Altechna’s Post

This AFM topography image of a multilayer graphene flake on Si substrate not only reveals surface intricacies but also showcases precise nanoscale modifications. Such insights are pivotal for advancing 2D materials research, from understanding fundamental properties to paving the way for innovative applications. Learn more about AFM for 2D materials research: https://hubs.la/Q026P__x0

It is always a great feeling when we get to contribute to the scientific works of our loyal customers. Like this article by the Inorganic Materials Science Team at the University of Twente on advanced Atomic Force Microscopy (AFM) techniques. In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin Probe Force Microscopy (KPFM) under modulated illumination. These measurements were performed with a Park Systems NX10 AFM microscope equipped with Pt/Ir-coated silicon probes. Read the full article, published by the Beilstein-Institut, to find out more about this technique that offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale: https://okt.to/FC5Q1a With Zeinab Eftekhari, Dr. Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Dr. Andrea Cerreta, Dr. Ilka Hermes, Minh Nguyen, Guus Rijnders and Prof. Rebecca Saive #NX10 #KPFM #UTwente #ParkSystems

It is always a great feeling when we get to contribute to the scientific works of our loyal customers. Like this article by the Inorganic Materials Science Team at the University of Twente on advanced Atomic Force Microscopy (AFM) techniques. In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin Probe Force Microscopy (KPFM) under modulated illumination. These measurements were performed with a Park Systems NX10 AFM microscope equipped with Pt/Ir-coated silicon probes. Read the full article, published by the Beilstein-Institut, to find out more about this technique that offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale: https://okt.to/ju7FvH With Zeinab Eftekhari, Dr. Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Dr. Andrea Cerreta, Dr. Ilka Hermes, Minh Nguyen, Guus Rijnders and Prof. Rebecca Saive #NX10 #KPFM #UTwente #ParkSystems

It is always a great feeling when we get to contribute to the scientific works of our loyal customers. Like this article by the Inorganic Materials Science Team at the University of Twente on advanced Atomic Force Microscopy (AFM) techniques. In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin Probe Force Microscopy (KPFM) under modulated illumination. These measurements were performed with a Park Systems NX10 AFM microscope equipped with Pt/Ir-coated silicon probes. Read the full article, published by the Beilstein-Institut, to find out more about this technique that offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale: https://okt.to/DuvyV4 With Zeinab Eftekhari, Dr. Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Dr. Andrea Cerreta, Dr. Ilka Hermes, Minh Nguyen, Guus Rijnders and Prof. Rebecca Saive #NX10 #KPFM #UTwente #ParkSystems

It is always a great feeling when we get to contribute to the scientific works of our loyal customers. Like this article by the Inorganic Materials Science Team at the University of Twente on advanced Atomic Force Microscopy (AFM) techniques. In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin Probe Force Microscopy (KPFM) under modulated illumination. These measurements were performed with a Park Systems NX10 AFM microscope equipped with Pt/Ir-coated silicon probes. Read the full article, published by the Beilstein-Institut, to find out more about this technique that offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale: https://okt.to/KJmRrS With Zeinab Eftekhari, Dr. Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Dr. Andrea Cerreta, Dr. Ilka Hermes, Minh Nguyen, Guus Rijnders and Prof. Rebecca Saive #NX10 #KPFM #UTwente #ParkSystems

Rapid colorimetric detection of EVs: Justus Ndukaife (Ph.D.) and collaborators at Vanderbilt University integrated metasurface optics with optofluidics to enable the active transport of extracellular vesicles, facilitating rapid capture and detection by observing a color change upon adsorption https://lnkd.in/eqdSHpdJ This set-up allowed for spectrometer-less and label-free colorimetric detection of EV concentrations as low as 10E7 particles/ml in just two minutes of incubation. An article also authored by Chuchuan Hong, Ikjun Hong and Sen Yang #extracellularvesicles #exosomes #optoelectronics #liquidbiopsy #Vesiculab

🚨Today is the day of #PhotonicsWest! Drop by 📍Booth #417 - Hall A! Come to check out the latest developments on #instrumentation for fluorescence lifetime analysis #FLA and #FLIM! Here is a nice 3D map🗺️ for your reference!😙 SPIE, the international society for optics and photonics

It is always a great feeling when we get to contribute to the scientific works of our loyal customers. Like this article by the Inorganic Materials Science Team at the University of Twente on advanced Atomic Force Microscopy (AFM) techniques. In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin Probe Force Microscopy (KPFM) under modulated illumination. These measurements were performed with a Park Systems NX10 AFM microscope equipped with Pt/Ir-coated silicon probes. Read the full article, published by the Beilstein-Institut, to find out more about this technique that offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale: https://okt.to/PdRKlW With Zeinab Eftekhari, Dr. Nasim Rezaei, Hidde Stokkel, Jian-Yao Zheng, Dr. Andrea Cerreta, Dr. Ilka Hermes, Minh Nguyen, Guus Rijnders and Prof. Rebecca Saive #NX10 #KPFM #UTwente #ParkSystems

In this paper, we present a novel technique to image the optical field distribution inside a nanophotonic dielectric laser particle accelerator (DLA) with deep sub-wavelength spatial and sub-nm spectral resolution. We applied this method for a deep examination of two leading DLA structures and were able to reveal surprising deviations in the internal field distribution from their intended designs. Such field deviations were impossible to identify by other means and can now be attributed to deviations in specific nanostructure parameters arising in the nanofabrication. We expect this method to be a key characterization tool in the design of future nanophotonic devices. Link to the paper: https://rb.gy/wzmie4

It is always great to see hard work pay off! ✨ Pushing the limits of resolution in imaging enables and improves various scientific fields that study complex, hierarchical, and heterogeneous structures. Multilayer Laue lenses (MLL) are diffractive X-ray optics which can in principle achieve unprecedented small foci but are limited in their fabrication process where small layer misplacements lead to aberrations in the wavefront. Such can be corrected with so called phase plates, however, the very high numerical (NA) aperture required for strong focusing leads to aberrations too large to correct with a single phase plate. Using a novel approach of an array of elements, called a compound refractive corrector, we were able to correct most of the aberrations of a high NA MLL pair which resulted in a record focus size of 2.9 nm x 2.8 nm! 🔍 Read the full story here (open access): https://lnkd.in/egvUjRsy