Article

Automatic test program generation for pipelined processors

Authors:

F. Corno,

G. Cumani,

M. Sonza Reorda,

G. SquilleroAuthors Info & Claims

SAC '03: Proceedings of the 2003 ACM symposium on Applied computing

Pages 736 - 740

https://doi.org/10.1145/952532.952676

Published: 09 March 2003 Publication History

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Abstract

The continuous advances in microelectronics design are creating a significant challenge to design validation in general, but tackling piplined microprocessors is remarkably more demanding. This paper presents a methodology to automatically induce a test program for a microprocessor maximizing a given verification metric. The approach exploits a new evolutionary algorithm, close to Genetic Programming, able to cultivate effective assembly-language programs. The proposed methodology was used to verify the DLX/pII, an open-source processor with a 5-stage pipeline. Code-coverage was adopted in the paper, since it can be considered the required starting point for any simulation-based functional verification processes. Experimental results clearly show the effectiveness of the approach.

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Anders JAndreu PBecker BBecker SCantoro RDeligiannis NElhamawy NFaller THernandez CMentens NRizi MPolian ISajadi ASauer MSchwachhofer DReorda MStefanov TTuzov IWagner SZidarič N(2023)A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors2023 IEEE European Test Symposium (ETS)10.1109/ETS56758.2023.10174099(1-10)Online publication date: 22-May-2023
https://doi.org/10.1109/ETS56758.2023.10174099
Hudec J(2019)Enhancement of Adaptive Software-Based Self Test Generation of Embedded Processors CoresIFAC-PapersOnLine10.1016/j.ifacol.2019.12.73252:27(56-61)Online publication date: 2019
https://doi.org/10.1016/j.ifacol.2019.12.732
Hudec J(2018)Automatic Software-Based Self Test Generation for Embedded ProcessorsIFAC-PapersOnLine10.1016/j.ifacol.2018.07.14151:6(125-130)Online publication date: 2018
https://doi.org/10.1016/j.ifacol.2018.07.141
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Published In

SAC '03: Proceedings of the 2003 ACM symposium on Applied computing

March 2003

1268 pages

ISBN:1581136242

DOI:10.1145/952532

Conference Chair:
Gary B. Lamont
Air Force Institute of Technology
,
Program Chairs:
Hisham Haddad
Kennesaw State University
,
George A. Papadopoulos
University of Cyprus, Cyprus
,
Publications Chair:
Brajendra Panda
University of Arkansas

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 09 March 2003

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SAC03: ACM Symposium on Applied Computing

March 9 - 12, 2003

Florida, Melbourne

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Overall Acceptance Rate 1,650 of 6,669 submissions, 25%

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Anders JAndreu PBecker BBecker SCantoro RDeligiannis NElhamawy NFaller THernandez CMentens NRizi MPolian ISajadi ASauer MSchwachhofer DReorda MStefanov TTuzov IWagner SZidarič N(2023)A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors2023 IEEE European Test Symposium (ETS)10.1109/ETS56758.2023.10174099(1-10)Online publication date: 22-May-2023
https://doi.org/10.1109/ETS56758.2023.10174099
Hudec J(2019)Enhancement of Adaptive Software-Based Self Test Generation of Embedded Processors CoresIFAC-PapersOnLine10.1016/j.ifacol.2019.12.73252:27(56-61)Online publication date: 2019
https://doi.org/10.1016/j.ifacol.2019.12.732
Hudec J(2018)Automatic Software-Based Self Test Generation for Embedded ProcessorsIFAC-PapersOnLine10.1016/j.ifacol.2018.07.14151:6(125-130)Online publication date: 2018
https://doi.org/10.1016/j.ifacol.2018.07.141
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