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Statistical memristor modeling and case study in neuromorphic computing

Published: 03 June 2012 Publication History

Abstract

Memristor, the fourth passive circuit element, has attracted increased attention since it was rediscovered by HP Lab in 2008. Its distinctive characteristic to record the historic profile of the voltage/current creates a great potential for future neuromorphic computing system design. However, at the nano-scale, process variation control in the manufacturing of memristor devices is very difficult. The impact of process variations on a memristive system that relies on the continuous (analog) states of the memristors could be significant. We use TiO2-based memristor as an example to analyze the impact of geometry variations on the electrical properties. A simple algorithm was proposed to generate a large volume of geometry variation-aware three-dimensional device structures for Monte-Carlo simulations. A neuromorphic computing system based on memristor-based bidirectional synapse design is proposed as case study. We analyze and evaluate the robustness of the proposed system in pattern recognition based on massive Monte-Carlo simulations, after considering input defects and process variations.

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    cover image ACM Conferences
    DAC '12: Proceedings of the 49th Annual Design Automation Conference
    June 2012
    1357 pages
    ISBN:9781450311991
    DOI:10.1145/2228360
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 03 June 2012

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    Author Tags

    1. memristor
    2. neural network
    3. pattern recognition
    4. process variation

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    DAC '12: The 49th Annual Design Automation Conference 2012
    June 3 - 7, 2012
    California, San Francisco

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