skip to main content
10.1145/2742060.2742081acmconferencesArticle/Chapter ViewAbstractPublication PagesglsvlsiConference Proceedingsconference-collections
research-article
Open access

Experimental Validation of a Faithful Binary Circuit Model

Published: 20 May 2015 Publication History

Abstract

Fast digital timing simulations based on continuous-time, digital-value circuit models are an attractive and heavily used alternative to analog simulations. Models based on analytic delay formulas are particularly interesting here, as they also facilitate formal verification and delay bound synthesis of complex circuits. Recently, Függer et al. (arXiv:1406.2544 [cs.OH]) proposed a circuit model based on so-called involution channels. It is the first binary circuit model that realistically captures solvability of short-pulse filtration, a non-trivial glitch propagation problem related to building one-shot inertial delays.
In this work, we address the question of whether involution channels also accurately model the delay of real circuits. Using both Spice simulations and physical measurements, we confirm that modeling an inverter chain by involution channels accurately describes reality. We also demonstrate that transitions in vanishing pulse trains are accurately predicted by the involution model. For our Spice simulations, we used both UMC-90 and UMC-65 technology, with varying supply voltages from nominal down to near sub-threshold range. The measurements were performed on a special-purpose UMC-90 ASIC that combines an inverter chain with low-intrusive high-speed on-chip analog amplifiers.

References

[1]
L. W. Nagel and D. Pederson, "SPICE (Simulation Program with Integrated Circuit Emphasis)," Tech. Rep. UCB/ERL M382, EECS Department, University of California, Berkeley, 1973.
[2]
Synopsis, "CCS timing." Technical white paper v2.0, 2006.
[3]
F. Najm, "A survey of power estimation techniques in vlsi circuits," Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 2, no. 4, pp. 446--455, 1994.
[4]
M. Favalli and L. Benini, "Analysis of glitch power dissipation in cmos ics," in Proceedings of the 1995 international symposium on Low power desig n, ISLPED '95, (New York, NY, USA), pp. 123--128, ACM, 1995.
[5]
M. Függer, T. Nowak, and U. Schmid, "Unfaithful glitch propagation in existing binary circuit models," in Proceedings 19th IEEE International Symposium on Asynchronous Cir cuits and Systems (ASYNC'13), pp. 191--199, IEEE Computer Society, 2013.
[6]
S. H. Unger, "Asynchronous sequential switching circuits with unrestricted input changes," IEEE ToC, vol. 20, no. 12, pp. 1437--1444, 1971.
[7]
M. J. Bellido-Díaz, J. Juan-Chico, and M. Valencia, Logic-Timing Simulation and the Degradation Delay Model. London: Imperial College Press, 2006.
[8]
M. J. Bellido-Diaz, J. Juan-Chico, A. Acosta, M. Valencia, and J. L. Huertas, "Logical modelling of delay degradation effect in static cmos gates," Circuits, Devices and Systems, IEE Proceedings -, vol. 147, no. 2, pp. 107--117, 2000.
[9]
M. Függer, R. Najvirt, T. Nowak, and U. Schmid, "Faithful glitch propagation in binary circuit models," arXiv:1406.2544, 2014. (appears in Proc. DATE'15).
[10]
M. Hofbauer, K. Schweiger, H. Dietrich, H. Zimmermann, K.-O. Voss, B. Merk, U. Schmid, and A. Steininger, "Pulse shape measurements by on-chip sense amplifiers of single event transients propagating through a 90 nm bulk CMOS inverter chain," IEEE Transactions on Nuclear Science, vol. 59, pp. 2778--2784, Dec. 2012.
[11]
M. A. Horowitz, Timing Models for MOS Circuits. PhD thesis, Stanford University, 1984.
[12]
T.-M. Lin and C. Mead, "Signal delay in general RC networks," IEEE TCAD, vol. 3, no. 4, pp. 331--349, 1984.
[13]
L. Pillage and R. Rohrer, "Asymptotic waveform evaluation for timing analysis," IEEE TCAD, vol. 9, no. 4, pp. 352--366, 1990.
[14]
A.-C. Deng and Y.-C. Shiau, "Generic linear RC delay modeling for digital CMOS circuits," IEEE TCAD, vol. 9, no. 4, pp. 367--376, 1990.
[15]
J. Juan-Chico, M. J. Bellido, P. Ruiz-de Clavijo, A. J. Acosta, and M. Valencia, "Degradation delay model extension to CMOS gates," in Integrated Circuit Design, LNCS 1918, pp. 149--158, Springer, 2000.
[16]
A. Millan, J. Juan, M. J. Bellido, P. Ruiz-de Clavijo, and D. Guerrero, "Characterization of normal propagation delay for delay degradation model (DDM)," in Integrated Circuit Design, LNCS 2451, pp. 477--486, Springer, 2002.

Cited By

View all

Index Terms

  1. Experimental Validation of a Faithful Binary Circuit Model

    Recommendations

    Comments

    Information & Contributors

    Information

    Published In

    cover image ACM Conferences
    GLSVLSI '15: Proceedings of the 25th edition on Great Lakes Symposium on VLSI
    May 2015
    418 pages
    ISBN:9781450334747
    DOI:10.1145/2742060
    Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

    Sponsors

    In-Cooperation

    • IEEE CEDA
    • IEEE CASS

    Publisher

    Association for Computing Machinery

    New York, NY, United States

    Publication History

    Published: 20 May 2015

    Check for updates

    Author Tags

    1. binary circuit models
    2. delay models
    3. vlsi

    Qualifiers

    • Research-article

    Funding Sources

    Conference

    GLSVLSI '15
    Sponsor:
    GLSVLSI '15: Great Lakes Symposium on VLSI 2015
    May 20 - 22, 2015
    Pennsylvania, Pittsburgh, USA

    Acceptance Rates

    GLSVLSI '15 Paper Acceptance Rate 41 of 148 submissions, 28%;
    Overall Acceptance Rate 312 of 1,156 submissions, 27%

    Contributors

    Other Metrics

    Bibliometrics & Citations

    Bibliometrics

    Article Metrics

    • Downloads (Last 12 months)45
    • Downloads (Last 6 weeks)9
    Reflects downloads up to 03 Jan 2025

    Other Metrics

    Citations

    Cited By

    View all

    View Options

    View options

    PDF

    View or Download as a PDF file.

    PDF

    eReader

    View online with eReader.

    eReader

    Login options

    Media

    Figures

    Other

    Tables

    Share

    Share

    Share this Publication link

    Share on social media