research-article

Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling

Authors:

M. TehranipoorAuthors Info & Claims

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Volume 24, Issue 4

Pages 1233 - 1246

https://doi.org/10.1109/TVLSI.2015.2466551

Published: 01 April 2016 Publication History

Abstract

The recycling of electronic components has become a major industrial and governmental concern, as it could potentially impact the security and reliability of a wide variety of electronic systems. It is extremely challenging to detect a recycled integrated circuit (IC) that is already used for a very short period of time because the process variations outpace the degradation caused by aging, especially in lower technology nodes. In this paper, we propose a suite of solutions, based on lightweight negative bias temperature instability (NBTI)-aware ring oscillators (ROs), for combating die and IC recycling (CDIR) when ICs are used for a very short duration. The proposed solutions are implemented in the 90-nm technology node. The simulation results demonstrate that our newly proposed NBTI-aware multiple pair RO-based CDIRs can detect ICs used only for a few hours.

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Cited By

Bahar Talukder BFerdaus FRahman M(2023)A Noninvasive Technique to Detect Authentic/Counterfeit SRAM ChipsACM Journal on Emerging Technologies in Computing Systems10.1145/359702419:2(1-25)Online publication date: 30-May-2023
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Ram SSahoo SDas BMahapatra KMohanty S(2023)Eternal-thing 2.0: Analog-Trojan-resilient Ripple-less Solar Harvesting System for Sustainable IoTACM Journal on Emerging Technologies in Computing Systems10.1145/357580019:2(1-25)Online publication date: 28-Mar-2023
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Koblah DAcharya RCapecci DDizon-Paradis OTajik SGanji FWoodard DForte D(2023)A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design AutomationACM Transactions on Design Automation of Electronic Systems10.1145/356339128:2(1-57)Online publication date: 6-Mar-2023
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Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling
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Published In

cover image IEEE Transactions on Very Large Scale Integration (VLSI) Systems

IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 24, Issue 4

April 2016

400 pages

ISSN:1063-8210

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Copyright © 2015.

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IEEE Educational Activities Department

United States

Publication History

Published: 01 April 2016

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Cited By

Bahar Talukder BFerdaus FRahman M(2023)A Noninvasive Technique to Detect Authentic/Counterfeit SRAM ChipsACM Journal on Emerging Technologies in Computing Systems10.1145/359702419:2(1-25)Online publication date: 30-May-2023
https://dl.acm.org/doi/10.1145/3597024
Ram SSahoo SDas BMahapatra KMohanty S(2023)Eternal-thing 2.0: Analog-Trojan-resilient Ripple-less Solar Harvesting System for Sustainable IoTACM Journal on Emerging Technologies in Computing Systems10.1145/357580019:2(1-25)Online publication date: 28-Mar-2023
https://dl.acm.org/doi/10.1145/3575800
Koblah DAcharya RCapecci DDizon-Paradis OTajik SGanji FWoodard DForte D(2023)A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design AutomationACM Transactions on Design Automation of Electronic Systems10.1145/356339128:2(1-57)Online publication date: 6-Mar-2023
https://dl.acm.org/doi/10.1145/3563391
Surabhi VKrishnamurthy PAmrouch HHenkel JKarri RKhorrami F(2023)Golden-Free Robust Age Estimation to Triage Recycled ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2023.323829142:9(2839-2851)Online publication date: 1-Sep-2023
https://dl.acm.org/doi/10.1109/TCAD.2023.3238291
Diaz-Fortuny JSaraza-Canflanca PBury EVandemaele MKaczer BDegraeve R(2022)A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability2022 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS48227.2022.9764609(1-7)Online publication date: 27-Mar-2022
https://dl.acm.org/doi/10.1109/IRPS48227.2022.9764609
Vakil ANiknia FMirzaeian ASasan AKarimi N(2021)Learning Assisted Side Channel Delay Test for Detection of Recycled ICsProceedings of the 26th Asia and South Pacific Design Automation Conference10.1145/3394885.3431640(455-462)Online publication date: 18-Jan-2021
https://dl.acm.org/doi/10.1145/3394885.3431640
Chowdhury PGuin USingh AAgrawal V(2021)Estimating Operational Age of an Integrated CircuitJournal of Electronic Testing: Theory and Applications10.1007/s10836-021-05927-337:1(25-40)Online publication date: 1-Feb-2021
https://dl.acm.org/doi/10.1007/s10836-021-05927-3
Zhang YGuin U(2019)End-to-End Traceability of ICs in Component Supply Chain for Fighting Against RecyclingIEEE Transactions on Information Forensics and Security10.1109/TIFS.2019.292849315(767-775)Online publication date: 23-Sep-2019
https://dl.acm.org/doi/10.1109/TIFS.2019.2928493

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