About
TH2000 is a revolutionary automatic wafer prober which combines double-sided wafer probing capability with comprehensive test resources, including electrical test, HV/HI test, warpage and surface verification, and optical inspection.
The system performs complete, high-throughput tests at wafer level for the most challenging applications, including power devices, optoelectronics, pass-through dies, multi-project wafers, complex systems-on-a-chip and unconventional layouts, with size up to 12” (300mm).
The probing technology based on multiple flying probe cards and the lean test process (all the tests required at wafer level are performed in a single step) make TH2000 able to dramatically lower your cost of test.
This product is intended for
- Test Engineer
- Test Specialist
- Test Manager
- Senior Test Engineer
- Test Development Engineer
- Quality Assurance Specialist
- Quality Assurance Manager
- Director of Quality
- Production Specialist
- Production Manager
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TH2000 Double-sided wafer prober and tester
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TH2000 Double-sided wafer prober and tester - Simultaneous double-sided probing and testing
Eight independent axes provide parallel test capabilities, which shorten the overall process time (indexing + test time). Each probe can test a dedicated area of the media in parallel with the others, while a single die can be simultaneously contacted from top and bottom.
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TH2000 Double-sided wafer prober and tester - Fast and precise probing
Hi-Speed Linear Motors with Hi-Resolution Linear Optical Encoders are used on each XYZ axis, to ensure high throughput and best probing accuracy. The system chassis made of natural granite provides high stiffness, excellent vibration damping, thermal stability, to avoid any loss in accuracy due to movement speed and environmental variations.
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TH2000 Double-sided wafer prober and tester - Gentle contacting
Ultra Soft Touch technology allows TH2000 to contact the most delicate and smallest dies without leaving marks, thanks to a programmable overdrive (down to 1 gram) and controlled motion profiles.