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- research-articleNovember 2009
An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects
ICCAD '09: Proceedings of the 2009 International Conference on Computer-Aided DesignPages 497–504https://doi.org/10.1145/1687399.1687494We propose a new and efficient statistical-simulation-based test methodology for optimally selecting repair elements at beginning-of-life (BOL) to improve the end-of-life (EOL) functionality of memory designs. This is achieved by identifying the best ...
