Marinissen et al., 1999 - Google Patents

Towards a standard for embedded core test: An example

Marinissen et al., 1999

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Document ID
16250926906329378908
Author
Marinissen E
Zorian Y
Kapur R
Taylor T
Whetsel L
Publication year
Publication venue
International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034)

External Links

Snippet

Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of …
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Classifications

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