In this experiment, the defective part level for REDO-based patterns was 1,288 parts per million lower than that achieved by DC stuck-at based patterns ...
In this experiment, the defective part level for REDO-based patterns was 1,288 parts per million lower than that achieved by DC stuck-at based patterns ...
In this experiment, the defective part level for REDO- based patterns was 1,288 parts per million lower than that achieved by DC stuck-at based patterns ...
We applied a traditional test pattern set consistent with current best commercial practice and our en- hanced test pattern set to an actual integrated circuit.
For the first time, test pattern generation techniques that attempt to maximize non-target defect detection have been used to test a real, 100% scanned, ...
Missing: Probabilistic | Show results with:Probabilistic
Jaehong Park's 7 research works with 196 citations, including: REDO - Random Excitation and Deterministic Observation - First Commercial Experiment.
Modeling the Probability of Defect Excitation for a ... REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment.
5, "REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment," Proceedings of the 1999 IEEE VLSI Test Symposium (VTS 99); ...
REDO-random excitation and deterministic observation-first commercial experiment ... 2004. Modeling the probability of defect excitation for a commercial IC ...
Missing: Probabilistic | Show results with:Probabilistic
Wang, and M. R. Mercer, "REDO -- Random Excitation and Deterministic Observation --. First Commercial Experiment," Proc. 1999 IEEE VLSI Test Symposium, Dana ...