Reed-Muller coefficients are used to generate a test-pattern selection procedure for detecting single stuck-at faults. This procedure is based on the ...

Oct 22, 2024 · Reed-Muller coefficients are used to generate a test-pattern selection procedure for detecting single stuck-at faults.

Abstract-This paper describes a new procedure, based on a heuristics obtained from the Reed-Muller transform, to gen- erate the test patterns required for ...

Reed-Muller coefficients are used to generate a test-pattern selection procedure for detecting single stuck-at faults. This procedure is based on the ...

A new algebraic procedure to determine test patterns for stuck-line faults in combinational logic circuits is proposed. It is based on the use of Reed–Muller ...

In this paper we consider a new spectral (transform) technique called the Reed-Muller (RM) spectral technique which is based on the Reed-Muller canonical. (RMC) ...

A new algebraic procedure to determine test patterns for stuck-line faults in combinational logic circuits is proposed, based on the use of Reed-Muller ...

Cet article présente une méthode de génération assistée de tests. Elle applique des critères dynamiques de sélection des tests (TP) sur un modèle formel ...

Test-Pattern Generation Based on Reed-Muller Coefficients. Reed-Muller ... This paper studies the test pattern generation problem for FPGA implemented ...

In this paper, based on the “patterned” property of the proposed patterned Reed–Muller (PRM) sequences, we design a slot-pattern-control (SPC) criterion that ...