Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis

Effective silicon debug is key for time to money. Silicon debug and diagnosis attempt to locate and fix the root causes of failures upon identification of a chip that violates either a functional or timing specification. However, the tasks of silicon ...

VLSI design is driven by an ever-increasing challenge to cope with unreliable components at the device, circuit, and system levels. Reliability challenges include, for example, bias-temperature instability (BTI), dielectric breakdown, early-life failure,...

As silicon manufacturing processes scale to and beyond the 65-nm node, process variations are consuming an increasingly larger portion of design and test budgets. Such variations play a significant part in subthreshold leakage and other important device ...