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Using reiterative LFSR based X-masking to increase output compression in presence of unknowns

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GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSI

Pages 355 - 358

https://doi.org/10.1145/1366110.1366194

Published: 04 May 2008 Publication History

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Abstract

This paper addresses the problem of increasing unknowns in the output response data by exploring reiterative LFSR reseeding based X-masking. This approach takes advantage of the data correlation in the output response data to enable LFSR encoded masks to be reused for multiple scan slices while guaranteeing that all unknowns are masked and all bits required for fault detection are allowed to propagate to the compactor. This paper also investigates a hybrid approach that combines conventional LFSR reseeding based X-masking with fixed-interval reiterative LFSR X-masking. Experimental results for applying this approach to industrial designs indicate that significant amounts of output compression can be achieved without any pattern count inflation or loss in fault coverage.

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Xu Shubing Reungpeerakul T(2011)A selective X-masking for test responses in the presence of unknown valuesThe 8th Electrical Engineering/ Electronics, Computer, Telecommunications and Information Technology (ECTI) Association of Thailand - Conference 201110.1109/ECTICON.2011.5947796(159-162)Online publication date: May-2011
https://doi.org/10.1109/ECTICON.2011.5947796

Index Terms

Using reiterative LFSR based X-masking to increase output compression in presence of unknowns
1. Hardware
  1. Hardware test
  2. Robustness

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Published In

GLSVLSI '08: Proceedings of the 18th ACM Great Lakes symposium on VLSI

May 2008

480 pages

ISBN:9781595939999

DOI:10.1145/1366110

General Chairs:
Vijay Narayanan
Penn State University
,
Zhiyuan Yan
Lehigh University
,
Program Chairs:
Enrico Macii
Politecnico di Torino
,
Sanjukta Bhanja
University of South Florida

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 04 May 2008

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Xu Shubing Reungpeerakul T(2011)A selective X-masking for test responses in the presence of unknown valuesThe 8th Electrical Engineering/ Electronics, Computer, Telecommunications and Information Technology (ECTI) Association of Thailand - Conference 201110.1109/ECTICON.2011.5947796(159-162)Online publication date: May-2011
https://doi.org/10.1109/ECTICON.2011.5947796

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Interval Based X-Masking for Scan Compression Architectures

Masking of X-values by Use of a Hierarchically Configurable Register

Using partial masking in X-chains to increase output compaction for an X-canceling MISR

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Interval Based X-Masking for Scan Compression Architectures

Masking of X-values by Use of a Hierarchically Configurable Register

Using partial masking in X-chains to increase output compaction for an X-canceling MISR

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