Article

Automatic generation of test sets for SBST of microprocessor IP cores

Authors:

M. Reorda Reorda,

M. ViolanteAuthors Info & Claims

SBCCI '05: Proceedings of the 18th annual symposium on Integrated circuits and system design

Pages 74 - 79

https://doi.org/10.1145/1081081.1081105

Published: 04 September 2005 Publication History

Abstract

Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Currently, Software-Based Self-Test (SBST) is becoming an attractive test solution since it guarantees high fault coverage figures, runs at-speed, and matches core test requirements while exploiting low-cost ATEs. However, automatically generating test programs is still an open problem. This paper presents a novel approach for test program generation, that couples evolutionary techniques with hardware acceleration. The methodology was evaluated targeting a 5-stage pipelined processor implementing a SPARCv8 microprocessor core.

References

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Digital Library

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P. Bernardi, M. Rebaudengo, M. Sonza Reorda, "Using Infrastructure IPs to support SW-based Self-Test of Processor Cores", published at MTV 2004.

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F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero, "Fully Automatic Test Program Generation for Microprocessor Cores", IEEE Design, Automation and Test in Europe, 2003, pp. 1006--1011.

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Cited By

Riefert ACantoro RSauer MReorda MBecker BNebel WAtienza D(2015)On the automatic generation of SBST test programs for in-field testProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757086(1186-1191)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2757086
Koal TScharoba SVierhaus H(2015)Exploring diagnostic capabilities of software-based self-tests for production and in-field applications2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)10.1109/ECMSM.2015.7208677(1-6)Online publication date: Jun-2015
https://doi.org/10.1109/ECMSM.2015.7208677

Index Terms

Automatic generation of test sets for SBST of microprocessor IP cores
1. Applied computing
  1. Arts and humanities
    1. Architecture (buildings)
      1. Computer-aided design
  2. Physical sciences and engineering
    1. Engineering
      1. Computer-aided design

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Published In

cover image ACM Conferences

SBCCI '05: Proceedings of the 18th annual symposium on Integrated circuits and system design

September 2005

271 pages

ISBN:1595931740

DOI:10.1145/1081081

General Chair:
Carlos Galup-Montoro
Federal University of Santa Catarina, Brazil
,
Program Chairs:
Sergio Bampi
Federal University of Rio Grande do Sul, Brazil
,
Alex Orailoglu
University of California, San Diego, CA

Copyright © 2005 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Publication History

Published: 04 September 2005

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SBCCI05

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SBCCI05: 18th Symposium on Integrated Circuits and System Design

September 4 - 7, 2005

Florianolpolis, Brazil

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Overall Acceptance Rate 133 of 347 submissions, 38%

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Cited By

Riefert ACantoro RSauer MReorda MBecker BNebel WAtienza D(2015)On the automatic generation of SBST test programs for in-field testProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition10.5555/2755753.2757086(1186-1191)Online publication date: 9-Mar-2015
https://dl.acm.org/doi/10.5555/2755753.2757086
Koal TScharoba SVierhaus H(2015)Exploring diagnostic capabilities of software-based self-tests for production and in-field applications2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)10.1109/ECMSM.2015.7208677(1-6)Online publication date: Jun-2015
https://doi.org/10.1109/ECMSM.2015.7208677

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