Article

Dependability Analysis of Nano-scale FinFET circuits

Authors:

Feng Wang,

Yuan Xie,

Kerry Bernstein,

Yan LuoAuthors Info & Claims

ISVLSI '06: Proceedings of the IEEE Computer Society Annual Symposium on Emerging VLSI Technologies and Architectures

Page 399

https://doi.org/10.1109/ISVLSI.2006.35

Published: 02 March 2006 Publication History

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Abstract

FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performance or power advantages of FinFET circuits over bulk CMOS circuits. This paper provides the dependability analysis of FinFET circuits, studying the soft error vulnerability of FinFET circuits and the impact of process variation. Our experiments compare FinFET circuits against bulk CMOS circuits in both 32nm and 45nm technologies, showing that FinFET circuits have better dependability and scalability, which is indicated by better soft error immunity and less impact of process variation. It is concluded that FinFET-based circuit design is more robust than the bulk CMOS based circuit design.

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K AB L(2024)Study on Single Event Upset and Mitigation Technique in JLTFET-Based 6T SRAM CellJournal of Electrical and Computer Engineering10.1155/2024/92120782024Online publication date: 1-Jan-2024
https://dl.acm.org/doi/10.1155/2024/9212078
Riera MCanal RAbella JGonzalez AFanucci LTeich J(2016)A detailed methodology to compute soft error rates in advanced technologiesProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2971856(217-222)Online publication date: 14-Mar-2016
https://dl.acm.org/doi/10.5555/2971808.2971856
Li TAmbrose JRagel RParameswaran S(2016)Processor Design for Soft ErrorsACM Computing Surveys10.1145/299635749:3(1-44)Online publication date: 8-Nov-2016
https://dl.acm.org/doi/10.1145/2996357
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Dependability Analysis of Nano-scale FinFET circuits
1. Hardware

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ISVLSI '06: Proceedings of the IEEE Computer Society Annual Symposium on Emerging VLSI Technologies and Architectures

March 2006

ISBN:0769525334

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IEEE Computer Society

United States

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Published: 02 March 2006

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K AB L(2024)Study on Single Event Upset and Mitigation Technique in JLTFET-Based 6T SRAM CellJournal of Electrical and Computer Engineering10.1155/2024/92120782024Online publication date: 1-Jan-2024
https://dl.acm.org/doi/10.1155/2024/9212078
Riera MCanal RAbella JGonzalez AFanucci LTeich J(2016)A detailed methodology to compute soft error rates in advanced technologiesProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2971856(217-222)Online publication date: 14-Mar-2016
https://dl.acm.org/doi/10.5555/2971808.2971856
Li TAmbrose JRagel RParameswaran S(2016)Processor Design for Soft ErrorsACM Computing Surveys10.1145/299635749:3(1-44)Online publication date: 8-Nov-2016
https://dl.acm.org/doi/10.1145/2996357
Zhang YChen SPeng LChen S(2015)NBTI alleviation on FinFET-made GPUs by utilizing device heterogeneityIntegration, the VLSI Journal10.1016/j.vlsi.2015.04.00351:C(10-20)Online publication date: 1-Sep-2015
https://dl.acm.org/doi/10.1016/j.vlsi.2015.04.003
Kiamehr SOsiecki TTahoori MNassif S(2014)Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET TechnologyProceedings of the 51st Annual Design Automation Conference10.1145/2593069.2593196(1-6)Online publication date: 1-Jun-2014
https://dl.acm.org/doi/10.1145/2593069.2593196
Ramakrishnan VSrinivasan R(2012)Soft error study in double gated FinFET-based SRAM cells with simultaneous and independent driven gatesMicroelectronics Journal10.1016/j.mejo.2012.05.01443:11(888-893)Online publication date: 1-Nov-2012
https://dl.acm.org/doi/10.1016/j.mejo.2012.05.014
Mishra PMuttreja AJha N(2009)Low-power FinFET circuit synthesis using multiple supply and threshold voltagesACM Journal on Emerging Technologies in Computing Systems10.1145/1543438.15434405:2(1-23)Online publication date: 16-Jul-2009
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Choudhary Akundu SLombardi FBhanja SMassoud YBahar R(2009)A process variation tolerant self-compensating FinFET based sense amplifier designProceedings of the 19th ACM Great Lakes symposium on VLSI10.1145/1531542.1531583(161-164)Online publication date: 10-May-2009
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Lin SYang HLuo R(2008)A new family of sequential elements with built-in soft error tolerance for dual-VDD systemsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.5555/1515843.151585416:10(1372-1384)Online publication date: 1-Oct-2008
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Mishra PMuttreja AJha N(2008)Evaluation of multiple supply and threshold voltages for low-power FinFET circuit synthesisProceedings of the 2008 IEEE International Symposium on Nanoscale Architectures10.1109/NANOARCH.2008.4585795(77-84)Online publication date: 12-Jun-2008
https://dl.acm.org/doi/10.1109/NANOARCH.2008.4585795

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Variability analysis of FinFET-based devices and circuits considering electrical confinement and width quantization

Realization and characterization of nano-scale FinFET devices

Performance analysis for reliable nanoscaled FinFET logic circuits

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