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Modeling and simulation of real defects using fuzzy logic

Authors:

Mehradad Nourani,

Carco LucasAuthors Info & Claims

DAC '00: Proceedings of the 37th Annual Design Automation Conference

Pages 631 - 636

https://doi.org/10.1145/337292.337601

Published: 01 June 2000 Publication History

Abstract

Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the traditional zero-resistance model is not sufficient. Then, we present a resistive fault model for real defects and use fuzzy logic techniques for fault simulation and test pattern generation at the gate-level. Our method produces more realistic fault coverage compared to the conventional methods. The experimental results include the fault coverage and test pattern statistics for the ISCAS85 benchmarks.

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Cited By

Favalli MDalpasso M(2006)Bridging fault modeling and simulation for deep submicron CMOS ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2002.80045721:8(941-953)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/TCAD.2002.800457
DB SAl-Khalili DRozon C(2003)IC bridge fault modeling for IP blocks using neural network-based VHDL saboteursIEEE Transactions on Computers10.1109/TC.2003.123452652:10(1285-1297)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1109/TC.2003.1234526
Nourani MAttarha ALucas C(2002)Application of fuzzy logic in resistive fault modeling and simulationIEEE Transactions on Fuzzy Systems10.1109/TFUZZ.2002.80068910:4(461-472)Online publication date: 1-Aug-2002
https://dl.acm.org/doi/10.1109/TFUZZ.2002.800689
Show More Cited By

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Modeling and simulation of real defects using fuzzy logic

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cover image ACM Conferences

DAC '00: Proceedings of the 37th Annual Design Automation Conference

June 2000

819 pages

ISBN:1581131879

DOI:10.1145/337292

Chairman:
Giovanni De Micheli
Stanford Univ., Stanford, CA

Copyright © 2000 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 01 June 2000

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Cited By

Favalli MDalpasso M(2006)Bridging fault modeling and simulation for deep submicron CMOS ICsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2002.80045721:8(941-953)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/TCAD.2002.800457
DB SAl-Khalili DRozon C(2003)IC bridge fault modeling for IP blocks using neural network-based VHDL saboteursIEEE Transactions on Computers10.1109/TC.2003.123452652:10(1285-1297)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1109/TC.2003.1234526
Nourani MAttarha ALucas C(2002)Application of fuzzy logic in resistive fault modeling and simulationIEEE Transactions on Fuzzy Systems10.1109/TFUZZ.2002.80068910:4(461-472)Online publication date: 1-Aug-2002
https://dl.acm.org/doi/10.1109/TFUZZ.2002.800689
Ibrahim A(2001)Bringing fuzzy logic into focusIEEE Circuits and Devices Magazine10.1109/101.96068617:5(33-38)Online publication date: Jan-2001
https://doi.org/10.1109/101.960686

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