This paper presents motivation for considering the power constraint in testing and gives a model-based formulation of the new test scheduling problem.
This paper presents motivation for considering the power constraint in testing and gives a model-based formulation of the new test scheduling problem. Op- timum ...
This paper presents motivation for considering the power constraint in testing and gives a model-based formulation of the new test scheduling problem.
This paper considers the problem of testing VLSI integrated circuits in minimum time without exceeding their power ratings during test, using a resource ...
Test scheduling has to take into consideration of both test concurrency and power dissipation constraints. For satisfying high fault coverage goals with minimum ...
Oct 22, 2024 · This paper considers the problem of testing VLSI integrated circuits in minimum time without exceeding their power ratings during test.
Abstract—In this paper, we propose a method of minimizing test time in SoCs (System-on-chip), for a given power budget, by varying the test clock frequency ...
[PDF] Test Scheduling and Scan-Chain Division Under Power Constraint
citeseerx.ist.psu.edu › document
An integrated technique for test scheduling and scan-chain division under power constraints is proposed in this paper. We demonstrate that optimal test time ...
Sep 21, 2014 · The final power constraint for sessionless test scheduling can be expressed as “for every test t 1, the sum of power from every test that ...
In this paper, we present a novel scheduling algorithmfor testing embedded core-based SoCs. Given test conflicts,power consumption limitation and top level ...