JP2013109294A - Microscope device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a microscope device in which, by using a single imaging element, the image of a sample can be captured simultaneously as two images with parallax.SOLUTION: A microscope device 1 includes a first image forming optical system 9a where the light from a sample S collected by an object lens 8 is formed as a first image and a second image forming optical system 9b where the light from the sample S collected by the object lens 8 is formed as a second image, and an imaging element 10 that is arranged at focal positions of the first image forming optical system 9a and the second image forming optical system 9b and includes a first imaging area R1 where the first image is formed and a second imaging area R2 where the second image is formed.

Description

  The present invention relates to a microscope apparatus.

2. Description of the Related Art Conventionally, a microscope apparatus including an image sensor that captures an image of a sample as two images with parallax is known (see, for example, Patent Document 1 and Patent Document 2).
The microscope apparatus described in Patent Document 1 forms images of two samples having parallax with each other on the imaging surfaces of two imaging elements.

  Moreover, the microscope apparatus described in Patent Document 2 forms two sample images with parallax in the same region of a single image sensor. The microscope apparatus described in Patent Document 2 includes a shutter mechanism that can be operated independently of each of two imaging optical systems for forming images of two samples. By blocking one of the optical paths in a time-division manner, images of two samples having parallax are captured using a single image sensor.

JP-A-2005-351916 JP 2010-128354 A

However, the microscope apparatus described in Patent Document 1 requires two imaging elements to capture a sample image as two images with parallax, and there is a problem that the manufacturing cost of the apparatus increases.
Moreover, since the microscope apparatus described in Patent Document 2 captures two images with parallax in a time-division manner, it cannot obtain two images at the same time. For example, in order to display two images with parallax on the display device at the same time, a configuration for displaying the two images captured in a time division manner in an appropriate combination is required.

  The present invention has been made in view of the above-described circumstances, and an object of the present invention is to provide a microscope apparatus that can simultaneously image a sample image as two parallax images using a single image sensor. Yes.

In order to achieve the above object, the present invention provides the following means.
The present invention provides an objective optical system that condenses light from a sample, a first imaging optical system that forms light from the sample collected by the objective optical system as a first image, A second image-forming optical system having an optical axis different from that of the first image-forming optical system and forming light from the sample collected by the objective optical system as a second image; A first imaging region on which the first image is formed and a second image on which the second image is formed, which are arranged at focal positions of the first imaging optical system and the second imaging optical system; A microscope apparatus is provided that includes an imaging device having a plurality of imaging regions.

  According to the present invention, the imaging element is disposed at the focal position of the first imaging optical system and the second imaging optical system having different optical axes, and the first imaging optical system is the first imaging optical system. The first image is formed on the imaging region of the imaging element, and the second imaging optical system forms the second image on the second imaging region of the imaging device. Each image is acquired. Therefore, it is possible to provide a microscope apparatus that can simultaneously image a sample image as two images with parallax using a single image sensor.

In the above-mentioned invention, the illumination optical system for irradiating the sample with illumination light emitted from a light source is provided, and the illumination optical system collects the illumination light emitted from the light source; A field stop that limits a light beam diameter of the light collected by the collector lens, and a condenser lens that irradiates the sample surface on which the sample is placed with the light beam diameter limited by the field stop, A microscope apparatus configured so as to satisfy the conditional expression (2) is preferable.
A × β <C (1)
A × β + C <D (2)
here,
A: an illumination range of the illumination light on the sample surface;
β: overall magnification of the microscope device,
C: the distance between the optical axis of the first imaging optical system and the optical axis of the second imaging optical system;
D: full width of the imaging region of the imaging device in a direction perpendicular to the optical axis of the first imaging optical system and the optical axis of the second imaging optical system.

  By doing so, the first imaging region and the second imaging region are prevented from overlapping with each other in the first imaging region and the second imaging region R2, and the first imaging region and the second imaging region are connected to each other. The imaging region of the imaging element in the direction orthogonal to the optical axis of the imaging optical system and the optical axis of the second imaging optical system can be accommodated.

  In the invention described above, a plurality of sets of imaging optical systems, each of which includes the first imaging optical system and the second imaging optical system as a set of imaging optical systems, are provided. The optical system includes a distance between an optical axis of the first imaging optical system and an optical axis of the second imaging optical system and / or an optical axis of the first imaging optical system and the second connection. It is preferable that the arrangement directions of the optical axes of the image optical systems are different from each other and the plurality of sets of the imaging optical systems can be switched and used. By doing so, it is possible to switch and capture a plurality of types of images having different parallax magnitudes and / or parallax directions.

  In the above invention, the first imaging optical system is disposed between the first imaging optical system and the second imaging optical system, and light from the first imaging optical system enters the second imaging region. A configuration including a light shielding plate that restricts the image formation and the light from the second imaging optical system from being imaged in the first imaging region is preferable. By doing so, the light from the first imaging optical system is imaged on the second imaging region, or the light from the second imaging optical system is imaged on the first imaging region. Can be reliably limited. Therefore, it is possible to reduce the occurrence of crosstalk in which the first image formed by the first image forming optical system and the second image formed by the second image forming optical system intersect.

  According to the present invention, there is an effect that it is possible to provide a microscope apparatus that can simultaneously image a sample image as two images with parallax using a single image sensor.

It is a figure which shows the microscope apparatus of the 1st Embodiment of this invention. It is a figure which shows the microscope apparatus of the modification of the 1st Embodiment of this invention. It is a figure which shows the structure of the turret which enables switching of several sets of imaging optical systems. It is a figure which shows the lens structure of the Example of the microscope apparatus of FIG. It is a figure which shows the lens structure of the Example of the microscope apparatus of FIG. It is a figure which shows the microscope apparatus of the 2nd Embodiment of this invention. It is a figure which shows the light-shielding plate of the 2nd Embodiment of this invention. FIG. 5 is an aberration diagram of the microscope apparatus of FIG. 4. FIG. 6 is an aberration diagram of the microscope apparatus in FIG. 5.

<First Embodiment>
A microscope apparatus 1 according to a first embodiment of the present invention will be described below with reference to the drawings.
As shown in FIG. 1, the microscope apparatus 1 according to the present embodiment includes an illumination optical system 20 that irradiates the sample S with illumination light emitted from the light source 2, and an objective lens that condenses the light from the sample S ( (Objective optical system) 8, first imaging optical system 9 a that forms light from the sample S collected by the objective lens 8 as a first image, and sample S collected by the objective lens 8. Are arranged at the focal positions of the second imaging optical system 9b that forms the second image as a second image, and the first imaging optical system 9a and the second imaging optical system 9b. The imaging device 10 having the first imaging region R1 to be imaged and the second imaging region R2 to form the second image, and the first image and the second image captured by the imaging device 10 Each of the image acquisition unit 11 for acquiring the first image and the second image acquired by the image acquisition unit 11. It provided with a Shimesuru display unit 12.

  The illumination optical system 20 of the present embodiment includes a collector lens 3 that condenses illumination light emitted from a light source 2 such as a halogen lamp, and a field stop 4 that restricts the beam diameter of light collected by the collector lens 3. A mirror 5 that reflects the light beam that has passed through the field stop 4 vertically upward, and a condenser lens 7 that condenses the light beam reflected by the mirror 5 and irradiates the sample surface 13 on which the sample S is placed. .

  Instead of the illumination optical system 20 shown in FIG. 1, the illumination optical system 20 shown in FIG. 2 may be adopted. In the illumination optical system 20 shown in FIG. 2, the configuration of the light source 2, the collector lens 3, and the field stop 4 is the same as that of the illumination optical system 20 shown in FIG. The illumination optical system 20 shown in FIG. 2 does not include the mirror 5 and the condenser lens 7 of the illumination optical system 20 shown in FIG. Instead, the illumination optical system 20 shown in FIG. 2 includes a field lens 14 and a half mirror 15.

  The field lens 14 of the illumination optical system 20 shown in FIG. 2 condenses the light beam that has passed through the field stop 4 and emits it to the half mirror 15. The half mirror 15 reflects the light beam incident from the field lens 14 downward in the vertical direction. The light beam incident on the objective lens 8 by the half mirror 15 is condensed by the objective lens 8 and applied to the sample surface 13 on which the sample S is placed.

  The field stop 4 provided in the illumination optical system 20 shown in FIGS. 1 and 2 limits the diameter of the light beam collected by the collector lens 3 to the diameter B. Here, the field stop 4 can adjust the diameter B in a plurality of stages. That is, the diameter B can be adjusted in a plurality of stages by the operation of the operator of the microscope apparatus 1.

  Since the field stop 4 is disposed at a position optically conjugate with the sample surface 13, the illumination light irradiated onto the sample surface 13 by the condenser lens 7 is adjusted by adjusting the beam diameter of the light passing through the field stop. Range A is adjusted. Therefore, the illumination range A can be adjusted by adjusting the diameter B of the field stop 4.

  The light from the sample S irradiated with illumination light in the illumination range A by the illumination optical system 20 shown in FIGS. 1 and 2 is collected by the objective lens 8 and has a first optical imaging system having different optical axes. 9a and the second imaging optical system 9b are respectively incident.

  An imaging element 10 is disposed at the focal position of the first imaging optical system 9a and the second imaging optical system 9b. The imaging element 10 has a width D of the entire width of the imaging region in a direction orthogonal to the optical axis of the first imaging optical system 9a and the optical axis of the second imaging optical system 9b.

  A first image is formed on the first imaging region R1 of the imaging element 10 by the first imaging optical system 9a. In addition, a second image is formed on the second imaging region R2 of the imaging element 10 by the second imaging optical system 9b. Therefore, it is possible to provide the microscope apparatus 1 that can simultaneously capture the image of the sample S as two images with parallax using the single image sensor 10.

  Here, it is assumed that the imaging device 10 is an imaging device capable of capturing a two-dimensional image such as a CCD (Charge Coupled Device). The imaging element 10 includes a plurality of pixels in the vertical and horizontal directions, and each pixel outputs a voltage corresponding to the luminance of the image incident on the imaging region. The voltage corresponding to the luminance of each pixel is acquired for each pixel by the image acquisition unit 11.

  The image acquisition unit 11 converts a voltage corresponding to the luminance of each pixel acquired from the image sensor 10 into a digital value having a resolution of, for example, 256 levels using the A / D conversion unit 11a, and corresponds to the luminance of each pixel. The digital value is stored in the storage unit 11b.

  In the storage unit 11b, a digital value corresponding to the first image formed by the first imaging optical system 9a is stored as first image data, and is imaged by the second imaging optical system 9b. A digital value corresponding to the second image is stored as second image data. The first image data and the second image data stored in the storage unit 11b are processed by the processing unit 11c, converted into stereoscopic image data that can be displayed as a stereoscopic image on the display unit 12, and displayed on the display unit 12. Is done.

Here, the relationship between the illumination range A of the irradiation light irradiated on the sample surface 13 by the illumination optical system 20 and the full width D of the imaging region of the imaging device 10 will be described.
As described above, the light from the sample S is collected by the objective lens 8 and is incident on each of the first imaging optical system 9a and the second imaging optical system 9b. Then, the first imaging optical system 9a forms a first image on the first imaging region R1 of the imaging device 10, and the second imaging optical system 9b forms the second imaging region R2 of the imaging device 10. A second image is formed.

  Here, when the first imaging region R1 and the second imaging region R2 overlap, a phenomenon called so-called crosstalk occurs in which the first image and the second image intersect in the overlapping region. Will occur. When this phenomenon occurs, the first image and the second image do not become clear images representing the sample S, respectively. Therefore, it is desirable that the first imaging region R1 and the second imaging region R2 do not overlap.

When the illumination range of the illumination light on the sample surface 13 is A and the total magnification of the microscope apparatus 1 is β, the widths of the first imaging region R1 and the second imaging region R2 are respectively A × β. Therefore, if the distance between the optical axis of the first imaging optical system 9a and the optical axis of the second imaging optical system 9b is C, the first imaging region R1 and the second imaging region R2 do not overlap. The following is derived as a conditional expression for doing so.
A × β <C (1)

Further, since the entire width of the imaging region of the imaging device 10 in the direction orthogonal to the optical axis of the first imaging optical system 9a and the optical axis of the second imaging optical system 9b is the width D, the width D One imaging area R1 and second imaging area R2 need to be accommodated. Therefore, the following is derived as a conditional expression for fitting the first imaging region R1 and the second imaging region R2 to the full width D of the imaging region of the imaging element 10.
A × β + C <D (2)

  The illumination range A, the overall magnification β of the microscope apparatus 1, the optical axis of the first imaging optical system 9a, and the optical axis of the second imaging optical system 9b so as to satisfy the above conditional expressions (1) and (2) And the full width D of the imaging region of the imaging device 10 in a direction orthogonal to the optical axis of the first imaging optical system 9a and the optical axis of the second imaging optical system 9b. By doing so, the first imaging region R1 and the second imaging region R2 are prevented from overlapping with each other, and the first imaging region R1 and the second imaging region R2 are prevented from occurring. Can be accommodated in the entire width D of the imaging region of the imaging device 10.

  Next, the imaging optical system 9 of this embodiment will be described. 1 and FIG. 2, a pair of imaging optical systems is shown as the first imaging optical system 9a and the second imaging optical system 9b, but the imaging optical system 9 of the present embodiment is As shown in FIG. 3, a plurality of sets of imaging optical systems are provided. FIG. 3 is a diagram illustrating the configuration of the turret that enables switching between a plurality of sets of the imaging optical system 9. FIG. 3 is a plan view of the imaging optical system 9 viewed from the direction of the image sensor 10.

  In FIG. 3, each of the first imaging optical system 9a and the second imaging optical system 9b has a D-cut shape in which a circular arc of a circular lens is cut. A set of imaging optical systems is configured by bringing flat portions from which some arcs are cut into contact with each other. This D-cut imaging optical system has the advantages of a large numerical aperture NA and high lens resolution.

  In FIG. 3, the first imaging optical system 9c and the second imaging optical system 9d each constitute a set of imaging optical systems by combining circular lenses. The direction orthogonal to the optical axes of the first imaging optical system 9c and the second imaging optical system 9d is the direction orthogonal to the optical axes of the first imaging optical system 9a and the second imaging optical system 9b. And 90 ° different. That is, the first imaging optical system 9c and the second imaging optical system 9d, and the first imaging optical system 9a and the second imaging optical system 9b are different in the direction of parallax by 90 °. .

  Therefore, according to the first imaging optical system 9c and the second imaging optical system 9d, an image having a parallax in a direction different by 90 ° from the first imaging optical system 9a and the second imaging optical system 9b. Can be obtained.

  In FIG. 3, the first image forming optical system 9e and the second image forming optical system 9f each constitute a set of image forming optical systems by combining circular lenses. The direction orthogonal to the optical axes of the first imaging optical system 9e and the second imaging optical system 9f is orthogonal to the optical axes of the first imaging optical system 9a and the second imaging optical system 9b. Is the same. The distance between the optical axes of the first imaging optical system 9e and the second imaging optical system 9f is the distance between the optical axes of the first imaging optical system 9c and the second imaging optical system 9d. Is the same.

  In FIG. 3, the first imaging optical system 9h and the second imaging optical system 9i each constitute a set of imaging optical systems by combining circular lenses. The direction orthogonal to the optical axes of the first imaging optical system 9h and the second imaging optical system 9i is the direction orthogonal to the optical axes of the first imaging optical system 9a and the second imaging optical system 9b. And 90 ° different. The distance between the optical axes of the first imaging optical system 9h and the second imaging optical system 9i is the distance between the optical axes of the first imaging optical system 9c and the second imaging optical system 9d. Shorter than.

  Therefore, according to the first imaging optical system 9h and the second imaging optical system 9i, it is possible to acquire an image with less parallax than the first imaging optical system 9c and the second imaging optical system 9d. Can do.

  In FIG. 3, the first imaging optical system 9j and the second imaging optical system 9k each constitute a set of imaging optical systems by combining circular lenses. The direction perpendicular to the optical axes of the first imaging optical system 9j and the second imaging optical system 9k is perpendicular to the optical axes of the first imaging optical system 9a and the second imaging optical system 9b. Is the same. The distance between the optical axes of the first imaging optical system 9j and the second imaging optical system 9k is the distance between the optical axes of the first imaging optical system 9e and the second imaging optical system 9f. Shorter than.

  Therefore, according to the first imaging optical system 9j and the second imaging optical system 9k, it is possible to acquire an image with less parallax than the first imaging optical system 9e and the second imaging optical system 9f. Can do.

  As described above, the microscope apparatus 1 according to the present embodiment has a plurality of sets (9a and 9b, 9c and 9d, and 9c and 9d, each including the first imaging optical system and the second imaging optical system as a set of imaging optical systems). 9e and 9f, 9i and 9h, and 9j and 9k). The plurality of sets of imaging optical systems include a distance between the optical axis of the first imaging optical system and the optical axis of the second imaging optical system and / or the optical axis of the first imaging optical system. The arrangement directions of the optical axes of the two imaging optical systems are different from each other.

  Further, in FIG. 3, the imaging optical system 9g is constituted by one circular lens unlike the other imaging optical systems. Therefore, according to the imaging optical system 9g, it is possible to acquire one image without parallax with high resolution using a wide imaging region of the imaging device 10.

  Note that the five image forming optical systems (9a and 9b, 9c and 9d, 9e and 9f, 9i and 9h, 9j and 9k) and the image forming optical system 9g shown in FIG. By rotating, it can be switched and used as the imaging optical system of the microscope apparatus 1. Specifically, five sets of image formation are performed by moving other image formation optical systems to positions where the first image formation optical system 9a and the second image formation optical system 9b are arranged in FIG. Either the optical system or the imaging optical system 9g can be switched and used. By doing so, it is possible to switch and capture a plurality of types of images having different parallax magnitudes and / or parallax directions.

<First embodiment>
Next, a first example of the microscope apparatus 1 according to the first embodiment of the present invention will be described below.
The lens arrangement of the microscope apparatus 1 according to the present embodiment is shown in FIG. 4, lens data is shown in Table 1, and aberration diagrams are shown in FIG. In FIG. 4, only part of the surface numbers are shown and others are omitted. The imaging optical system 9 shown in FIG. 4 is an optical system in which the first imaging optical system 9a and the second imaging optical system 9b shown in FIG.

  FIG. 8 is a lateral aberration diagram of the microscope apparatus 1 having the lens arrangement shown in FIG. The angle shown in the center of each of FIGS. 8A to 8C indicates the horizontal field angle and the vertical field angle in FIG. In each figure, the right side shows lateral aberration in the X direction (sagittal direction), and the left side shows lateral aberration in the Y direction (meridional direction). In FIG. 8A, the negative angle of view in the horizontal direction means that the angle is clockwise with respect to the positive direction of the Y axis. Each aberration indicates an aberration on the object surface by reverse tracking.

[Table 1]
Surface number Curvature radius Surface spacing Refractive index Abbe number Object surface ∞ 22.97
(Objective lens 8)
1 55.38 3.42 1.4970 81.5
2-26.01 0.24
3 15.43 4.43 1.6679 55.3
4-52.53 1.62 1.5317 48.9
5 10.57 6.37
6-10.02 1.75 1.5955 39.2
7 111.49 5.18 1.4970 81.5
8-20.91 0.72
9 -52.75 2.68 1.4875 70.2
10-21.88 0.56
11 -52.75 2.68 1.4875 70.2
12 -21.88 Eccentricity [1]
(Imaging optical system 9)
13 55.80 1.98 1.5168 64.2
14 -40.17 1.60 1.6727 32.3
15-116.32 88.45
Image plane ∞ 0.00
Eccentric [1]
X 0.00 Y -4.00 Z 0.00
α 0.00 β 0.00 γ 0.00

<Second embodiment>
Next, a second example of the microscope apparatus 1 according to the first embodiment of the present invention will be described below.
FIG. 5 shows the lens arrangement of the microscope apparatus 1 according to this example, Table 2 shows lens data, and FIG. 9 shows aberration diagrams. In FIG. 5, only part of the surface numbers are shown and others are omitted. Further, the imaging optical system 9 shown in FIG. 5 is an optical system that is the imaging optical system 9g shown in FIG.

  FIG. 9 is a lateral aberration diagram of the microscope apparatus 1 having the lens arrangement shown in FIG. The angle shown in the center of each of FIGS. 9A to 9C indicates the horizontal field angle and the vertical field angle in FIG. In each figure, the right side shows lateral aberration in the X direction (sagittal direction), and the left side shows lateral aberration in the Y direction (meridional direction). In FIG. 9A, the negative angle of view in the horizontal direction means that the angle is clockwise with respect to the positive direction of the Y axis. Each aberration indicates an aberration on the object surface by reverse tracking.

[Table 2]
Surface number Curvature radius Surface spacing Refractive index Abbe number Object surface ∞ 22.97
(Objective lens 8)
1 55.38 3.42 1.4970 81.5
2-26.01 0.24
3 15.43 4.43 1.6679 55.3
4-52.53 1.62 1.5317 48.9
5 10.57 6.37
6-10.02 1.75 1.5955 39.2
7 111.49 5.18 1.4970 81.5
8-20.91 0.72
9 -52.75 2.68 1.4875 70.2
10-21.88 0.56
11 -52.75 2.68 1.4875 70.2
12 -21.88 Eccentricity [1]
(Imaging optical system 9)
13 55.87 5.62 1.5168 64.2
14 -39.06 2.81 1.6727 32.3
15-112.60 86.10.
Image plane ∞ 0.00
Eccentric [1]
X 0.00 Y 0.00 Z 0.00
α 0.00 β 0.00 γ 0.00

<Second Embodiment>
Next, a microscope apparatus 1 according to a second embodiment of the present invention will be described below with reference to the drawings.
In the microscope apparatus 1 according to the present embodiment, portions having the same configuration as those of the microscope apparatus 1 according to the first embodiment are denoted by the same reference numerals and description thereof is omitted. The microscope apparatus 1 of the second embodiment is different from the microscope apparatus 1 of the first embodiment in that a light shielding plate 17 is added.

  In the microscope apparatus 1 of the first embodiment, the imaging optical system 9 can be switched by the configuration of the turret shown in FIG. 3, but the microscope apparatus 1 of the second embodiment is different from the imaging optical system. 9, only one set of the first imaging optical system 9a and the second imaging optical system 9b is fixedly used.

  As shown in FIG. 6, the light shielding plate 17 is provided between the first imaging optical system 9a and the second imaging optical system 9b. The lower end of the light shielding plate 17 is in the vicinity of the objective lens 8, and the upper end of the light shielding plate 17 is in the vicinity of the image sensor 10. A plan view of the light shielding plate 17 viewed from the direction of the image sensor 10 is as shown in FIG.

  According to the microscope apparatus 1 of the second embodiment, the light shielding plate 17 is arranged between the first imaging optical system 9a and the second imaging optical system 9b, and the first imaging optical system 9a Can be reliably restricted from being imaged in the second imaging region R2 and the light from the second imaging optical system 9b being imaged in the first imaging region R1.

  Thus, the light from the first imaging optical system 9a is imaged on the second imaging region R2, and the light from the second imaging optical system 9b is imaged on the first imaging region. It is possible to prevent image formation on R1. Therefore, it is possible to reduce the occurrence of crosstalk in which the first image formed by the first image forming optical system 9a and the second image formed by the second image forming optical system 9b intersect. it can.

S Sample 1 Microscope device 2 Light source 4 Field stop 8 Objective lens 9 Imaging optical system 9a First imaging optical system 9b Second imaging optical system 10 Imaging device 11 Image acquisition unit 12 Display unit 13 Sample surface 17 Light shielding plate 20 Illumination optics

Claims (4)

An objective optical system for collecting light from the sample;
A first imaging optical system that forms light from the sample collected by the objective optical system as a first image;
A second image-forming optical system having an optical axis different from that of the first image-forming optical system and forming light from the sample collected by the objective optical system as a second image;
A first imaging region that is disposed at a focal position of the first imaging optical system and the second imaging optical system and forms the first image and the second image are formed. A microscope apparatus comprising: an image sensor having a second imaging region. An illumination optical system for irradiating the sample with illumination light emitted from a light source;
The illumination optical system collects the illumination light emitted from the light source, a collector lens that condenses the light beam diameter of the light collected by the collector lens, and the light beam diameter is limited by the field stop A condenser lens that irradiates the sample surface on which the sample is placed with the light,
The microscope apparatus according to claim 1, wherein the following conditional expression is satisfied.
A × β <C (1)
A × β + C <D (2)
here,
A: an illumination range of the illumination light on the sample surface;
β: overall magnification of the microscope device,
C: the distance between the optical axis of the first imaging optical system and the optical axis of the second imaging optical system;
D: full width of the imaging region of the imaging device in a direction perpendicular to the optical axis of the first imaging optical system and the optical axis of the second imaging optical system. A plurality of sets of imaging optical systems in which the first imaging optical system and the second imaging optical system are a set of imaging optical systems;
The plurality of sets of imaging optical systems include a distance between an optical axis of the first imaging optical system and an optical axis of the second imaging optical system and / or an optical axis of the first imaging optical system. And the arrangement direction of the optical axes of the second imaging optical system are different from each other,
The microscope apparatus according to claim 1, wherein the plurality of sets of imaging optical systems can be switched and used.   Disposed between the first imaging optical system and the second imaging optical system, and light from the first imaging optical system is imaged on the second imaging region; and The microscope apparatus according to claim 1, further comprising: a light shielding plate that restricts light from the second imaging optical system from being imaged on the first imaging region.

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