research-article

Skewed-Load Tests for Transition and Stuck-at Faults

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Irith PomeranzAuthors Info & Claims

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 38, Issue 10

Pages 1969 - 1973

https://doi.org/10.1109/TCAD.2018.2873233

Published: 01 October 2019 Publication History

Abstract

Test generation procedures target a variety of fault models in order to produce test sets that are effective for defect detection. This paper considers the likely scenario where two-cycle skewed-load tests are generated to detect single transition faults, and the test set is complemented with tests for single stuck-at faults that are not detected by the transition fault test set. For this scenario, this paper makes several unique observations that can be utilized to produce a single compact test set that consists only of two-cycle skewed-load tests for both fault models. The first observation is that a single-cycle test for a stuck-at fault can be transformed into a skewed-load test that is guaranteed to detect the stuck-at fault without performing logic or fault simulation. The second observation is that skewed-load tests, which are transformed from single-cycle tests for stuck-at faults, sometimes detect more transition and stuck-at faults than tests that were generated for transition faults. The third observation is that a static test compaction procedure, which is based on the modification and removal of tests, is effective in this context because it allows tests for stuck-at faults to detect more transition faults and vice versa. This paper describes a test compaction procedure based on these observations and presents experimental results for benchmark circuits to demonstrate the effectiveness of the procedure.

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Cited By

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Addepalli HPomeranz ISavidis ISasan AThapliyal HDeMara R(2022)Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied TestsProceedings of the Great Lakes Symposium on VLSI 202210.1145/3526241.3530359(345-349)Online publication date: 6-Jun-2022
https://dl.acm.org/doi/10.1145/3526241.3530359
Pomeranz I(2021)Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input VectorsACM Transactions on Design Automation of Electronic Systems10.1145/344001326:4(1-15)Online publication date: 15-Jan-2021
https://dl.acm.org/doi/10.1145/3440013

Index Terms

Skewed-Load Tests for Transition and Stuck-at Faults
1. Hardware
2. Mathematics of computing
  1. Discrete mathematics

Index terms have been assigned to the content through auto-classification.

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Broadside Tests for Transition and Stuck-At Faults
A recent work showed that it is possible to transform a single-cycle test for stuck-at faults into a skewed-load test that detects the same stuck-at faults without performing logic or fault simulation. By using this transformation, it is possible to ...
Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits

In enhanced-scan circuits, a two-pattern test < t_i, t_j > for a transition fault can be obtained by using a test t_j that detects a stuck-at fault, and preceding it by a test t_i that activates another stuck-at fault. Thus, test generation for transition ...
Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults
The use of both broadside (launch-on-capture) and skewed-load (launch-on-shift) tests for delay faults results in increased delay fault coverage and better test compaction than the use of a single test type. Two-cycle broadside and skewed-load tests ...

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cover image IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 38, Issue 10

Oct. 2019

194 pages

ISSN:0278-0070

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0278-0070 © 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.

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Published: 01 October 2019

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Addepalli HPomeranz ISavidis ISasan AThapliyal HDeMara R(2022)Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied TestsProceedings of the Great Lakes Symposium on VLSI 202210.1145/3526241.3530359(345-349)Online publication date: 6-Jun-2022
https://dl.acm.org/doi/10.1145/3526241.3530359
Pomeranz I(2021)Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input VectorsACM Transactions on Design Automation of Electronic Systems10.1145/344001326:4(1-15)Online publication date: 15-Jan-2021
https://dl.acm.org/doi/10.1145/3440013

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Recommendations

Broadside Tests for Transition and Stuck-At Faults

Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits

Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults

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