research-article

The Total Delay Fault Model and Statistical Delay Fault Coverage

Authors:

Thomas W. WilliamsAuthors Info & Claims

IEEE Transactions on Computers, Volume 41, Issue 6

Pages 688 - 698

https://doi.org/10.1109/12.144621

Published: 01 June 1992 Publication History

Abstract

Delay testing at the operational system clock rate can detect system timing failures caused by delay faults. However, delay fault coverage in terms of the percentage of the number of tested faults may not be an effective measure of delay testing. A quantitative delay fault coverage model to provide a figure of merit for delay testing is presented. System sensitivity of a path to a delay fault along that path and the effectiveness of a delay test are described in terms of the propagation delay of the path under test and the delay defect size. A new statistical delay fault coverage model is established. A defect level model is also proposed as a function of the yield of a manufacturing process and the new statistical delay fault coverage. A new delay testing strategy driven by the defect level for delay faults is proposed.

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Cited By

Al-Terkawi Hasib OSavaria YThibeault C(2019)Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality MetricsJournal of Electronic Testing: Theory and Applications10.1007/s10836-019-05832-w35:6(823-838)Online publication date: 1-Dec-2019
https://dl.acm.org/doi/10.1007/s10836-019-05832-w
Carter JOzev SSorin D(2005)Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide BreakdownProceedings of the conference on Design, Automation and Test in Europe - Volume 110.1109/DATE.2005.94(300-305)Online publication date: 7-Mar-2005
https://dl.acm.org/doi/10.1109/DATE.2005.94
Wang BKuo AFarahmand TIvanov ACho YTabatabaei S(2005)A realistic timing test model and its applications in high-speed interconnect devicesJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-4819-421:6(621-630)Online publication date: 1-Dec-2005
https://dl.acm.org/doi/10.1007/s10836-005-4819-4
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The Total Delay Fault Model and Statistical Delay Fault Coverage

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Published In

cover image IEEE Transactions on Computers

IEEE Transactions on Computers Volume 41, Issue 6

June 1992

132 pages

ISSN:0018-9340

Editor:
Earl Swartzlander
Univ. of Texas at Austin

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Copyright © Copyright © 1992 IEEE. All Rights Reserved.

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IEEE Computer Society

United States

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Published: 01 June 1992

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Cited By

Al-Terkawi Hasib OSavaria YThibeault C(2019)Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality MetricsJournal of Electronic Testing: Theory and Applications10.1007/s10836-019-05832-w35:6(823-838)Online publication date: 1-Dec-2019
https://dl.acm.org/doi/10.1007/s10836-019-05832-w
Carter JOzev SSorin D(2005)Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide BreakdownProceedings of the conference on Design, Automation and Test in Europe - Volume 110.1109/DATE.2005.94(300-305)Online publication date: 7-Mar-2005
https://dl.acm.org/doi/10.1109/DATE.2005.94
Wang BKuo AFarahmand TIvanov ACho YTabatabaei S(2005)A realistic timing test model and its applications in high-speed interconnect devicesJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-4819-421:6(621-630)Online publication date: 1-Dec-2005
https://dl.acm.org/doi/10.1007/s10836-005-4819-4
Li HLi ZMin Y(2000)Reduction of Number of Paths to be Tested in Delay TestingJournal of Electronic Testing: Theory and Applications10.1023/A:100836861593816:5(477-485)Online publication date: 1-Oct-2000
https://dl.acm.org/doi/10.1023/A%3A1008368615938
Jone WHo YDas S(1997)Delay Fault Coverage Enhancement Using Multiple Test Observation TimesProceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications10.5555/523974.834858Online publication date: 4-Jan-1997
https://dl.acm.org/doi/10.5555/523974.834858
Jone WHo YDas S(1997)Delay Fault Coverage Enhancement Using Variable Observation TimesJournal of Electronic Testing: Theory and Applications10.1023/A:100826630569411:2(131-146)Online publication date: 1-Oct-1997
https://dl.acm.org/doi/10.1023/A%3A1008266305694

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