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View all- Pomeranz I(2018)Boundary-Functional Broadside and Skewed-Load TestsACM Transactions on Design Automation of Electronic Systems10.1145/327697624:1(1-20)Online publication date: 21-Dec-2018
- Zhang YLing LJiang JXiao J(2018)Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test PartitionJournal of Electronic Testing: Theory and Applications10.1007/s10836-018-5733-x34:4(447-460)Online publication date: 1-Aug-2018