Partial scan design is divided into two stages: 1) critical cycle breaking and 2) partial scan flip-flop selection with respect to conflict resolution.

Abstract: State information of a sequential circuit can be used to evaluate the complexity of test generation. The ratio of valid states to all the states ...

A multiple phase partial scan design method is introduced by combining circuit state information and conflict analysis. Critical cycles are broken using a ...

Cycles are broken selectively on the basis of the circuit state information. Good fault coverage and test efficiency are obtained when fewer scan flip flops ...

Cycles are broken selectively on the basis of the circuit state information. Good fault coverage and test efficiency are obtained when fewer scan flip flops ...

Partial Scan Design Based on Circuit State Information ... State information of a sequential circuit can be used to evaluate the complexity of test generation.

Partial Scan Design Based on Circuit State Information and Conflict Analysis · Abstract. A multiple phase partial scan design method that breaks critical cycles ...

Partial scan design is divided into two stages: 1) critical cycle breaking and 2) partial scan flip-flop selection with respect to conflict resolution.

A global partial scan design algorithm based on circuit state information is proposed. Valid states obtained via logic simulation are used to evaluate ...

Partial scan FF selection method based on reachable states is proposed as a de- sign for testability of a sequential circuit, and its validity is evaluated.