JP2006130636A - Wire saw - Google Patents

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JP2006130636A
JP2006130636A JP2004325008A JP2004325008A JP2006130636A JP 2006130636 A JP2006130636 A JP 2006130636A JP 2004325008 A JP2004325008 A JP 2004325008A JP 2004325008 A JP2004325008 A JP 2004325008A JP 2006130636 A JP2006130636 A JP 2006130636A
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abrasive grains
wire saw
wire
abrasive
saw
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JP4471816B2 (en
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Daisuke Ide
大介 井手
Naoki Toge
直樹 峠
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Noritake Co Ltd
Noritake Super Abrasive Co Ltd
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Noritake Co Ltd
Noritake Super Abrasive Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a wire saw, optimizing the number of abrasive grains, the array interval of abrasive grains, and the projecting amount of abrasive grains to improve the cutting performance. <P>SOLUTION: A projected image of the wire saw to which abrasive grains 23 are fixed to the periphery of a core wire 21 by bonding material is photographed, and according to the brightness of the projected image of the photographed wire saw, the contour of the wire saw is detected to detect the number of abrasive grains 23, the interval of the abrasive grains 23 and the projecting amount of abrasive grains 23. The respective values are optimized to manufacture the wire saw. When the wire saw is manufactured by this method, separation of bonding material can be prevented, the abrasive grain holding force is superior, and the cutting performance is improved. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、砥粒数、砥粒の配列間隔、砥粒の突き出し量を適正化して、切断性能を向上させたワイヤソーに関する。   The present invention relates to a wire saw in which cutting performance is improved by optimizing the number of abrasive grains, the arrangement interval of abrasive grains, and the protruding amount of abrasive grains.

シリコン、ガラス、磁性体、水晶、サファイアなどのインゴットスライス加工において、近年固定砥粒ワイヤソーが使用され始めている。
固定砥粒ワイヤソーは高強度な芯線にボンド材にて砥粒を固着した構成のものであり、ボンド材の主な種類としては、感光性樹脂や熱硬化性樹脂等を使用したレジンタイプ、Niなどのメッキを使用した電着タイプ、銀ろう等を使用したろう付けタイプがある。
In recent years, fixed-abrasive wire saws have begun to be used in ingot slicing of silicon, glass, magnetic material, crystal, sapphire and the like.
The fixed abrasive wire saw has a structure in which abrasive grains are fixed to a high-strength core wire with a bond material. The main types of bond materials are resin type using photosensitive resin or thermosetting resin, Ni There are electrodeposition type using plating such as, and brazing type using silver brazing.

固定砥粒ワイヤソー表面においては、一定量の砥粒がほぼ等しい間隔で規則的に付着していることが理想的であるが、製造上の誤差によって砥粒の付着状態が乱れる場合がある。ワイヤソーは高速で製造されるため、製造途中での検査は困難であり、ワイヤソー表面の砥粒付着状態の検査は、製造後に目視か顕微鏡による観察によって行われていた。しかし、この方法では、検査員によって合否判定基準が変わりやすいため、ワイヤソーの品質を一定水準で管理することが難しく、また、検査に長時間を有するため、生産性の点で問題があった。
ワイヤソー表面の砥粒固着状態を良好なものとすることを目的としたワイヤソーの製造方法が、特許文献1に開示されている。
On the surface of the fixed abrasive wire saw, it is ideal that a certain amount of abrasive grains adheres regularly at substantially equal intervals, but the adhesion state of the abrasive grains may be disturbed due to manufacturing errors. Since the wire saw is manufactured at a high speed, it is difficult to inspect during the manufacturing process, and the inspection of the state of adhesion of the abrasive grains on the surface of the wire saw has been performed visually or by observation with a microscope. However, this method has a problem in terms of productivity because it is difficult to manage the quality of the wire saw at a certain level because the inspection criteria are easily changed by the inspector, and the inspection has a long time.
Patent Document 1 discloses a method of manufacturing a wire saw for the purpose of improving the state of fixing the abrasive grains on the surface of the wire saw.

特開2002−36091号公報JP 2002-36091 A

しかし、この製造方法は、ワイヤソー表面において砥粒の占める面積、すなわち砥粒数を限定してワイヤソーの切断性能を管理するものであり、砥粒間隔や砥粒の突き出し量の最適化を行うことができない。このように、砥粒数を管理して製造するだけでは、砥粒の脱落を有効に防止することはできない。   However, this manufacturing method controls the cutting performance of the wire saw by limiting the area occupied by the abrasive grains on the surface of the wire saw, that is, the number of abrasive grains, and optimizes the abrasive grain spacing and the protruding amount of the abrasive grains. I can't. Thus, it is not possible to effectively prevent the abrasive grains from dropping simply by managing the number of abrasive grains.

本発明は、このような事情を考慮してなされたもので、砥粒数、砥粒の配列間隔、砥粒の突き出し量を適正化して、切断性能を向上させたワイヤソーを提供することを目的とする。   The present invention has been made in consideration of such circumstances, and an object thereof is to provide a wire saw with improved cutting performance by optimizing the number of abrasive grains, the spacing between the abrasive grains, and the protruding amount of the abrasive grains. And

以上の課題を解決するために、本発明は、芯線の周囲にボンド材によって砥粒が固着されたワイヤソーの投影画像を撮影し、撮影されたワイヤソーの投影画像の明度に基づいてワイヤソーの輪郭を検知し、砥粒数を制御して製造されるワイヤソーであって、芯線を挟んでワイヤソーの一方の側に位置する砥粒の数と、その反対側に位置する砥粒の数を比較したときに、砥粒が多く存在する側の砥粒数に対する、砥粒が少なく存在する側の砥粒数の比が0.6以上1以下であることを特徴とするワイヤソーである。   In order to solve the above-mentioned problems, the present invention takes a projected image of a wire saw in which abrasive grains are fixed around a core wire by a bond material, and outlines the wire saw based on the brightness of the photographed projected image of the wire saw. A wire saw manufactured by detecting and controlling the number of abrasive grains, when comparing the number of abrasive grains located on one side of the wire saw with the core wire sandwiched between the number of abrasive grains located on the opposite side And a ratio of the number of abrasive grains on the side with few abrasive grains to the number of abrasive grains on the side with many abrasive grains is 0.6 or more and 1 or less.

砥粒が多く存在する側の砥粒数に対する、砥粒が少なく存在する側の砥粒数の比が0.6未満であると、砥粒層の偏芯が大きく、被削材の加工面精度が低下するとともに、偏摩耗が発生する。   If the ratio of the number of abrasive grains on the side with few abrasive grains to the number of abrasive grains on the side with many abrasive grains is less than 0.6, the eccentricity of the abrasive layer is large, and the work surface of the work material As the accuracy decreases, uneven wear occurs.

芯線を挟んでワイヤソーの一方の側に位置する砥粒の数と、その反対側に位置する砥粒の数を比較する際に、以下のように場所や範囲を設定して行う。
測定長さについては、1.0mm以上の測定長さを要する。また、測定間隔は、30m以下であることを要する。この範囲以外であると、測定長さが短すぎ、あるいは測定間隔が長すぎて適正な測定がしにくい。
When comparing the number of abrasive grains located on one side of the wire saw with the core wire interposed therebetween and the number of abrasive grains located on the opposite side, the location and range are set as follows.
About measurement length, the measurement length of 1.0 mm or more is required. The measurement interval needs to be 30 m or less. Outside this range, the measurement length is too short, or the measurement interval is too long, making it difficult to perform appropriate measurement.

螺旋構造である場合のように、粗密制御している場合には、測定長さの制限を設けることによって適正化をすることができないので、この場合には、複数箇所の測定結果の平均値を用いて評価する。   When the density is controlled as in the case of a spiral structure, it cannot be optimized by limiting the measurement length. In this case, the average value of the measurement results at a plurality of locations is used. Use to evaluate.

本発明は、芯線の周囲にボンド材によって砥粒が固着されたワイヤソーの投影画像を撮影し、撮影されたワイヤソーの投影画像の明度に基づいてワイヤソーの輪郭を検知し、砥粒の配列間隔を制御して製造されるワイヤソーであって、砥粒の配列間隔の標準偏差が200μm以下であることを特徴とするワイヤソーである。
砥粒の配列間隔の標準偏差が200μmを超えると、砥粒が密集した領域では被削材の加工面精度が低下し、砥粒間隔が広い領域ではボンド材が被削材と接触してボンド材の剥離が発生しやすい。
The present invention takes a projected image of a wire saw in which abrasive grains are fixed around a core wire by a bond material, detects the outline of the wire saw based on the brightness of the photographed image of the wire saw, and sets the array interval of the abrasive grains. A wire saw manufactured under control, wherein the standard deviation of the arrangement interval of the abrasive grains is 200 μm or less.
When the standard deviation of the array interval of the abrasive grains exceeds 200 μm, the processing surface accuracy of the work material decreases in the area where the abrasive grains are dense, and the bond material comes into contact with the work material in the area where the abrasive grain distance is wide. Peeling of material is likely to occur.

本発明は、芯線の周囲にボンド材によって砥粒が固着されたワイヤソーの投影画像を撮影し、撮影されたワイヤソーの投影画像の明度に基づいてワイヤソーの輪郭を検知し、砥粒の突き出し量を制御して製造されるワイヤソーであって、砥粒の突き出し量が砥粒の平均粒径の20%以上70%以下であるであることを特徴とするワイヤソーである。
砥粒の突き出し量が砥粒の平均粒径の20%未満であると、突き出し量が少ないために加工能率が低下し、ボンド材が被削材と接触してボンド材の剥離が発生しやすい。一方、砥粒の突き出し量が砥粒の平均粒径の70%を超えると、突き出し量が大きすぎて砥粒保持力が低下し、砥粒が脱落しやすく寿命が短くなる。
The present invention takes a projected image of a wire saw in which abrasive grains are fixed around a core wire by a bond material, detects the outline of the wire saw based on the brightness of the photographed image of the wire saw, and determines the protrusion amount of the abrasive grains. A wire saw manufactured under control, wherein the protruding amount of abrasive grains is 20% or more and 70% or less of the average grain diameter of the abrasive grains.
When the protruding amount of the abrasive grains is less than 20% of the average grain size of the abrasive grains, the protruding amount is small, so that the processing efficiency is lowered, and the bond material is likely to come into contact with the work material and the bond material is easily peeled off. . On the other hand, when the protruding amount of the abrasive grains exceeds 70% of the average particle diameter of the abrasive grains, the protruding amount is too large and the abrasive grain holding power is lowered, and the abrasive grains easily fall off and the life is shortened.

本発明においては、前記ボンド材がレジンボンドであることが好ましい。ワイヤソーは多数のプーリーを介してワイヤガイドにセッティングされており、加工中は被削材との接触部に撓みが発生して切断が進行する。従って、ワイヤソーはこの撓みに対して柔軟に変形して負荷を吸収することが必要となり、ワイヤソーがこのような柔軟性を有するためには、ボンド材としてレジンボンドを用いることが適している。
このときのボンド材の弾性率は2000MPa以下であるのが良い。弾性率が2000MPaを超えると、ワイヤソーの柔軟性が乏しくなり、プーリーとの接触位置や、被削材との接触部において樹脂の剥離が生じ、砥粒数の比や砥粒間隔、あるいは砥粒突き出し量を制御しても、砥粒が脱落する原因となり、加工能率と加工精度が低下する。
In the present invention, the bond material is preferably a resin bond. The wire saw is set on the wire guide via a large number of pulleys, and during processing, the contact with the work material is bent and the cutting proceeds. Therefore, the wire saw needs to be deformed flexibly with respect to this bending to absorb the load, and in order for the wire saw to have such flexibility, it is suitable to use a resin bond as a bonding material.
The elastic modulus of the bond material at this time is preferably 2000 MPa or less. When the elastic modulus exceeds 2000 MPa, the flexibility of the wire saw becomes poor, and the resin is peeled off at the contact position with the pulley and the contact portion with the work material, and the ratio of the number of abrasive grains, the abrasive grain spacing, or the abrasive grains Even if the protrusion amount is controlled, the abrasive grains fall off, and the processing efficiency and processing accuracy are lowered.

本発明によると、砥粒数、砥粒の配列間隔、砥粒の突き出し量を適正化することにより、被削材の加工面精度を良好とし、ボンド材の剥離を防止し、砥粒保持力を維持して、切断性能を向上させたワイヤソーを実現することができる。   According to the present invention, by optimizing the number of abrasive grains, the arrangement interval of abrasive grains, and the protruding amount of abrasive grains, the processing surface accuracy of the work material is improved, the peeling of the bond material is prevented, and the abrasive retention force Thus, it is possible to realize a wire saw with improved cutting performance.

以下、本発明をその実施の形態に基づいて説明する。
本発明の実施形態に係るワイヤソーは、固着される砥粒について、砥粒数、砥粒の配列間隔、砥粒の突き出し量を適正化したものであるが、これらの適正化を実現するために、以下に説明する検査装置を用いている。この検査装置について図1を用いて説明する。
Hereinafter, the present invention will be described based on the embodiments.
In the wire saw according to the embodiment of the present invention, the number of abrasive grains, the arrangement interval of the abrasive grains, and the protruding amount of the abrasive grains are optimized for the abrasive grains to be fixed. The inspection apparatus described below is used. This inspection apparatus will be described with reference to FIG.

図1において、ワイヤソー1の長手方向に対して垂直な2軸方向に、CCDカメラ2が配置され、このCCDカメラ2に対向してワイヤソー1を挟んでLED光源3が配置されている。CCDカメラ2にはカメラ用電源4が接続され、LED光源3にはLED光源用電源5が接続されている。2つのカメラ用電源4にはカメラ切替器6が接続され、カメラ切替器6と2つのLED光源3は制御装置7に接続され、制御装置7は演算装置8に接続されている。演算装置8には、その周辺機器としてのディスプレイ9、キーボード10,およびマウス11が接続されている。   In FIG. 1, a CCD camera 2 is disposed in two axial directions perpendicular to the longitudinal direction of the wire saw 1, and an LED light source 3 is disposed so as to face the CCD camera 2 and sandwich the wire saw 1. A camera power supply 4 is connected to the CCD camera 2, and an LED light source 5 is connected to the LED light source 3. A camera switch 6 is connected to the two camera power sources 4, the camera switch 6 and the two LED light sources 3 are connected to the control device 7, and the control device 7 is connected to the arithmetic device 8. The arithmetic device 8 is connected to a display 9, a keyboard 10, and a mouse 11 as peripheral devices.

この検査装置においては、CCDカメラ2によってワイヤソー1の静止画像が撮影されるが、この際にLED光源3によってワイヤソー1に対して光が照射される。従って、CCDカメラ2はワイヤソー1に照射された光を用いてワイヤソー1の投影画像を撮影する。カメラ切替器6によって、2つのCCDカメラ2のうちいずれを選択するかが切り替えられ、制御装置7によってカメラ用電源4、LED光源用電源5のオン/オフと、カメラ切替器6の切替が制御される。ワイヤソー1の投影画像は演算装置8に取り込まれ、そのデータが処理されてワイヤソーの良否が判定される。   In this inspection apparatus, a still image of the wire saw 1 is taken by the CCD camera 2. At this time, the LED light source 3 irradiates the wire saw 1 with light. Therefore, the CCD camera 2 takes a projected image of the wire saw 1 using the light irradiated on the wire saw 1. The camera switcher 6 switches which of the two CCD cameras 2 is selected, and the controller 7 controls on / off of the camera power supply 4 and LED light source power supply 5 and switching of the camera switcher 6. Is done. The projection image of the wire saw 1 is taken into the arithmetic unit 8, and the data is processed to determine the quality of the wire saw.

上記の検査装置を用いたワイヤソーの検査方法について以下に説明する。
図2(a)に、CCDカメラ2によって撮影されたワイヤソー1の投影画像の一例を示す。ワイヤソー1は、芯線21の周囲にボンド材を用いて砥粒23を固着してなるものであるが、この検査方法においてはまず、画像の明度を読み取って、画像の明るさを表す曲線Iを引く。この曲線Iの立ち上がり部をワイヤソー1の両端と定義し、この両端から等距離の点を通ってワイヤソー1の長手方向に直線Iを引き、この直線Iをワイヤソー1の中心線とする。
A wire saw inspection method using the above inspection apparatus will be described below.
FIG. 2A shows an example of a projected image of the wire saw 1 taken by the CCD camera 2. The wire saw 1 is formed by adhering abrasive grains 23 around a core wire 21 using a bond material. In this inspection method, first, the brightness of an image is obtained by reading the brightness of the image. Pull. The rising part of the curve I is defined as both ends of the wire saw 1, a straight line I is drawn in the longitudinal direction of the wire saw 1 through a point equidistant from the both ends, and the straight line I is set as the center line of the wire saw 1.

次に、ワイヤソー1の輪郭部の明るさに設定して、この明るさの点を繋いでワイヤソー1の輪郭線である曲線IIを引く。
砥粒の突き出し量を正確に検出するためには、ワイヤソー表面の細かい凹凸やフィラーなどによる凹凸による影響を取り除く必要がある。そのため、曲線IIをフィルタによる移動平均処理によって滑らかにする処理を施す。図4に、移動平均処理の手順を示す。(a)は平均処理前のワイヤソーの輪郭線である曲線IIであり、(b)は平均処理後の曲線IIである。(a)においては、測定点X1、X2、X3、X4、X5、X6等における明度の測定値である、F(X1)、F(X2)、F(X3)、F(X4)、F(X5)、F(X6)等を繋いで、関数F(X)によって曲線IIが表わされる。
Next, the brightness of the outline portion of the wire saw 1 is set, and the curve II which is the outline of the wire saw 1 is drawn by connecting the points of the brightness.
In order to accurately detect the protruding amount of the abrasive grains, it is necessary to remove the influence of fine irregularities on the surface of the wire saw or irregularities due to fillers. Therefore, the process which smoothes the curve II by the moving average process by a filter is given. FIG. 4 shows the procedure of the moving average process. (A) is the curve II which is the outline of the wire saw before an average process, (b) is the curve II after an average process. In (a), F (X1), F (X2), F (X3), F (X4), F (, which are measured values of brightness at measurement points X1, X2, X3, X4, X5, X6, etc. The curve II is represented by the function F (X) by connecting X5), F (X6) and the like.

これらの測定値に基づいて、
G(X3)=(F(X1)+F(X2)+F(X3)+F(X4)+F(X5))/5
G(X4)=(F(X2)+F(X3)+F(X4)+F(X5)+F(X6))/5
G(XN)=(F(XN−2)+F(XN−1)+F(XN)+F(XN+1)+F(XN+2))/5
として移動平均値を求め、この移動平均値による関数をG(X)として、平均化された輪郭線とする。
Based on these measurements,
G (X3) = (F (X1) + F (X2) + F (X3) + F (X4) + F (X5)) / 5
G (X4) = (F (X2) + F (X3) + F (X4) + F (X5) + F (X6)) / 5
G (XN) = (F (XN-2) + F (XN-1) + F (XN) + F (XN + 1) + F (XN + 2)) / 5
A moving average value is obtained, and a function based on this moving average value is defined as G (X) to obtain an averaged contour line.

次に、砥粒の突き出し量を検出するために、砥粒のピークとボトムを検出する。
図5に、平均化された輪郭線の一例を示す。平均化された輪郭線であるG(X)の微分値(G(X+1)−G(X))が最後に正になった位置(X3)をピークスタートとし、最初に微分値(G(X+1)−G(X))が負になった位置(X5)をピークエンドとする。このピークスタートとピークエンドの中点をもってピーク(X4)とする。
このピークの数によって砥粒数を検出することができ、また隣り合うピークの間隔によって砥粒間隔を検出することができる。
Next, in order to detect the protrusion amount of the abrasive grains, the peak and bottom of the abrasive grains are detected.
FIG. 5 shows an example of the averaged contour line. The position (X3) at which the differential value (G (X + 1) −G (X)) of the averaged contour line G (X) finally becomes positive is set as the peak start, and the differential value (G (X + 1) is first set. ) -G (X)) is negative (X5) is the peak end. The midpoint between this peak start and peak end is the peak (X4).
The number of abrasive grains can be detected from the number of peaks, and the abrasive grain interval can be detected from the interval between adjacent peaks.

次に、平均化された輪郭線であるG(X)の微分値(G(X+1)−G(X))が最後に負になった位置(X7)をボトムスタートとし、最初に微分値(G(X+1)−G(X))が正になった位置(X9)をボトムエンドとする。このボトムスタートとボトムエンドの中点をもってボトム(X8)とする。
図2(b)に、砥粒のピーク位置を直線IIで表し、砥粒のボトム位置を直線IIIで表す。
以上の方法で検出されたピーク(X4)におけるピーク値G(X4)と、ボトム(X8)におけるボトム値G(X8)に基づいて、ピーク値とボトム値との差を求めることによって、砥粒の突き出し量を求めることができる。
以下に、検査内容をステップを追って説明する。
Next, the position (X7) where the differential value (G (X + 1) −G (X)) of G (X), which is the averaged contour line, has finally become negative is set as the bottom start, and the differential value ( The position (X9) where G (X + 1) -G (X)) becomes positive is taken as the bottom end. The midpoint of this bottom start and bottom end is the bottom (X8).
In FIG. 2B, the peak position of the abrasive grains is represented by a straight line II, and the bottom position of the abrasive grains is represented by a straight line III.
By obtaining the difference between the peak value and the bottom value based on the peak value G (X4) at the peak (X4) detected by the above method and the bottom value G (X8) at the bottom (X8), abrasive grains Can be obtained.
The inspection contents will be described below step by step.

ステップ1
まず、砥粒数が閾値以上であるかについて判定する。図3に、砥粒23の固着状況の一例として、ワイヤソー1の長手方向について長さLの部分に、左右それぞれに砥粒23が5個ずつ固着されているものを示しており、たとえば、長さLの部分に固着されている砥粒数が5個以上であるものを良品と判定する。この判定は、ワイヤソーの左側、右側のいずれについても行い、
左側の砥粒数≧5
右側の砥粒数≧5
のとき良と判定してステップ2に進み、それ以外のときは不可と判定して砥粒数を赤で表示して検査を終了する。
Step 1
First, it is determined whether the number of abrasive grains is equal to or greater than a threshold value. FIG. 3 shows an example in which the abrasive grains 23 are fixed, in which five abrasive grains 23 are fixed to the left and right portions in the portion of the length L in the longitudinal direction of the wire saw 1. Those having 5 or more abrasive grains fixed to the portion L are determined as non-defective products. This determination is made for both the left and right sides of the wire saw,
Number of abrasive grains on the left side ≧ 5
Number of abrasive grains on the right side ≧ 5
At this time, it is judged as good and the process proceeds to step 2, and otherwise it is judged as impossible and the number of abrasive grains is displayed in red and the inspection is finished.

ステップ2
右側と左側での砥粒23の砥粒数の偏りについて判定する。左側の砥粒数と右側の砥粒数との比が0.9以上であれば良と判定し、0.6以上0.9未満であれば可と判定してステップ3に進む。すなわち、
左側の砥粒数≧右側の砥粒数のとき、
右側の砥粒数/左側の砥粒数≧0.9:良の判定
0.6≦右側の砥粒数/左側の砥粒数<0.9:可の判定
左側の砥粒数≦右側の砥粒数のとき、
左側の砥粒数/右側の砥粒数≧0.9:良の判定
0.6≦左側の砥粒数/右側の砥粒数<0.9:可の判定
とし、それ以外のときは不可と判定してその数値を赤で表示して検査を終了する。
Step 2
The deviation of the number of abrasive grains 23 on the right side and the left side is determined. If the ratio between the number of abrasive grains on the left side and the number of abrasive grains on the right side is 0.9 or more, it is judged as good, and if it is 0.6 or more and less than 0.9, it is judged as acceptable, and the process proceeds to Step 3. That is,
When the number of abrasive grains on the left side ≥ the number of abrasive grains on the right side,
Number of abrasive grains on the right side / number of abrasive grains on the left side ≧ 0.9: good judgment 0.6 ≦ number of abrasive grains on the right side / number of abrasive grains on the left side <0.9: number of abrasive grains on the left side ≦ possible judgment When the number of abrasive grains
Number of abrasive grains on the left side / number of abrasive grains on the right side ≧ 0.9: good judgment 0.6 ≦ number of abrasive grains on the left side / number of abrasive grains on the right side <0.9: acceptable judgment, otherwise it is impossible And the numerical value is displayed in red, and the inspection is terminated.

ステップ3
図2における直線IIの間隔を検出することによって得られる砥粒間隔の標準偏差について判定を行い、砥粒の分散状態についての良否を判定する。
砥粒間隔の標準偏差は、芯線を挟んで右側の砥粒と左側の砥粒のいずれもが良と判定される条件を満たしているときに良と判定される。すなわち、図3において、左側の砥粒間隔を総称してLLとし、右側の砥粒間隔を総称してLRとしたときに、
Lの標準偏差≦120μm、かつLRの標準偏差≦120μm
のときに良と判定し、この範囲を除いて
Lの標準偏差≦200μm、かつLRの標準偏差≦200μm
のときに可と判定し、ステップ4に進む。それ以外のときは不可と判定してその数値を赤で表示して検査を終了する。
なお、以上の標準偏差における数値は、投影画像における画素数から算出することができる。
Step 3
The standard deviation of the abrasive grain interval obtained by detecting the interval of the straight line II in FIG. 2 is determined, and the quality of the dispersed state of the abrasive grains is determined.
The standard deviation of the abrasive grain interval is determined to be good when both the right abrasive grain and the left abrasive grain satisfy the condition for determining good. That is, in FIG. 3, and L L are collectively abrasive intervals left, when the L R are collectively abrasive spacing right,
Standard deviation of L L ≦ 120 μm and standard deviation of L R ≦ 120 μm
Good and determined, the standard deviation ≦ 200 [mu] m for L L except the range and standard deviation ≦ 200 [mu] m of L R, when
At this time, it is determined to be acceptable, and the process proceeds to Step 4. Otherwise, it is determined to be impossible and the numerical value is displayed in red, and the inspection is terminated.
In addition, the numerical value in the above standard deviation can be calculated from the number of pixels in the projection image.

ステップ4
図2におけるピーク値とボトム値との差を検出することによって得られる砥粒突出し量について良否判定を行う。1個の砥粒について、そのピーク値から、その砥粒の両端のボトム値を引くことによって、2つの砥粒突出し量が算出される。このようにして算出される砥粒突出し量について、画像上の全砥粒についての平均砥粒突出し量を求め、この平均砥粒突出し量が平均砥粒粒径の25%以上40%以下であれば、良と判定する。また、20%以上25%未満、あるいは40%を超え70%以下であれば可と判定する。すなわち、
0.25≦平均砥粒突出し量/平均砥粒粒径≦0.40:良の判定
0.20≦平均砥粒突出し量/平均砥粒粒径<0.25:可の判定
0.40<平均砥粒突出し量/平均砥粒粒径≦0.70:可の判定
とし、それ以外のときは不可と判定してその数値を赤で表示して検査を終了する。
Step 4
The quality determination is performed on the amount of abrasive grain protrusion obtained by detecting the difference between the peak value and the bottom value in FIG. For one abrasive grain, two abrasive grain protrusion amounts are calculated by subtracting the bottom value at both ends of the abrasive grain from the peak value. With respect to the abrasive protrusion amount thus calculated, an average abrasive protrusion amount for all the abrasive grains on the image is obtained, and this average abrasive protrusion amount is 25% or more and 40% or less of the average abrasive grain size. If it is, it will be judged as good. Further, it is determined that it is acceptable if it is 20% or more and less than 25%, or more than 40% and 70% or less. That is,
0.25 ≦ average abrasive grain protrusion amount / average abrasive grain diameter ≦ 0.40: good judgment 0.20 ≦ average abrasive grain protrusion quantity / average abrasive grain diameter <0.25: acceptable judgment 0.40 < Average abrasive grain protrusion amount / average abrasive grain size ≦ 0.70: Acceptable, otherwise judged as impossible, displaying the value in red and terminating the inspection.

以上のステップによって良と判定された場合には、そのままワイヤソーの製造が続けられる。可と判定された場合には、あらかじめ設定された回数だけ「可」の判定が連続した場合は、警報を鳴らし、装置停止等の処置がなされる。また、不可と判定されたときには、検査終了後に、警報を鳴らし、装置停止の処置がなされる。   If it is determined to be good by the above steps, the production of the wire saw is continued as it is. When it is determined to be possible, if the determination of “possible” continues for a preset number of times, an alarm is sounded and measures such as stopping the apparatus are taken. If it is determined that the test is impossible, an alarm is sounded after the inspection is completed, and the apparatus is stopped.

上記の測定に使用される光として、例えば可視光の波長領域(波長400nm〜700nm)の光を用いることができる。また、測定に使用できる光源としては、蛍光灯、ハロゲンランプ、LED等を用いることができる。   As the light used for the above measurement, for example, light in the wavelength region of visible light (wavelength 400 nm to 700 nm) can be used. As a light source that can be used for measurement, a fluorescent lamp, a halogen lamp, an LED, or the like can be used.

以下に、砥粒数、砥粒の配列間隔、砥粒の突き出し量を適正化したワイヤソーの製造方法を示す。
図6に、ワイヤソーの砥粒の分布状態を制御しつつワイヤソーを製造する工程を図示する。
砥粒が混入された樹脂を貯留するボンド槽31内に芯線32を通過させ、ボンド槽31を通過した被覆ワイヤ33の被覆厚みをダイス34により均一化する。
ダイス34の周囲には、図6(b)に示すように、被覆ワイヤ33が通過する方向に対して垂直な平面内で直交する2軸(X軸、Y軸)方向に、ダイス位置制御部35が設けられている。
ダイス34を通過した被覆ワイヤ33は、紫外線照射装置等からなる樹脂硬化部36により被覆層の液状樹脂が硬化される。
Below, the manufacturing method of the wire saw which optimized the number of abrasive grains, the arrangement space | interval of an abrasive grain, and the protrusion amount of an abrasive grain is shown.
FIG. 6 illustrates a process of manufacturing a wire saw while controlling the distribution state of the abrasive grains of the wire saw.
The core wire 32 is passed through the bond tank 31 storing the resin mixed with abrasive grains, and the coating thickness of the covered wire 33 that has passed through the bond tank 31 is made uniform by the die 34.
Around the dice 34, as shown in FIG. 6 (b), the dice position control unit is arranged in two axis (X axis, Y axis) directions orthogonal to each other in a plane perpendicular to the direction in which the covered wire 33 passes. 35 is provided.
The covered wire 33 that has passed through the die 34 is cured with a liquid resin in the coating layer by a resin curing portion 36 formed of an ultraviolet irradiation device or the like.

その後、被覆ワイヤ33は、挟み込みローラ37を通過することによって進行方向が変えられ、又、両端を挟み込み保持されることにより被覆ワイヤ33の軸方向の回転を抑制し、X、Y軸の変動が防止される。続いて、振れ防止用の第1のV溝プーリー38を通過する。この第1のV溝プーリー38を通過する際に、Y軸方向観察用カメラ39によって、ワイヤソーの投影画像が撮影される。図6(c)に、被覆ワイヤ2の進行方向に対して垂直なY軸方向、X軸方向を示す。
その後、被覆ワイヤ33は振れ防止用の第2のV溝プーリー40を通過する。この第2のV溝プーリー40を通過する際に、X軸方向観察用カメラ41によって、ワイヤソーの投影画像が撮影される。
その後、被覆ワイヤ33は挟み込みローラ37を通過した後、巻き取られる。
Thereafter, the traveling direction of the coated wire 33 is changed by passing through the sandwiching roller 37, and the both ends of the coated wire 33 are sandwiched and held to suppress the rotation of the coated wire 33 in the axial direction. Is prevented. Subsequently, it passes through the first V-groove pulley 38 for preventing vibration. When passing through the first V-groove pulley 38, the Y-axis direction observation camera 39 takes a projected image of the wire saw. FIG. 6C shows the Y-axis direction and the X-axis direction perpendicular to the traveling direction of the covered wire 2.
Thereafter, the covered wire 33 passes through the second V-groove pulley 40 for preventing vibration. When passing through the second V-groove pulley 40, the X-axis direction observation camera 41 takes a projected image of the wire saw.
Thereafter, the covered wire 33 is wound after passing through the sandwiching roller 37.

砥粒が多く存在する側の砥粒数に対する、砥粒が少なく存在する側の砥粒数の比が0.6以上1以下となるようにワイヤソーを形成することは、以下の方法で実現することが可能である。すなわち、砥粒数の比が0.6近くまで低下したときには、ダイス34の位置を調整して、ダイス34の砥粒比が少ない方側の間隙を拡大する。
また、砥粒の間隔の標準偏差が200μm以下であるワイヤソーを形成することは、砥粒の間隔の標準偏差が200μm近くまで増加したときに、ボンド槽31内を攪拌して砥粒と樹脂との分散性を高めることによって可能である。
Forming the wire saw so that the ratio of the number of abrasive grains on the side with few abrasive grains to the number of abrasive grains on the side with many abrasive grains is 0.6 or more and 1 or less is realized by the following method. It is possible. That is, when the ratio of the number of abrasive grains decreases to near 0.6, the position of the die 34 is adjusted, and the gap on the side where the abrasive grain ratio of the die 34 is small is expanded.
In addition, forming a wire saw having a standard deviation of the abrasive grain spacing of 200 μm or less means that when the standard deviation of the abrasive grain spacing increases to nearly 200 μm, the inside of the bond tank 31 is stirred to mix the abrasive grains and the resin. This is possible by increasing the dispersibility of.

さらに、砥粒の突き出し量が砥粒の平均粒径の20%以上70%以下であるようにワイヤソーを形成することは、以下の2つの方法によって可能である。第1の方法は、砥粒の突き出し量がこの範囲外近くになったとき、ボンド槽31の温度を調整して、樹脂の粘度を調整することである。すなわち、砥粒の突き出し量が砥粒の平均粒径の20%に近づいたときは樹脂の粘度を低くし、70%に近づいたときは樹脂の粘度を高くする。第2の方法は、砥粒の突き出し量がこの範囲外近くになったとき、樹脂内の揮発成分を調整することである。すなわち、砥粒の突き出し量が砥粒の平均粒径の20%に近づいたときは樹脂内の揮発成分を増やし、70%に近づいたときは樹脂内の揮発成分を減らす。   Further, the wire saw can be formed by the following two methods so that the protruding amount of the abrasive grains is 20% or more and 70% or less of the average grain diameter of the abrasive grains. The first method is to adjust the viscosity of the resin by adjusting the temperature of the bond tank 31 when the protruding amount of the abrasive grains is close to outside this range. That is, when the protruding amount of abrasive grains approaches 20% of the average grain diameter of the abrasive grains, the viscosity of the resin is lowered, and when it approaches 70%, the viscosity of the resin is increased. The second method is to adjust the volatile component in the resin when the protruding amount of the abrasive grains is close to outside this range. That is, when the protruding amount of the abrasive grains approaches 20% of the average grain diameter of the abrasive grains, the volatile component in the resin is increased, and when it approaches 70%, the volatile component in the resin is decreased.

次に、試験結果を示す。
以上の方法で製造されたワイヤソーについて切断試験を行った。
ワイヤソーを形成する芯線及び砥粒は以下の通りである。
芯線:φ0.18mm
砥粒:Niコート砥粒 40/60μm
試験条件は以下の通りである。
切断装置:単線切断装置
ワイヤ速度:平均400m/min
ワイヤテンション:25N
被切断材:単結晶シリコン 40mm幅
表1に砥粒数の比を変えて製造されたワイヤソーに対する試験結果を示す。
Next, test results are shown.
The wire saw manufactured by the above method was subjected to a cutting test.
The core wires and abrasive grains forming the wire saw are as follows.
Core wire: φ0.18mm
Abrasive: Ni coated abrasive 40 / 60μm
The test conditions are as follows.
Cutting device: Single wire cutting device Wire speed: Average 400m / min
Wire tension: 25N
Material to be cut: single crystal silicon 40 mm width Table 1 shows test results for wire saws manufactured by changing the ratio of the number of abrasive grains.

Figure 2006130636
Figure 2006130636

表1において、切れ味は、砥粒数の比が0.95のときの、加工開始後5分間の切り溝長さを100としたときの指標で表している。切れ味低下率は、加工開始から5分間における切れ味に対する、加工開始40分経過後から5分間の切れ味の比率を指標として表している。また、ワイヤ摩耗率は、加工開始40分経過後10個所で測定したワイヤソーの径を平均化し、加工開始前のワイヤソーの径との差をワイヤソー径変化量として求め、
(ワイヤソー径変化量)/(砥粒層厚み×2)×100
の計算式にてワイヤ摩耗率としている。面粗さは、砥粒数の比が0.95のときの、加工後の被切断材の面粗さを100としたときの指標で表している。
In Table 1, the sharpness is expressed as an index when the grooving length for 5 minutes after the start of machining is 100 when the ratio of the number of abrasive grains is 0.95. The sharpness reduction rate represents the ratio of the sharpness for 5 minutes after 40 minutes from the start of processing to the sharpness in 5 minutes from the start of processing as an index. The wire wear rate is obtained by averaging the diameters of the wire saws measured at 10 locations after 40 minutes from the start of processing, and obtaining the difference from the diameter of the wire saw before starting processing as the amount of change in wire saw diameter.
(Wire saw diameter variation) / (Abrasive layer thickness × 2) × 100
The wire wear rate is calculated by the following formula. The surface roughness is expressed as an index when the surface roughness of the workpiece after processing is 100 when the ratio of the number of abrasive grains is 0.95.

表1からわかるように、砥粒が多く存在する側の砥粒数に対する、砥粒が少なく存在する側の砥粒数の比が0.6以上1以下であるときに、切れ味、切れ味低下率、ワイヤ摩耗率、面粗さのいずれも良好な値を示している。特に、0.8以上1以下のときに、さらに好ましい値を示している。これに対し、0.6未満であると、切れ味、切れ味低下率、ワイヤ摩耗率、面粗さのいずれについても劣っている。
表2に砥粒間隔の標準偏差を変えて製造されたワイヤソーに対する試験結果を示す。
As can be seen from Table 1, when the ratio of the number of abrasive grains on the side with few abrasive grains to the number of abrasive grains on the side with many abrasive grains is 0.6 or more and 1 or less, the sharpness and sharpness reduction rate Both the wire wear rate and the surface roughness are good values. In particular, a more preferable value is shown when the ratio is 0.8 or more and 1 or less. On the other hand, if it is less than 0.6, the sharpness, sharpness reduction rate, wire wear rate, and surface roughness are all poor.
Table 2 shows the test results for wire saws manufactured by changing the standard deviation of the abrasive grain spacing.

Figure 2006130636
Figure 2006130636

表2において、切れ味は、砥粒間隔の標準偏差が105μmのときの、加工開始後5分間の切り溝長さを100としたときの指標で表している。また、面粗さは、砥粒間隔の標準偏差が105μmのときの、加工後の被切断材の面粗さを100としたときの指標で表している。切れ味低下率とワイヤ摩耗率については、表1の場合と同様である。
表2からわかるように、砥粒間隔の標準偏差が200μmを超えると、面粗さが劣化している。これは、砥粒間隔の標準偏差が200μmを超えると、砥粒配列の分散性が悪いために、砥粒が凝集した部分では被削材の加工面精度が低下し、砥粒間隔が広い部分ではボンド材の剥離が生じやすいという事態を生じて、面粗さを良好な状態に保てなくなるからである。砥粒間隔の標準偏差が150μm以下のときに、さらに好ましい値を示している。
表3に、砥粒突き出し量を変えて製造されたワイヤソーに対する試験結果を示す。
In Table 2, the sharpness is expressed as an index when the groove length for 5 minutes after the start of machining is 100 when the standard deviation of the abrasive grain interval is 105 μm. The surface roughness is represented by an index when the surface roughness of the workpiece after processing is 100 when the standard deviation of the abrasive grain interval is 105 μm. The sharpness reduction rate and the wire wear rate are the same as in Table 1.
As can be seen from Table 2, when the standard deviation of the abrasive grain spacing exceeds 200 μm, the surface roughness is deteriorated. This is because, when the standard deviation of the abrasive grain spacing exceeds 200 μm, the dispersibility of the abrasive grain arrangement is poor, so that the processing surface accuracy of the work material is lowered at the part where the abrasive grains are aggregated, and the part where the abrasive grain spacing is wide. This is because the bond material is easily peeled off, and the surface roughness cannot be maintained in a good state. A more preferable value is shown when the standard deviation of the abrasive grain spacing is 150 μm or less.
Table 3 shows test results for wire saws manufactured with different abrasive grain protrusions.

Figure 2006130636
Figure 2006130636

表3において、切れ味は、砥粒突き出し量が砥粒の平均粒径の38%のときの、加工開始後5分間の切り溝長さを100としたときの指標で表している。また、面粗さは、砥粒突き出し量が砥粒の平均粒径の38%のときの、加工後の被切断材の面粗さを100としたときの指標で表している。切れ味低下率とワイヤ摩耗率については、表1の場合と同様である。   In Table 3, the sharpness is expressed as an index when the grooving length for 5 minutes after the start of processing is 100 when the abrasive protrusion amount is 38% of the average particle diameter of the abrasive grains. Further, the surface roughness is represented by an index when the surface roughness of the workpiece after processing is 100 when the abrasive grain protrusion amount is 38% of the average grain size of the abrasive grains. The sharpness reduction rate and the wire wear rate are the same as in Table 1.

砥粒の突き出し量が砥粒の平均粒径の20%以上70%以下のときは、切れ味、切れ味低下率、ワイヤ摩耗率、面粗さのいずれも良好な値を示している。特に、25%以上40%以下のときに、さらに好ましい値を示している。これに対し、砥粒の突き出し量が砥粒の平均粒径の20%未満であると、切れ味が低下している。これは、突き出し量が少ないために、ボンド材が被削材と接触しやすいからである。一方、砥粒の突き出し量が砥粒の平均粒径の70%を超えると、ワイヤ摩耗率が大きくなる。これは、突き出し量が大きすぎて砥粒保持力が低下し、砥粒が脱落しやすくなるからである。   When the protruding amount of the abrasive grains is 20% or more and 70% or less of the average grain diameter of the abrasive grains, the sharpness, sharpness reduction rate, wire wear rate, and surface roughness all show good values. In particular, a more preferable value is shown when it is 25% or more and 40% or less. On the other hand, when the protruding amount of the abrasive grains is less than 20% of the average grain size of the abrasive grains, the sharpness is lowered. This is because the bond material is easy to come into contact with the work material because the protrusion amount is small. On the other hand, when the protruding amount of the abrasive grains exceeds 70% of the average grain diameter of the abrasive grains, the wire wear rate increases. This is because the protruding amount is too large, and the abrasive grain holding force is reduced, and the abrasive grains easily fall off.

本発明は、砥粒数、砥粒の配列間隔、砥粒の突き出し量を適正化して、切断性能を向上させたワイヤソーとして利用することができる。   INDUSTRIAL APPLICABILITY The present invention can be used as a wire saw that has improved cutting performance by optimizing the number of abrasive grains, the arrangement interval of abrasive grains, and the protruding amount of abrasive grains.

本発明のワイヤソーの検査装置の一例を示す図である。It is a figure which shows an example of the inspection apparatus of the wire saw of this invention. CCDカメラによって撮影されたワイヤソーの投影画像の一例を示す図である。It is a figure which shows an example of the projection image of the wire saw image | photographed with the CCD camera. 芯線の周囲に複数の砥粒が固着されてワイヤソーが形成されている様子を模式的に示す図である。It is a figure which shows typically a mode that a several wire is fixed to the circumference | surroundings of a core wire, and the wire saw is formed. ワイヤソーの輪郭線の移動平均処理を示す図である。It is a figure which shows the moving average process of the outline of a wire saw. 砥粒のピークとボトムを検出する方法を示す図である。It is a figure which shows the method of detecting the peak and bottom of an abrasive grain. 本発明のワイヤソーの製造工程を示す図である。It is a figure which shows the manufacturing process of the wire saw of this invention.

符号の説明Explanation of symbols

1 ワイヤソー
2 CCDカメラ
3 LED光源
4 カメラ用電源
5 LED光源用電源
6 カメラ切替器
7 制御装置
8 演算装置
9 ディスプレイ
10 キーボード
11 マウス
21 芯線
23 砥粒
31 ボンド槽
32 芯線
33 被覆ワイヤ
34 ダイス
35 ダイス位置制御部
36 樹脂硬化部
37 挟み込みローラ
38 第1のV溝プーリー
39 Y軸方向観察用カメラ
40 第2のV溝プーリー
41 X軸方向観察用カメラ
DESCRIPTION OF SYMBOLS 1 Wire saw 2 CCD camera 3 LED light source 4 Camera power supply 5 LED light source 6 Camera switcher 7 Control apparatus 8 Arithmetic apparatus 9 Display 10 Keyboard 11 Mouse 21 Core wire 23 Abrasive grain 31 Bond tank 32 Core wire 33 Coated wire 34 Die 35 Dice Position control unit 36 Resin curing unit 37 Pinch roller 38 First V-groove pulley 39 Y-axis direction observation camera 40 Second V-groove pulley 41 X-axis direction observation camera

Claims (4)

芯線の周囲にボンド材によって砥粒が固着されたワイヤソーの投影画像を撮影し、撮影されたワイヤソーの投影画像の明度に基づいてワイヤソーの輪郭を検知し、砥粒数を制御して製造されるワイヤソーであって、芯線を挟んでワイヤソーの一方の側に位置する砥粒の数と、その反対側に位置する砥粒の数を比較したときに、砥粒が多く存在する側の砥粒数に対する、砥粒が少なく存在する側の砥粒数の比が0.6以上1以下であることを特徴とするワイヤソー。   Manufactured by taking a projected image of a wire saw in which abrasive grains are fixed around the core wire by a bond material, detecting the outline of the wire saw based on the brightness of the photographed image of the wire saw, and controlling the number of abrasive grains The number of abrasive grains on the side where there are many abrasive grains when comparing the number of abrasive grains located on one side of the wire saw with the core wire sandwiched between the number of abrasive grains located on the opposite side A wire saw characterized in that the ratio of the number of abrasive grains on the side where few abrasive grains exist is 0.6 or more and 1 or less. 芯線の周囲にボンド材によって砥粒が固着されたワイヤソーの投影画像を撮影し、撮影されたワイヤソーの投影画像の明度に基づいてワイヤソーの輪郭を検知し、砥粒の配列間隔を制御して製造されるワイヤソーであって、砥粒の配列間隔の標準偏差が200μm以下であることを特徴とするワイヤソー。   A projected image of a wire saw in which abrasive grains are fixed to the periphery of the core wire by a bond material is detected, the outline of the wire saw is detected based on the brightness of the photographed image of the wire saw, and the arrangement interval of the abrasive grains is controlled. A wire saw, characterized in that a standard deviation of an array interval of abrasive grains is 200 μm or less. 芯線の周囲にボンド材によって砥粒が固着されたワイヤソーの投影画像を撮影し、撮影されたワイヤソーの投影画像の明度に基づいてワイヤソーの輪郭を検知し、砥粒の突き出し量を制御して製造されるワイヤソーであって、砥粒の突き出し量が砥粒の平均粒径の20%以上70%以下であるであることを特徴とするワイヤソー。   Takes a projected image of a wire saw in which abrasive grains are fixed around the core wire by a bond material, detects the outline of the wire saw based on the brightness of the photographed image of the wire saw, and manufactures by controlling the protruding amount of the abrasive grain A wire saw, characterized in that the protruding amount of abrasive grains is 20% or more and 70% or less of the average grain size of the abrasive grains. 前記ボンド材がレジンボンドであることを特徴とする請求項1から3のいずれかに記載のワイヤソー。
The wire saw according to any one of claims 1 to 3, wherein the bond material is a resin bond.
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