Inhleleleko
![](http://upload.wikimedia.org/wikipedia/commons/thumb/b/b6/Control_room_pt_tupper.jpg/220px-Control_room_pt_tupper.jpg)
Inhleleleko ichazisa izinhlobo ezihlukene zobuchwepheshe ezikwazi ukunciphisa ukungenelela komuntu emidludlungweni, okungukuthi ngokunqumela izinqumo, ubuhlobo bezinqobu ezincane, nezenzo ezihlobene, kanye nokufaka lezo zinqumelo ezinguxeni. Inhleleleko yinto ephunyeleliswe izinsiza ezihlukene ezihlanganisa ezobunguxa, ezomjilimba, ezohowo, ezamazuba, izilekeleli zezigabuzuba, neziCikizi, ikakhulu lapho kuhlanganiswe konke. Izinhlelo eziyinkimbinkimbi, ezifana nemikhando yanamuhla, izindiza, nemikhumbi, imvama zisebenzisa inhlanganisela yazi zonke lezinto. Inzuzo yenhleleleko ihlanganisa ukonga ekuqasheni abasebenzi, ukusaphaza okuncishisiwe, ukonga izindleko zamazuba, ukonga izindleko zezithako, kanye nokuthuthukiswa komgangatho, ukunemba.
Inhleleleko ihlanganisa nokusetshenziswa kwezinhlobonhlobo zezinsiza nezinhlelo zokulawula ezifana nezinguxa, izinqubo zasemkhando, izidlidlizi, nezinkangu zomchadamezo (heat treating ovens), ukuqhebeza amaxhoxho wocingo, ukululeza (steering), ukuzinzisa imikhumbi, izindiza, nezinye iziLekeleli nezithuthi ezincishiswe ukungenelela komuntu.
Umlando
[hlela | Hlela umthombo]Endulo
[hlela | Hlela umthombo]![](http://upload.wikimedia.org/wikipedia/commons/thumb/7/7b/Clepsydra-Diagram-Fancy.jpeg/170px-Clepsydra-Diagram-Fancy.jpeg)
Kwakungumsebenzi wamaGreki nama-Arabhu (enkathini ephakathi kwama- 300 BC kanye nowe- 1200 AD) ukuba bagcine isikhathi esinembile. EGibhithe lenkathi ka-Ptholemi, cishe ngowama- 270 BC, uSitesibasi wachazisa isilawuli esintantayo sikanozikhathi, isilekeleli esingafani nebhoshi lanamuhla elinembulungana ebhodweni. Lesi silekeleli kwakuyinguxa yasendulo elawulwa ngomazinkintshela.[1] Ukuvela komazisinkathi oyinguxa ekhulwini le-14 kwenza unozikhathi kanye nesimiso sakhe somazinkintshela kuphele ngaye.
- ↑ Guarnieri, M. (2010). "The Roots of Automation Before Mechatronics". IEEE Ind. Electron. M. 4 (2): 42–43. doi:10.1109/MIE.2010.936772.