Jun 30, 2020 · Abstract: For the first time, a comprehensive study of embedded nonvolatile memory (eNVM) resistive random access memory (RRAM) reliability ...
We demonstrate 10 year retention and endurance to 1000 write cycles across the automotive grade II temperature range (-40C to 105C) as well as 5x JEDEC reflow ...
Despite their functionality, memristors are not flawless. Their imperfections can lead to bit errors, which are eliminated using strong error correction ...
Mar 31, 2019 · eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. 2020 IEEE International Reliability Physics Symposium (IRPS). For ...
Embedded RRAM technology presented in this paper achieves 104 cycle endurance combined with 85°C 10-year retention and high die yield, and data retention, ...
2019 Symposium on VLSI Technology, T230-T231, 2019. 73, 2019. eNVM RRAM reliability performance and modeling in 22FFL FinFET technology. YF Chang, JA O'Donnell ...
In this work, we briefly review both Intel 22FFL eNVM-R (embedded non-volatile memory -resistive type) and eNVM-M (embedded non-volatile memory -magnetic ...
[PDF] Emerging Memory RRAM Embedded in 12FFC FinFET Technology for ...
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In this work, a mega-bit RRAM macro embedded into TSMC 12FFC. FinFET logic platform have been demonstrated with superior reliability performance. An innovative ...
Missing: modeling | Show results with:modeling
eNVM MRAM Retention Reliability Modeling in 22FFL FinFET ...
www.semanticscholar.org › paper › eNV...
The observed time and temperature scaling relationships for both the parallel and anti-parallel magnetic states are discussed, and empirically-based models ...
Missing: performance | Show results with:performance
Non-volatile RRAM embedded into 22FFL FinFET technology. O Golonzka, U ... 2014. eNVM RRAM reliability performance and modeling in 22FFL FinFET technology.