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Analysis of propagation delay and repeater insertion in single-walled carbon nanotube bundle interconnects

Published: 01 August 2016 Publication History

Abstract

A new closed-form expression of 50% propagation delay for distributed RLC interconnects is proposed using the multivariable curve fitting method, with a maximum error of 4% with respect to SPICE results. Then accurate closed-form solutions for the optimum repeater number and size to minimize the propagation delay are further derived. The performance of single-walled carbon nanotube (SWCNT) bundle interconnects is evaluated using the proposed models in the intermediate and global levels at the 22- and 32-nm technology nodes, and compared against traditional Cu interconnects. It is shown that the performance of SWCNT bundle interconnects in propagation delay can outperform Cu interconnects, and the improvement will be enhanced with technology scaling and wire length increasing. On the other hand, the propagation delay of SWCNT bundle interconnects is super-linearly dependent on the wire length similar to Cu interconnects, indicating that the method of repeater insertion to reduce the propagation delay can also apply to SWCNT bundle interconnects. The results shown that repeater insertion can really reduce the propagation delay of SWCNT bundle interconnects effectively, and the optimum repeater number is much smaller than that of Cu interconnects.

References

[1]
M. Alioto, Modeling strategies of the input admittance of RC interconnects for VLSI CAD tools, Microelectron. J., 42 (2011) 63-73.
[2]
V.R. Kumarn, B.K. Kaushik1, A. Patnaik, Improved crosstalk noise modeling of MWCNT interconnects using FDTD technique, Microelectron. J., 46 (2015) 1263-1268.
[3]
M. Saremi, M. Saremi, H. Niazi, A.Y. Goharrizi, Modeling of lightly doped drain and source graphene nanoribbon field effect transistors, Superlattices Microstruct., 60 (2013) 67-72.
[4]
A. Giustiniani, V. Tucci, W. Zamboni, Carbon nanotubes bundled interconnects: design hints based on frequency- and time-domain crosstalk analyses, IEEE Trans. Electron Devices, 58 (2011) 2702-2711.
[5]
H. Li, W.Y. Yin, K. Banerjee, J.F. Mao, Circuit modeling and performance analysis of multi-walled carbon nanotube interconnects, IEEE Trans. Electron Devices, 55 (2008) 1328-1337.
[6]
A. Naeemi, J.D. Meindl, Compact physical models for multiwall carbon-nanotube interconnects, IEEE Electron Device Lett., 27 (2006) 338-340.
[7]
International Technology Roadmap for Semiconductors, Online. Available:¿{http://public.itrs.net}, 2013.
[8]
P.J. Burke, Lüttinger liquid theory as a model of the gigahertz electrical properties of carbon nanotubes, IEEE Trans. Nanotechnol., 1 (2002) 119-144.
[9]
P. Lamberti, V. Tucci, Impact of the variability of the process parameters on cnt-based nanointerconnects performances: a comparison between SWCNT bundles and MWCNT, IEEE Trans. Nanotechnol., 11 (2012) 924-933.
[10]
A.G. Chiariello, A. Maffucci, G. Miano, Circuit models of carbon-based interconnects for nanopackaging, IEEE Trans. Compon. Packag. Manuf. Technol., 3 (2013) 1926-1937.
[11]
A. Giustiniani, V. Tucci, W. Zamboni, Modeling issues and performance analysis of high-speed interconnects based on a bundle of SWCNT, IEEE Trans. Electron Devices, 57 (2010) 1978-1986.
[12]
F. Ferranti, G. Antonini, T. Dhaene, L. Knockaert, A. Orlandi, Compact and accurate models of large single-wall carbon-nanotube interconnects, IEEE Trans. Electromagn. Compat., 53 (2011) 1025-1033.
[13]
M.S. Sarto, A. Tamburrano, Single-conductor transmission-line model of multiwall carbon nanotubes, IEEE Trans. Nanotechnol., 9 (2010) 82-92.
[14]
A. Naeemi, J.D. Meindl, Performance modeling for single- and multiwall carbon nanotubes as signal and power interconnects in gigascale systems, IEEE Trans. Electron Devices, 55 (2008) 2574-2582.
[15]
S. List, M. Bamal, M. Stucchi, K. Maex, A global view of interconnects, Microelectron. Eng., 83 (2006) 2200-2207.
[16]
M.K. Majumder, P.K. Das, B.K. Kaushik, Delay and crosstalk reliability issues in mixed MWCNT bundle interconnects, Microelectron. Reliab., 54 (2014) 2570-2577.
[17]
A. Naeemi, J.D. Meindl, Design and performance modeling for single-walled carbon nanotubes as local, semiglobal, and global interconnects in gigascale integrated systems, IEEE Trans. Electron Devices, 54 (2007) 26-37.
[18]
N. Srivastava, H. Li, F. Kreupl, K. Banerjee, On the applicability of single-walled carbon nanotubes as VLSI interconnects, IEEE Trans. Nanotechnol., 8 (2009) 542-559.
[19]
L.B. Qian, Y.S. Xia, G.J. Liang, Study on crosstalk characteristic of carbon nanotube through silicon vias for three dimensional integration, Microelectron. J., 46 (2015) 572-580.
[20]
V.R. Kumar, B.K. Kaushik, A. Patnaik, Crosstalk noise modeling of multiwall carbon nanotube (MWCNT) interconnects using finite-difference time-domain (FDTD) technique, Microelectron. Reliab., 55 (2015) 155-163.
[21]
D. Das, H. Rahaman, Analysis of crosstalk in single- and multiwall carbon nanotube interconnects and its impact on gate oxide reliability, IEEE Trans. Nanotechnol., 10 (2011) 1362-1370.
[22]
K. Banerjee, A. Mehrotra, Analysis of on-chip inductance effects for distributed RLC interconnects, IEEE Trans. Comput. -Aided Des. Integr. Circuits Syst., 21 (2002) 904-915.
[23]
Y.I. Ismail, E.G. Friedman, Effects of inductance on the propagation delay and repeater insertion in VLSI circuits, IEEE Trans. Very Large Scale Integr. (VLSI) Syst., 8 (2000) 195-206.
[24]
H.B. Bakoglu, Circuits, Interconnections, and Packaging for VLSI, Addison-Wesley, Reading, MA, 1990.
[25]
R. Venkatesan, J.A. Davis, J.D. Meindl, Compact distributed RLC interconnect models-Part IV: unified models for time delay, crosstalk, and repeater insertion, IEEE Trans. Electron Devices, 50 (2003) 1094-1102.
[26]
W.S. Zhao, G.F. Wang, L.L. Sun, W.Y. Yin, Y.X. Guo, Repeater insertion for carbon nanotube interconnects, IET Micro Nano Lett., 9 (2014) 337-339.
[27]
T. Sun, B. Yao, A.P. Warren, K. Barmak, M.F. Toney, R.E. Peale, K.R. Coffey, Surface and grain-boundary scattering in nanometric Cu films, Phys. Rev. B, 81 (2010) 155454.
[28]
W. Steinhogl, G. Schindler, G. Steinlesberger, M. Traving, M. Engelhardt, Comprehensive study of the resistivity of copper wires with lateral dimensions of 100nm and smaller, J. Appl. Phys., 97 (2005) 023706.
[29]
S.-C. Wong, G.-Y. Lee, D.-J. Ma, Modeling of interconnect capacitance, delay, and crosstalk in VLSI, IEEE Trans. Semicond. Manuf., 13 (2000) 753-782.
[30]
A. Naeemi, J.D. Meindl, Monolayer metallic nanotube interconnects: promising candidates for short local interconnects, IEEE Electron Device Lett., 26 (2005) 544-546.
[31]
H. Li, W. Yin,¿J. Mao, Modeling of carbon nanotube interconnects and comparative analysis with cu interconnects, in: Proceedings of the IEEE APMC, Yokohama, December 12-15, 2006, pp. 1361-1364.
[32]
H. Li, K. Banerjee, High-frequency analysis of carbon nanotube interconnects and implications for on-chip inductor design, IEEE Trans. Electron Devices, 56 (2009) 2202-2214.
[33]
A.R. Harutyunyan, G. Chen, T.M. Paronyan, E.M. Pigos, O.A. Kuznetsov, K. Hewaparakrama, S.M. Kim, D. Zakharov, E.A. Stach, G.U. Sumanasekera, Preferential growth of Single-walled carbon nanotubes with metallic conductivity, Science, 326 (2009) 116-120.
[34]
R. Venkatesan, J.A. Davis, J.D. Meindl, Compact distributed RLC interconnect models-Part III: transients in single and coupled lines with capacitive load termination, IEEE Trans. Electron Devices, 50 (2003) 1081-1093.
[35]
A. Ceyhan, A. Naeemi, Cu interconnect limitations and opportunities for SWNT interconnects at the end of the roadmap, IEEE Trans. Electron Devices, 60 (2013) 374-382.

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cover image Microelectronics Journal
Microelectronics Journal  Volume 54, Issue C
August 2016
167 pages

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Elsevier Science Publishers B. V.

Netherlands

Publication History

Published: 01 August 2016

Author Tags

  1. Closed-form expression
  2. Global interconnect
  3. Intermediate interconnect
  4. Propagation delay
  5. Repeater insertion
  6. Single-walled carbon nanotube (SWCNT)

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