TW200609591A - Probe block for lcd inspection system - Google Patents

Probe block for lcd inspection system

Info

Publication number
TW200609591A
TW200609591A TW094130491A TW94130491A TW200609591A TW 200609591 A TW200609591 A TW 200609591A TW 094130491 A TW094130491 A TW 094130491A TW 94130491 A TW94130491 A TW 94130491A TW 200609591 A TW200609591 A TW 200609591A
Authority
TW
Taiwan
Prior art keywords
pads
inspection system
lcd panel
probe block
lcd
Prior art date
Application number
TW094130491A
Other languages
Chinese (zh)
Inventor
Moo-Woong Han
Jun-Soo Cho
Original Assignee
Sedicon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sedicon Co Ltd filed Critical Sedicon Co Ltd
Publication of TW200609591A publication Critical patent/TW200609591A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

Provided is a probe block for an LCD inspection system that can minimize the damage of pads on an LCD panel and pads on a semiconductor integrated circuit located close to the inspection system that drives the LCD panel when connected to the pads and can reduce alignment errors. In the probe block, the probes are completely inserted into slits in a front end fixing slit unit and a rear red fixing slit unit and then coupled with a head base block. In this state, the probes are connected to the pads on the LCD panel and the pads on the semiconductor integrated circuit located close to the inspection system that drive the LCD panel.
TW094130491A 2004-09-09 2005-09-06 Probe block for lcd inspection system TW200609591A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040072014A KR20060023250A (en) 2004-09-09 2004-09-09 Probe block of lcd inspection system

Publications (1)

Publication Number Publication Date
TW200609591A true TW200609591A (en) 2006-03-16

Family

ID=37129496

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094130491A TW200609591A (en) 2004-09-09 2005-09-06 Probe block for lcd inspection system

Country Status (2)

Country Link
KR (1) KR20060023250A (en)
TW (1) TW200609591A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100692179B1 (en) * 2006-05-01 2007-03-12 주식회사 코디에스 Probe assembly for inspecting of flat panel display
KR100880678B1 (en) * 2007-06-22 2009-02-02 이석행 A structure for fixing needles of probe station
KR101019077B1 (en) * 2008-10-28 2011-03-07 윌테크놀러지(주) Probe block unit and probe card having the same
CN102103152A (en) * 2009-12-22 2011-06-22 沋博普利斯金股份有限公司 Integrated probe module easy to use for entire liquid crystal display (LCD) detection equipment
KR102498040B1 (en) * 2021-02-22 2023-02-10 (주)포인트엔지니어링 The Electro-conductive Contact Pin Assembly

Also Published As

Publication number Publication date
KR20060023250A (en) 2006-03-14

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