1正緣時,輸入信號S_in仍為低位準。而信號取樣模組14可以判斷週期波形CLK_2、CLK_3、CLK_4有取樣到輸入信號S_in,因為在週期波形CLK_2、CLK_3、CLK_4正緣時,輸入信號S_in為高位準。據此,信號取樣模組14可以將相位取樣值phase_count記錄為0111,表示輸入信號S_in是從第2個相位開始。在此,本實施例示範了相位取樣值phase_count的位元數可以對應週期波形的數目,且經由位元的順序可以了解輸入信號S_in的信號開始時間點可以對應到哪一個相位(哪一個週期波形)。The
同樣地,在第一時脈CLK的第10個週期(時脈計數值CLK_count為N+9到N+10之間)時,信號取樣模組14可以判斷週期波形CLK_1、CLK_2、CLK_3沒有取樣到輸入信號S_in,因為在週期波形CLK_1、CLK_2、CLK_3正緣時,輸入信號S_in仍為低位準。而信號取樣模組14可以判斷週期波形CLK_4有取樣到輸入信號S_in,因為在週期波形CLK_4正緣時,輸入信號S_in為高位準。據此,信號取樣模組14可以將相位取樣值phase_count記錄為0001,表示下一週期的輸入信號S_in是從第4個相位開始。由於輸入信號S_in是連續的信號,藉由測量下一週期的輸入信號S_in信號開始時間點,即等於測知前一週期的輸入信號S_in的信號結束時間點。於一個例子中,信號取樣模組14可以在4個週期波形CLK_1、CLK_2、CLK_3、CLK_4全部取樣完輸入信號S_in之後,再產生相位取樣值phase_count,並且在第一時脈CLK的下一個週期輸出給週期記錄模組16。Similarly, in the 10th cycle of the first clock CLK (clock count value CLK_count is between N+9 and N+10), the
於一個例子中,信號取樣模組14可以判斷何種相位取樣值有物理上的意義。舉例來說,如果前一個相位取樣值phase_count記錄為0000,目前的相位取樣值phase_count仍記錄為0000,表示輸入信號S_in一直位於低準位,從而信號取樣模組14記錄這樣的相位取樣值對測量週期沒有幫助。同樣地,如果前一個相位取樣值phase_count記錄為1111,目前的相位取樣值phase_count同樣記錄為1111,表示輸入信號S_in都位於高準位,從而信號取樣模組14記錄這樣的相位取樣值對測量週期也沒有幫助。但是,如果前一個相位取樣值phase_count記錄為0000,目前的相位取樣值phase_count同樣記錄為0111,信號取樣模組14在相位取樣值phase_count上發現變化,則信號取樣模組14可以判斷目前的相位取樣值phase_count有意義,進而可以將相位取樣值phase_count輸出給週期記錄模組16。反之,信號取樣模組14若判斷目前的相位取樣值phase_count沒有意義,則可以不將相位取樣值phase_count輸出給週期記錄模組16。In one example, the
週期記錄模組16電性連接時脈計算模組10與信號取樣模組14,用以記錄目前的時脈計數值CLK_count與對應的相位取樣值phase_count。以圖3繪示的例子來說,雖然輸入信號S_in的正緣在第一時脈CLK的第1個週期內,但是於所屬技術領域具有通常知識者可以明白的是,電路元件無法在同一個週期內既要取樣又要立刻將取樣結果批次送出,因此實際上週期記錄模組16還是要等到第一時脈CLK的下一個週期(第2個週期)才可能收到來自信號取樣模組14的資料。據此,週期記錄模組16會記錄到輸入信號S_in的信號開始時間點,對應到的時脈計數值CLK_count為N+1且相位取樣值phase_count為0111。The
同理,雖然輸入信號S_in的次一個正緣在第一時脈CLK的第10個週期內,實際上週期記錄模組16還是要等到第一時脈CLK的下一個週期(第11個週期)才可能收到來自信號取樣模組14的資料。據此,週期記錄模組16會記錄到輸入信號S_in的信號結束時間點,對應到的時脈計數值CLK_count為N+10且相位取樣值phase_count為0001。換句話說,輸入信號S_in的一個週期在時脈計數值CLK_count相差了9個週期,且相位取樣值phase_count相差了2個相位。假設當第一時脈CLK的1個週期對應4ns時,4個相位的每個相位恰好間隔1ns。以圖3繪示的例子來說,第一時脈CLK的9個週期可換算成36ns,且第一時脈CLK的2個相位可以換算成2ns,因此可以藉由時脈計數值CLK_count與相位取樣值phase_count,很快地推算出輸入信號S_in的週期是38ns。In the same way, although the next positive edge of the input signal S_in is in the 10th cycle of the first clock CLK, in fact the
在此,於所屬技術領域具有通常知識者可以發現,週期記錄模組16何時取得相位取樣值phase_count並不影響推算輸入信號S_in的週期。舉例來說,縱使週期記錄模組16等到第一時脈CLK的下5個週期才收到來自信號取樣模組14的資料,則輸入信號S_in的信號開始時間點,改成對應到的時脈計數值CLK_count為N+5且相位取樣值phase_count為0111。同樣的,輸入信號S_in的信號結束時間點,改成對應到的時脈計數值CLK_count為N+14且相位取樣值phase_count為0001。由於延遲誤差會被減除,仍然可以計算出輸入信號S_in的一個週期在時脈計數值CLK_count相差了9個週期,且相位取樣值phase_count相差了2個相位。據此,同樣可以推算出輸入信號S_in的週期是38ns,不影響輸入信號S_in的週期測量的結果。Here, those skilled in the art can find that when the
值得一提的是,雖然前述信號取樣模組14是取樣兩次輸入信號S_in的正緣,從而取得輸入信號S_in一個完整週期的開始與結束時間點。但是,本實施例不以此為限,例如信號取樣模組14也可以取樣輸入信號S_in的正緣與接下來的負緣,從而取得輸入信號S_in一個半週期的開始與結束時間點。如此,仍然可以經由半週期推算出完整週期的時間長度。It is worth mentioning that although the aforementioned
前述的例子中,週期記錄模組16除了記錄時脈計數值CLK_count與相位取樣值phase_count之外,也可以進一步換算出輸入信號S_in的週期。當然,於另一個例子中,週期記錄模組16可以僅用來標記輸入信號S_in的信號開始時間點與信號結束時間點,並將時脈計數值CLK_count與相位取樣值phase_count存放在一個記憶體中,再交由其他的測試裝置換算出週期。舉例來說,信號週期測量電路1可以是一種現場可程式化邏輯閘陣列(field programmable gate array,FPGA),而週期記錄模組16的記憶體可以是FPGA中的區塊隨機存取記憶體(block RAM)。In the foregoing example, in addition to recording the clock count value CLK_count and the phase sampling value phase_count, the
為了說明本案的信號週期測量方法,請一併參閱圖2、圖3與圖4,圖4係繪示依據本發明一實施例的信號週期測量方法的步驟流程圖。如圖所示,於步驟S20中,時脈計算模組10於第一時脈CLK的每一個週期產生時脈計數值CLK_count。於步驟S22中,波形產生模組12用以由第一時脈CLK的每一個週期產生M個週期波形,所述M個週期波形對應第一時脈的M個相位。於步驟S24中,信號取樣模組14電性連接波形產生模組12,用以依據所述M個週期波形取樣輸入信號S_in,以產生相位取樣值phase_count。於步驟S26中,週期記錄模組16電性連接時脈計算模組10與信號取樣模組14,用以記錄目前的時脈計數值CLK_count與對應的相位取樣值phase_count。由於本實施例的信號週期測量方法,於前述實施例都已經充分說明與支持,在此不予贅述。In order to explain the signal period measurement method in this case, please refer to FIG. 2, FIG. 3 and FIG. 4 together. FIG. 4 is a flowchart of the steps of the signal period measurement method according to an embodiment of the present invention. As shown in the figure, in step S20, the
綜上所述,本發明提供的信號週期測量電路與方法,可以將時脈分為多個不同相位的週期波形,並利用每個週期波形取樣輸入信號,從而取樣次數更多且取樣間隔可以更加地縮短,從而可以更準確、更高解析度地判斷輸入信號的週期。In summary, the signal cycle measurement circuit and method provided by the present invention can divide the clock into multiple periodic waveforms with different phases, and use each periodic waveform to sample the input signal, so that the number of samples is greater and the sampling interval can be increased. The ground is shortened, so that the period of the input signal can be judged more accurately and with higher resolution.
1:信號週期測量電路10:時脈計算模組12:波形產生模組14:信號取樣模組16:週期記錄模組S20~S26:步驟流程clk:系統時脈CLK:第一時脈CLK_1~CLK_4:週期波形S_in:輸入信號CLK_count:時脈計數值Phase_count:相位取樣值1: Signal cycle measurement circuit 10: Clock calculation module 12: Waveform generation module 14: Signal sampling module 16: Period recording module S20~S26: Step flow clk: System clock CLK: First clock CLK_1~ CLK_4: Periodic waveform S_in: Input signal CLK_count: Clock count value Phase_count: Phase sampling value
圖1係繪示先前技術取樣輸入信號的示意圖。FIG. 1 is a schematic diagram of sampling input signals in the prior art.
圖2係繪示依據本發明一實施例的信號週期測量電路的功能方塊圖。FIG. 2 is a functional block diagram of a signal period measurement circuit according to an embodiment of the invention.
圖3係繪示依據本發明一實施例於取樣輸入信號的示意圖。FIG. 3 is a schematic diagram of sampling an input signal according to an embodiment of the invention.
圖4係繪示依據本發明一實施例的信號週期測量方法的步驟流程圖。FIG. 4 is a flowchart of the steps of a signal period measurement method according to an embodiment of the present invention.
1:信號週期測量電路 1: Signal period measurement circuit
10:時脈計算模組 10: Clock calculation module
12:波形產生模組 12: Waveform generation module
14:信號取樣模組 14: Signal sampling module
16:週期記錄模組 16: Periodic recording module
CLK:第一時脈 CLK: the first clock
S_in:輸入信號 S_in: input signal
Claims (15)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107147109A TWI668453B (en) | 2018-12-26 | 2018-12-26 | Circuit and method for measuring signal period |
CN201910730102.1A CN111371453A (en) | 2018-12-26 | 2019-08-08 | Signal period measuring circuit and method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107147109A TWI668453B (en) | 2018-12-26 | 2018-12-26 | Circuit and method for measuring signal period |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI668453B TWI668453B (en) | 2019-08-11 |
TW202024649A true TW202024649A (en) | 2020-07-01 |
Family
ID=68316192
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107147109A TWI668453B (en) | 2018-12-26 | 2018-12-26 | Circuit and method for measuring signal period |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN111371453A (en) |
TW (1) | TWI668453B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113823245B (en) * | 2021-09-08 | 2022-09-30 | 富奥汽车零部件股份有限公司 | Display screen brightness control method, control device and readable storage medium |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06347569A (en) * | 1993-06-07 | 1994-12-22 | Hokuto Denko Kk | Frequency multiplier circuit and pulse time interval measuring device |
TW445722B (en) * | 2000-04-07 | 2001-07-11 | Via Tech Inc | Glitch-free phase converting method of timing signal and circuit of the same |
US6771103B2 (en) * | 2001-03-14 | 2004-08-03 | Denso Corporation | Time measurement apparatus, distance measurement apparatus, and clock signal generating apparatus usable therein |
JP2003317260A (en) * | 2002-04-23 | 2003-11-07 | Matsushita Electric Ind Co Ltd | Optical disk drive |
CN102334038B (en) * | 2009-02-27 | 2013-11-06 | 古野电气株式会社 | Phase determining device and frequency determining device |
CN101599276A (en) * | 2009-06-30 | 2009-12-09 | 中国科学院上海光学精密机械研究所 | Optical disk jitter characteristic testing device and testing method thereof |
US9541591B2 (en) * | 2014-08-11 | 2017-01-10 | Synopsys, Inc. | Periodic signal measurement using statistical sampling |
-
2018
- 2018-12-26 TW TW107147109A patent/TWI668453B/en not_active IP Right Cessation
-
2019
- 2019-08-08 CN CN201910730102.1A patent/CN111371453A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
TWI668453B (en) | 2019-08-11 |
CN111371453A (en) | 2020-07-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109387776B (en) | Method of measuring clock jitter, clock jitter measuring circuit, and semiconductor device | |
KR101243627B1 (en) | Time measurement using phase shifted periodic waveforms | |
JP6792602B2 (en) | High resolution time-digital converter | |
JP2009510403A (en) | Strobe technique for time stamping digital signals | |
US9568889B1 (en) | Time to digital converter with high resolution | |
US20140306689A1 (en) | High resolution current pulse analog measurement | |
TW202024649A (en) | Circuit and method for measuring signal period | |
US20130015837A1 (en) | On-chip signal waveform measurement circuit | |
CN103675383B (en) | A kind of circuit measuring waveform | |
JPH05209781A (en) | Ultrasonic transmitter/receiver | |
CN110729988B (en) | Circuit, output device, detection system and method for outputting clock jitter signal | |
JP2000035463A (en) | Jitter measuring device and integrated circuit incorporating the device | |
TW200826476A (en) | Phase difference detecting apparatus and method thereof | |
US11397197B2 (en) | Voltage detection system and method | |
TWI514775B (en) | Clock edge detection device and method | |
US20230006903A1 (en) | Systems and methods for timing a signal | |
RU2229138C1 (en) | Meter measuring parameters of harmonic processes | |
RU187313U1 (en) | DIGITAL FREQUENCY METER FOR LOW POWER INTEGRAL CIRCUITS | |
CN107317581B (en) | Time-to-digital converter with high resolution | |
Su et al. | Just-enough strategy for accurate clock jitter measurement using a cyclic time-to-digital converter | |
JPH01143978A (en) | Delay time measuring circuit | |
RU2267792C2 (en) | Digital device for estimating and indicating distortions and amplitude discriminator of digital device | |
US9906355B2 (en) | On-die signal measurement circuit and method | |
CN118625632A (en) | Time-to-digital conversion device, time-to-digital conversion method and chip | |
CN116736678A (en) | Time-to-digital converter, time-to-digital conversion method and device and electronic equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |