Article

Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits

Authors:

Jung Hwan Choi,

Mesut Meterelliyoz,

Jayathi Murthy,

Kaushik RoyAuthors Info & Claims

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

Pages 583 - 586

https://doi.org/10.1145/1233501.1233620

Published: 05 November 2006 Publication History

Abstract

In this work we propose a methodology to self-consistently solve leakage power with temperature to predict thermal runaway. We target 28n m FinFET based circuits as they are more prone to thermal runaway compared to bulk-MOSFETs. We generate thermal models for logic cells to self-consistently determine the temperature map of a circuit block. Our proposed condition for thermal runaway shows the design trade off between the primary input (PI) activity of a circuit block, sub-threshold leakage at the room temperature and the thermal resistance of the package. We show that in FinFET circuits, thermal runaway can occur at the ITRS specified sub-threshold leakage (150nA/μm, highperformance) for a nominal PI activity of 0.5 and typical package thermal resistance.

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Cited By

Tang AGao XChen LJha N(2016)Delay/Power Modeling and Optimization of FinFET Circuit Modules under PVT VariationsACM Journal on Emerging Technologies in Computing Systems10.1145/279523112:4(1-21)Online publication date: 8-Mar-2016
https://dl.acm.org/doi/10.1145/2795231
Tang AJha N(2013)Design space exploration of FinFET cacheACM Journal on Emerging Technologies in Computing Systems10.1145/24916789:3(1-16)Online publication date: 8-Oct-2013
https://dl.acm.org/doi/10.1145/2491678
Meterelliyoz MRoy KWakabayashi K(2009)Design for burn-in testProceedings of the 2009 Asia and South Pacific Design Automation Conference10.5555/1509633.1509809(787-792)Online publication date: 19-Jan-2009
https://dl.acm.org/doi/10.5555/1509633.1509809
Show More Cited By

Index Terms

Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits
1. Hardware
  1. Integrated circuits
    1. Logic circuits
      1. Combinational circuits

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cover image ACM Conferences

ICCAD '06: Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

November 2006

147 pages

ISBN:1595933891

DOI:10.1145/1233501

General Chair:
Soha Hassoun
Tufts Univ., Medford, MA

Copyright © 2006 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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SIGDA: ACM Special Interest Group on Design Automation
IEEE-CAS: Circuits & Systems
IEEE-CS: Computer Society

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 05 November 2006

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ICCAD06: The International Conference on Computer-Aided Design 2006

November 5 - 9, 2006

California, San Jose

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

Tang AGao XChen LJha N(2016)Delay/Power Modeling and Optimization of FinFET Circuit Modules under PVT VariationsACM Journal on Emerging Technologies in Computing Systems10.1145/279523112:4(1-21)Online publication date: 8-Mar-2016
https://dl.acm.org/doi/10.1145/2795231
Tang AJha N(2013)Design space exploration of FinFET cacheACM Journal on Emerging Technologies in Computing Systems10.1145/24916789:3(1-16)Online publication date: 8-Oct-2013
https://dl.acm.org/doi/10.1145/2491678
Meterelliyoz MRoy KWakabayashi K(2009)Design for burn-in testProceedings of the 2009 Asia and South Pacific Design Automation Conference10.5555/1509633.1509809(787-792)Online publication date: 19-Jan-2009
https://dl.acm.org/doi/10.5555/1509633.1509809
Raj BSaxena ADasgupta S(2009)Analytical modeling for the estimation of leakage current and subthreshold swing factor of nanoscale double gate FinFET deviceMicroelectronics International10.1108/1356536091092318826:1(53-63)Online publication date: 23-Jan-2009
https://doi.org/10.1108/13565360910923188
Choi JMurthy JRoy KGielen G(2007)The effect of process variation on device temperature in FinFET circuitsProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326230(747-751)Online publication date: 5-Nov-2007
https://dl.acm.org/doi/10.5555/1326073.1326230

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