research-article

Cross-layer fault-space pruning for hardware-assisted fault injection

Authors:

Christian Dietrich,

Achim Schmider,

Guillermo Payá Vayá,

Daniel LohmannAuthors Info & Claims

DAC '18: Proceedings of the 55th Annual Design Automation Conference

Article No.: 79, Pages 1 - 6

https://doi.org/10.1145/3195970.3196019

Published: 24 June 2018 Publication History

Abstract

With shrinking structure sizes, soft-error mitigation has become a major challenge in the design and certification of safety-critical embedded systems. Their robustness is quantified by extensive fault-injection campaigns, which on hardware level can nevertheless cover only a tiny part of the fault space.

We suggest Fault-Masking Terms (MATEs) to effectively prune the fault space for gate-level fault injection campaigns by using the (software-induced) hardware state to dynamically cut off benign faults. Our tool applied to an AVR core and a size-optimized MSP430 implementation shows that up to 21 percent of all SEUs on flip-flop level are masked within one clock cycle.

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Cited By

Ko YBurgstaller BGrosser TDubach CSteuwer MXue JOttoni GQuintão Pereira F(2024)BEC: Bit-Level Static Analysis for Reliability against Soft ErrorsProceedings of the 2024 IEEE/ACM International Symposium on Code Generation and Optimization10.1109/CGO57630.2024.10444844(283-295)Online publication date: 2-Mar-2024
https://dl.acm.org/doi/10.1109/CGO57630.2024.10444844
Jiang HZhang FDworak JNepal KManikas T(2023)Increased Detection of Hard-to-Detect Stuck-at Faults during Scan ShiftJournal of Electronic Testing10.1007/s10836-023-06060-z39:2(227-243)Online publication date: 25-Apr-2023
https://doi.org/10.1007/s10836-023-06060-z
Thomas TDietrich CPusz OLohmann D(2022)ACTOR: Accelerating Fault Injection Campaigns Using Timeout Detection Based on AutocorrelationComputer Safety, Reliability, and Security10.1007/978-3-031-14835-4_17(252-266)Online publication date: 25-Aug-2022
https://doi.org/10.1007/978-3-031-14835-4_17
Show More Cited By

Cross-layer fault-space pruning for hardware-assisted fault injection
1. Hardware

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cover image ACM Conferences

DAC '18: Proceedings of the 55th Annual Design Automation Conference

June 2018

1089 pages

ISBN:9781450357005

DOI:10.1145/3195970

Copyright © 2018 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than the author(s) must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected].

Sponsors

EDAC: Electronic Design Automation Consortium
SIGDA: ACM Special Interest Group on Design Automation
IEEE Council on Electronic Design Automation (CEDA)

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SIGBED: ACM Special Interest Group on Embedded Systems

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Association for Computing Machinery

New York, NY, United States

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Published: 24 June 2018

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Deutsche Forschungsgemeinschaft

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DAC '18

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DAC '18: The 55th Annual Design Automation Conference 2018

June 24 - 29, 2018

California, San Francisco

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

Ko YBurgstaller BGrosser TDubach CSteuwer MXue JOttoni GQuintão Pereira F(2024)BEC: Bit-Level Static Analysis for Reliability against Soft ErrorsProceedings of the 2024 IEEE/ACM International Symposium on Code Generation and Optimization10.1109/CGO57630.2024.10444844(283-295)Online publication date: 2-Mar-2024
https://dl.acm.org/doi/10.1109/CGO57630.2024.10444844
Jiang HZhang FDworak JNepal KManikas T(2023)Increased Detection of Hard-to-Detect Stuck-at Faults during Scan ShiftJournal of Electronic Testing10.1007/s10836-023-06060-z39:2(227-243)Online publication date: 25-Apr-2023
https://doi.org/10.1007/s10836-023-06060-z
Thomas TDietrich CPusz OLohmann D(2022)ACTOR: Accelerating Fault Injection Campaigns Using Timeout Detection Based on AutocorrelationComputer Safety, Reliability, and Security10.1007/978-3-031-14835-4_17(252-266)Online publication date: 25-Aug-2022
https://doi.org/10.1007/978-3-031-14835-4_17
Van Acker BOakes BMoradi MDemeulenaere PDenil JGuerra EIovino L(2020)Validity frame concept as effort-cutting technique within the verification and validation of complex cyber-physical systemsProceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems: Companion Proceedings10.1145/3417990.3419226(1-10)Online publication date: 16-Oct-2020
https://dl.acm.org/doi/10.1145/3417990.3419226

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