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High-Endurance Bipolar ReRAM-Based Non-Volatile Flip-Flops with Run-Time Tunable Resistive States

Published: 17 July 2018 Publication History

Abstract

ReRAM technologies feature desired properties, e.g. fast switching and high read margin, that make them attractive candidates to be used in non-volatile flip-flops (NVFFs). However, they suffer from limited endurance. Therefore, cell degradation considerations are a necessity for practical deployment in non-volatile processors (NVPs). In this paper, we present two bipolar ReRAM-based NVFFs, Hypnos and Morpheus, with enhanced endurance and energy efficiency. Hypnos reduces the ReRAM electrical stress during set operation while keeping the imposed NVFF area overhead at a minimum. In Morpheus, a write-termination circuit is used to further enhance the ReRAM endurance and energy efficiency at the cost of an affordable area overhead. Moreover, both NVFFs feature run-time tunable resistive states to enable online adjustment of the tradeoff among endurance, retention, energy consumption, and restore success rate (in case of approximate computing). Experimental results demonstrate that Hypnos reduces the ReRAM set degradation by 91%, on average. Moreover, the write-termination mechanism in Morpheus further reduces the remaining degradation by 93%/97% in set/reset operation, on average. The results also demonstrate enhanced energy efficiency in both NVFFs.

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  1. High-Endurance Bipolar ReRAM-Based Non-Volatile Flip-Flops with Run-Time Tunable Resistive States

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      cover image ACM Conferences
      NANOARCH '18: Proceedings of the 14th IEEE/ACM International Symposium on Nanoscale Architectures
      July 2018
      176 pages
      ISBN:9781450358156
      DOI:10.1145/3232195
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 17 July 2018

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      Author Tags

      1. Approximate Store
      2. Bipolar ReRAM
      3. Non-Volatile Flip-Flop (NVFF)
      4. ReRAM Degradation
      5. ReRAM Endurance
      6. Run-Time Tunable Resistive States
      7. Write-Termination

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      NANOARCH '18 Paper Acceptance Rate 30 of 56 submissions, 54%;
      Overall Acceptance Rate 55 of 87 submissions, 63%

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