Abstract: The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision.

This paper presents a hardware system approach to weighted random pattern generation for boundary scan. We introduce WARP, a weighted test generation system.

The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision.

Abstract: The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision. Either ...

A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, ...

Weighted pseudorandom built-in self test (BIST) schemes have been utilized in order to drive down the number of vectors to achieve complete fault coverage.

Various BIST architectures based on pseudo-exhaustive, random, weighted random, and deterministic patterns have been developed in recent years. They offer ...

Abstract. We describe a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational.

Abstract—This paper presents a new test data-compression scheme that is a hybrid approach between external testing and built-in self-test (BIST).

The main problem with weighted pseudo-random BIST is that several different weight sets are required in order to obtain 100% stuck-fault coverage, and for each ...