Calibration and Debugging of Multi-Step Analog to Digital Converters

A Zjajo, JP de Gyvez - 4th IEEE International Symposium on …, 2008 - ieeexplore.ieee.org
A Zjajo, JP de Gyvez
4th IEEE International Symposium on Electronic Design, Test and …, 2008ieeexplore.ieee.org
This paper reports a new approach for debugging of the analog to digital converters based
on process monitoring and extended design-for-test implementation. The circuit is re-
configured in such a way that all sub-blocks are analysed and tested for their full input range
allowing full observability and controllability of the analog to digital converter. To set initial
data, estimate the parameter update and to guide the test, dedicated monitors have been
designed. Additionally, the second presented algorithm allow circuit calibration without …
This paper reports a new approach for debugging of the analog to digital converters based on process monitoring and extended design-for-test implementation. The circuit is re-configured in such a way that all sub-blocks are analysed and tested for their full input range allowing full observability and controllability of the analog to digital converter. To set initial data, estimate the parameter update and to guide the test, dedicated monitors have been designed. Additionally, the second presented algorithm allow circuit calibration without explicit need for any dedicated test signal nor requires a part of the conversion time. It works continuously and with every signal applied to the ADC.
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