Papers by Pablo Mandolesi
International Journal of Circuit Theory and Applications, 2020
Fil: Masson, Favio Roman. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cien... more Fil: Masson, Favio Roman. Consejo Nacional de Investigaciones Cientificas y Tecnicas. Centro Cientifico Tecnologico Bahia Blanca. Instituto de Investigacion En Ingenieria Electrica; Argentina
2005 IEEE International Symposium on Circuits and Systems
2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), 2013
ABSTRACT In the nanoscale technologies, the on-chip Power Management design strategy as a part of... more ABSTRACT In the nanoscale technologies, the on-chip Power Management design strategy as a part of a System on Chip (SoC) is becoming extremely important. This work presents a fully integrated SIMO converter in a CMOS 65 nm technology. Since passive components are also integrated and their values should result relatively small the converter operates at a switching frequency of 200 MHz. This version counts with a step-up and a step-down outputs, but it can be easily extended to more otuputs. A suitable control strategy for high speed and nano-scale process together with system simulation results are discused.
2014 Argentine Conference on Micro-Nanoelectronics, Technology and Applications (EAMTA), 2014
2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014
Summary form only given. The radiation exposure of electronic circuits and devices alters their e... more Summary form only given. The radiation exposure of electronic circuits and devices alters their electrical characteristics. When a high-energy particle hits a silicon substrate, and due to coulombian interaction, hole-electron pairs are created. A fraction of these carriers recombine but most of them are swept by the electric field in the depletion regions, generating current pulses that disrupt the normal operation of the circuit. As a consequence, this may lead to a very serious system failures, or progressive performance degradation. When critical missions use these systems, reliability is the main concern, therefore circuits with special considerations must be constructed using techniques for improving radiation tolerance as Radiation Hardening by Design (RHBD) that is cheap and fits well for designs implemented in sub-micron CMOS processes. To check circuit vulnerability of a hardened device different radiation tests must be conducted. For particle interaction tests, one of the most challenging tasks is to perform radiation ground tests that mimics real operation situations. Recently, many efforts have been achieved using laser equipments as in the works of Schwank1 and Palomo2 for transient fault injection, even though, the results must be correlated to heavy ion interaction to validate the approach. In this work, irradiation experiments with heavy-ions in VLSI circuits are reported. We explain how to lower the number of particles per second that reach the circuit, as also to focus the ion beam and control its position to hit on the desired place. We describe the dosimetry as also the measurement methodology. This work demonstrates that the use of a micro-beam line attached to a High-Energy accelerator is suitable for this kind of tests evidencing the validity and robustness of the method.
Imagers with on-chip processing capabilities are required for high-speed and high resolution imag... more Imagers with on-chip processing capabilities are required for high-speed and high resolution image processing systems. In this paper, we present an image processor based on a simplicial CNN (S-CNN) cell. As a result of using the S-CNN as the core processor, the architecture is endowed with a solid theoretical framework and the parallel processing capabilities of CNNs. The proposed architecture is fully digital, which is fundamental because it implies that the density of the S-CNN imager will scale directly with technology.
2019 XVIII Workshop on Information Processing and Control (RPIC)
AEU - International Journal of Electronics and Communications
International Journal of Circuit Theory and Applications
IEEE Latin America Transactions, 2016
2015 XVI Workshop on Information Processing and Control (RPIC), 2015
Proceedings of 2010 Ieee International Symposium on Circuits and Systems, 2010
Page 1. PWL Cores for Nonlinear Array Processing Martın Di Federico, Pedro Julián , Pablo S. Mand... more Page 1. PWL Cores for Nonlinear Array Processing Martın Di Federico, Pedro Julián , Pablo S. Mandolesi, Andreas G. Andreou AbstractThis paper presents an analysis of different alter-natives for the realization of a VLSI ...
2011 Argentine School of Micro Nanoelectronics Technology and Applications, 2011
In this paper the noise characterization for a three- electrode electrochemical amperometric sens... more In this paper the noise characterization for a three- electrode electrochemical amperometric sensor is presented. The sensor is used for the determination of biochemical oxygen de- mand (BOD) in water and it is based on a ferricyanide-mediated approch. The micro and meso-electrodes were manufactured using microfabrication technologies. The experimental setup used allows to measure the voltage noise between a reference
2007 Ieee International Symposium on Circuits and Systems, May 27, 2007
In this paper, we report a low power integrated circuit that implements an adaptive version of th... more In this paper, we report a low power integrated circuit that implements an adaptive version of the cross-correlation derivative algorithm for the estimation of inter-aural time difference. The architecture and logic structure as well as measured results reporting the performance of the IC -fabricated in a standard CMOS 0.5 mum process - are shown.
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Papers by Pablo Mandolesi