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2020 – today
- 2022
[j6]Abhishek Jain
, Andrea Mario Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin:
Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing. IEEE J. Solid State Circuits 57(9): 2878-2890 (2022)- 2021
- [j5]Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost:
First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerg. Top. Comput. 9(1): 104-108 (2021) - 2020
- [c5]Abhishek Jain, Andrea Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin:
Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. IOLTS 2020: 1-6
2010 – 2019
- 2015
- [j4]Marta Bagatin, Simone Gerardin:
Soft errors in floating gate memory cells: A review. Microelectron. Reliab. 55(1): 24-30 (2015) - [c4]N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Elisa Riceputi, Lodovico Ratti, Carla Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, Fabio Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, Mauro Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi:
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. IWASI 2015: 49-54 - 2014
- [c3]Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage:
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. ESSDERC 2014: 381-384 - 2012
- [j3]Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Carla Andreani, Giuseppe Gorini, C. D. Frost:
Temperature dependence of neutron-induced soft errors in SRAMs. Microelectron. Reliab. 52(1): 289-293 (2012) - [c2]Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, Marta Bagatin, Alessandro Paccagnella:
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. DFT 2012: 121-125 - 2010
- [j2]Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Giorgio Cellere, F. Irom, D. N. Nguyen:
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50(9-11): 1832-1836 (2010) - [j1]Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi:
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50(9-11): 1837-1841 (2010)
2000 – 2009
- 2007
- [c1]Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151
Coauthor Index
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