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- research-article
Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 36, Issue 3•March 2017, pp 421-434 • https://doi.org/10.1109/TCAD.2016.2611502Power supply fluctuation can be potential threat to the correct operations of processors, in the form of voltage emergency that happens when supply voltage drops below a certain threshold. Noise sensors (with either analog or digital outputs) can be ...
- research-article
Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 35, Issue 8•August 2016, pp 1255-1268 • https://doi.org/10.1109/TCAD.2015.2504329Efficient performance modeling of today’s analog and mixed-signal circuits is an important yet challenging task, due to the high-dimensional variation space and expensive circuit simulation. In this paper, we propose a novel performance modeling ...
- research-article
Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 34, Issue 7•July 2015, pp 1096-1109 • https://doi.org/10.1109/TCAD.2015.2404895Accurately estimating the rare failure rates for nanoscale circuit blocks (e.g., static random-access memory, D flip-flop, etc.) is a challenging task, especially when the variation space is high-dimensional. In this paper, we propose a novel scaled-sigma ...
- research-article
A statistical methodology for noise sensor placement and full-chip voltage map generation
DAC '15: Proceedings of the 52nd Annual Design Automation Conference•June 2015, Article No.: 94, pp 1-6• https://doi.org/10.1145/2744769.2744784Noise margin violation, also known as voltage emergency induced by continuously reducing noise margin and increasing magnitude of current swings, is becoming a severe threat to the correct execution of applications in processors. Noise sensors can be ...
- research-article
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space
ICCAD '14: Proceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design•November 2014, pp 324-331In this paper, we propose a novel subset simulation (SUS) technique to efficiently estimate the rare failure rate for nanoscale circuit blocks (e.g., SRAM, DFF, etc.) in high-dimensional variation space. The key idea of SUS is to express the rare ...
- research-article
Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits
ICCAD '13: Proceedings of the International Conference on Computer-Aided Design•November 2013, pp 795-802In this paper, we describe a novel statistical framework, referred to as Bayesian Model Fusion (BMF), that allows us to minimize the simulation and/or measurement cost for both pre-silicon validation and post-silicon tuning of analog and mixed-signal (...
- research-article
Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space
ICCAD '13: Proceedings of the International Conference on Computer-Aided Design•November 2013, pp 478-485Accurately estimating the rare failure rates for nanoscale circuit blocks (e.g., SRAM, DFF, etc.) is a challenging task, especially when the variation space is high-dimensional. In this paper, we propose a novel scaled-sigma sampling (SSS) method to ...
- research-article
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data
DAC '13: Proceedings of the 50th Annual Design Automation Conference•May 2013, Article No.: 64, pp 1-6• https://doi.org/10.1145/2463209.2488812Efficient high-dimensional performance modeling of today's complex analog and mixed-signal (AMS) circuits with large-scale process variations is an important yet challenging task. In this paper, we propose a novel performance modeling algorithm that is ...
- research-article
Efficient SRAM Failure Rate Prediction via Gibbs Sampling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 31, Issue 12•December 2012, pp 1831-1844 • https://doi.org/10.1109/TCAD.2012.2209884Statistical analysis of SRAM has emerged as a challenging issue because the failure rate of SRAM cells is extremely small. In this paper, we develop an efficient importance sampling algorithm to capture the rare failure event of SRAM cells. In ...
- research-article
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion
ICCAD '12: Proceedings of the International Conference on Computer-Aided Design•November 2012, pp 627-634• https://doi.org/10.1145/2429384.2429519Parametric yield estimation is one of the most critical-yet-challenging tasks for designing and verifying nanoscale analog and mixed-signal circuits. In this paper, we propose a novel Bayesian model fusion (BMF) technique for efficient parametric yield ...
