Aug 12, 2010 · A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented.
Dec 30, 2010 · Abstract—A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations.
A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented.
A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented.
Stochastic analysis of deep-submicron CMOS process for reliable circuits designs. IEEE Transactions on Circuits and Systems Part 1: Regular Papers, 58(1) ...
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IEEE 3rd European Design Automation Conference, 520-524, 1992. 31, 1992. Stochastic analysis of deep-submicrometer CMOS process for reliable circuits designs. A ...
1996. Stochastic analysis of deep-submicrometer CMOS process for reliable circuits designs. A Zjajo, Q Tang, M Berkelaar, JP de Gyvez, A Di Bucchianico ...
Stochastic analysis of deep-submicrometer CMOS process for reliable circuits designs. A Zjajo, Q Tang, M Berkelaar, JP de Gyvez, A Di Bucchianico, ...
Probability of the proposed model. Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs. Article. Full-text available. Feb 2011.
Dec 25, 2020 · In this research, the stochastic behaviours of transformer have been analysed by using the stochastic differential equation approach.