Abstract: Controlled modification of different process parameters, using designed experiments, is a key method of achieving high yield in a volume ...
This work presents a novel approach of using volume diagnosis to aid in the screening process. Silicon case studies are presented to validate the production.
This work presents a novel approach of using volume diagnosis to aid in the screening process and Silicon case studies are presented to validate the ...
Apr 25, 2024 · Systematic defect screening in controlled experiments using volume diagnosis. ITC 2012: 1-7. [+][–]. Coauthor network. maximize. Note that this ...
Volume diagnosis has been used effectively to identify systematic defects for yield learning. Root cause deconvolution (RCD), an unsupervised machine ...
Missing: screening | Show results with:screening
Systematic defect screening in controlled experiments using volume diagnosis ... This work presents a novel approach of using volume diagnosis to aid in the ...
Sep 1, 2014 · This study presents a systematic defect diagnosis to identify 'culprit physical features' that are potentially responsible for yield loss.
Missing: screening | Show results with:screening
This information is combined with volume diagnosis data to identify outliers (i.e., systematic defects). Work in [16] applies clustering techniques to test ...
This work studies a data-driven methodology for detecting systematic defects using layout-aware scan diagnosis data and provides physical candidates to ...
Missing: controlled | Show results with:controlled
Identification of systematic defects is therefore very important for yield improvement. This paper discusses a diagnosis-driven systematic defect identification ...