This paper proposes a testing scheme to detect abnormal skews between clock signals inside digital synchronous ICs. The scheme is based on a new CMOS ...

1 Introduction. The scaling of interconnections and the increas- ing of both speed and size of digital circuits have made critical the distribution of ...

A testing scheme to detect abnormal skews between clock signals inside digital synchronous ICs based on a new CMOS sensing circuit whose compactness and ...

1 Introduction. The scaling of interconnections and the increas- ing of both speed and size of digital circuits have made critical the distribution of ...

This paper proposes a testing scheme to detect abnormal skews between clock signals inside digital synchronous ICs. The scheme is based on a new CMOS ...

May 20, 2022 · Bibliographic details on Testing scheme for IC's clocks.

To evaluate the number of S-CDC faults detected by the baseline LoC/TDF method, we used a commercial ATPG tool to generate test patterns detecting all slow-to- ...

Dec 1, 2011 · A system for scan testing various clock domains of an integrated circuit includes a clock gate control unit and clock gating cells.

Apr 22, 2024 · Learn the basics of In-Circuit test for electronics manufacturing - the key to detecting defects early and ensuring quality in the ...

This thesis addresses the problem of prebond die testability by ensuring the clock distribution network on a single die will operate with low skew during ...