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Lightweight Target Detection: An Improved YOLOv8 for Small Target Defect Detection on Printed Circuit Boards

Published: 03 July 2024 Publication History

Abstract

Addressing the performance and efficiency challenges of detecting small target defects on PCB (printed circuit board), this research proposes a lightweight inspection model for YOLOv8-based. The initial step involves employing an enhanced Efficient_Detect network architecture with the aim of diminishing the volume of model parameters and computational intricacy, while simultaneously augmenting resource utilization. Then, the deformable convolutional networks v2 (DCNv2) are integrated into the C2f structure to improve feature extraction for defects with diverse shapes on the PCB surface, enhancing the model's capability to identify different categories of flaws. Meanwhile, the Inner-SIoU loss function is utilized instead of the conventional CIoU loss function to enhance both the precision of inspection and the robustness of the model. The enhanced approach achieves an mAP50 of 96.8% and an mAP50-95 of 72.2%, marking an improvement of 3.9% and 10.1%, respectively, comparison with base YOLOv8n model. In addition, the parameter counts of the model, GFLOPs, and weight size are notably reduced by 18.4%, 33.3%, and 19.7%, respectively, resulting in final metrics of 2.34 M, 5.4 GFLOPs, and a weight size of 4.9 M. In addition, the detection speed can reach up to 161 FPS, which has the potential for real-time detection. It provides an efficient and lightweight PCB small target defect detection solution for scenarios with limited computing resources.

References

[1]
Girshick R, Donahue J, Darrell T, Rich feature hierarchies for accurate object detection and semantic segmentation[C]. Proceedings of the IEEE conference on computer vision and pattern recognition (CVPR). Columbus, United States, 2014: 580-587.
[2]
Ding R, Dai L, Li G, TDD‐net: a tiny defect detection network for printed circuit boards[J]. CAAI Transactions on Intelligence Technology, 2019, 4(2): 110-116.
[3]
Redmon J, Divvala S, Girshick R, You only look once: Unified, real-time object detection[C]//Proceedings of the IEEE conference on computer vision and pattern recognition. 2016: 779-788.
[4]
Liu W, Anguelov D, Erhan D, Ssd: Single shot multibox detector[C]//Computer Vision–ECCV 2016: 14th European Conference, Amsterdam, The Netherlands, October 11–14, 2016, Proceedings, Part I 14. Springer International Publishing, 2016: 21-37.
[5]
Wang Z, Chen W, Li T, Improved YOLOv3 detection method for PCB plug-in solder joint defects based on ordered probability density weighting and attention mechanism[J]. AI Communications, 2022 (Preprint): 1-16.
[6]
Liao X, Lv S, Li D, YOLOv4-MN3 for PCB surface defect detection[J]. Applied Sciences, 2021, 11(24): 11701.
[7]
Tang J, Liu S, Zhao D, PCB-YOLO: An improved detection algorithm of PCB surface defects based on YOLOv5[J]. Sustainability, 2023, 15(7): 5963.
[8]
Chen B, Dang Z. Fast PCB defect detection method based on FasterNet backbone network and CBAM attention mechanism integrated with feature fusion module in improved YOLOv7[J]. IEEE Access, 2023.
[9]
Chen P, Xie F. A Machine Learning Approach for Automated Detection of Critical PCB Flaws in Optical Sensing Systems[C]//Photonics. MDPI, 2023, 10(9): 984.
[10]
Wang R, Shivanna R, Cheng D, Dcn v2: Improved deep & cross network and practical lessons for web-scale learning to rank systems[C]//Proceedings of the web conference 2021. 2021: 1785-1797.
[11]
Chen J, Kao S, He H, Run, Don't Walk: Chasing Higher FLOPS for Faster Neural Networks[C]//Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition. 2023: 12021-12031.
[12]
Zhang H, Xu C, Zhang S. Inner-IoU: More Effective Intersection over Union Loss with Auxiliary Bounding Box[J]. arXiv preprint arXiv: 2311.02877, 2023.
[13]
Redmon J, Farhadi A. Yolov3: An incremental improvement[J]. arXiv preprint arXiv: 1804.02767, 2018.

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  1. Lightweight Target Detection: An Improved YOLOv8 for Small Target Defect Detection on Printed Circuit Boards

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    GAIIS '24: Proceedings of the 2024 International Conference on Generative Artificial Intelligence and Information Security
    May 2024
    439 pages
    ISBN:9798400709562
    DOI:10.1145/3665348
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

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    Published: 03 July 2024

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