An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells
Aggressive technology scaling causes unavoidable reliability issues in modern high-
performance integrated circuits. The major reliability factors in nanoscale VLSI design is the
negative bias temperature instability (NBTI) degradation and soft-errors in the space and
terrestrial environment. In this paper, an on-chip analog adaptive body bias (OA-ABB) circuit
to compensate the degradation due to NBTI aging is presented. The OA-ABB is used to
compensate the parameter variations and improves the SRAM circuit yield regarding read …
performance integrated circuits. The major reliability factors in nanoscale VLSI design is the
negative bias temperature instability (NBTI) degradation and soft-errors in the space and
terrestrial environment. In this paper, an on-chip analog adaptive body bias (OA-ABB) circuit
to compensate the degradation due to NBTI aging is presented. The OA-ABB is used to
compensate the parameter variations and improves the SRAM circuit yield regarding read …
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