research-article

Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling

Authors:

Plamen K. NikolovAuthors Info & Claims

ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 13, Issue 2

Article No.: 33, Pages 1 - 28

https://doi.org/10.1145/1344418.1344429

Published: 23 April 2008 Publication History

Abstract

Process variations play an increasingly important role on the success of analog circuits. State-of-the-art analog circuits are based on complex architectures and contain many hierarchical layers and parameters. Knowledge of the parameter variances and their contribution patterns is crucial for a successful design process. This information is valuable to find solutions for many problems in design, design automation, testing, and fault tolerance. In this article, we present a hierarchical variance analysis methodology for multistage analog circuits. Starting from the process/layout level, we derive implicit hierarchical relations and extract the sensitivity information analytically. We make use of previously computed values whenever possible so as to reduce computational time. The proposed approach is particularly geared for the domain of design and test automation, where multiple runs on slightly different circuits are necessary. Experimental results indicate that the proposed method provides both accuracy and computational efficiency when compared with prior approaches.

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Cited By

Kashyap SRaghavendra CNatarajan SOzev S(2024)Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538672(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538672
Subrahmaniyan Radhakrishnan GOzev S(2011)Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response EvaluationJournal of Electronic Testing: Theory and Applications10.1007/s10836-011-5221-z27:4(465-476)Online publication date: 1-Aug-2011
https://dl.acm.org/doi/10.1007/s10836-011-5221-z
Tlelo-Cuau EGuerra-Gom IDuarte-Vil Mde la Frag LFlores-Bec GReyes-Salg GReyes-Garc CRodriguez- G(2010)Applications of Evolutionary Algorithms in the Design Automation of Analog Integrated CircuitsJournal of Applied Sciences10.3923/jas.2010.1859.187210:17(1859-1872)Online publication date: 1-Dec-2010
https://doi.org/10.3923/jas.2010.1859.1872

Index Terms

Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling
1. Hardware

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Published In

cover image ACM Transactions on Design Automation of Electronic Systems

ACM Transactions on Design Automation of Electronic Systems Volume 13, Issue 2

April 2008

272 pages

ISSN:1084-4309

EISSN:1557-7309

DOI:10.1145/1344418

Issue’s Table of Contents

Copyright © 2008 ACM.

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Association for Computing Machinery

New York, NY, United States

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ACM Journals for the Design of Smart and Connected Systems

Publication History

Published: 23 April 2008

Accepted: 01 October 2007

Revised: 01 August 2007

Received: 01 October 2006

Published in TODAES Volume 13, Issue 2

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Cited By

Kashyap SRaghavendra CNatarajan SOzev S(2024)Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538672(1-7)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VTS60656.2024.10538672
Subrahmaniyan Radhakrishnan GOzev S(2011)Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response EvaluationJournal of Electronic Testing: Theory and Applications10.1007/s10836-011-5221-z27:4(465-476)Online publication date: 1-Aug-2011
https://dl.acm.org/doi/10.1007/s10836-011-5221-z
Tlelo-Cuau EGuerra-Gom IDuarte-Vil Mde la Frag LFlores-Bec GReyes-Salg GReyes-Garc CRodriguez- G(2010)Applications of Evolutionary Algorithms in the Design Automation of Analog Integrated CircuitsJournal of Applied Sciences10.3923/jas.2010.1859.187210:17(1859-1872)Online publication date: 1-Dec-2010
https://doi.org/10.3923/jas.2010.1859.1872

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