Abstract: Points out that scan design approach is representative of those techniques that can reduce the cost of test generation for sequential circuits.
This paper proposes a design-for-testability approach called Parity-. Scan Design which can reduce the cost of test application as well as the cost of test ...
Parity-Scan Design to Reduce the Cost of Test Application. Authors: Hideo Fujiwara.
(PDF) Parity-Scan Design to Reduce the Cost of Test Application
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This paper proposes a design-for-testability approach called Parity-Scan Design which can reduce the cost of test application as well as the cost of test ...
A design-for-testability approach called parity-scan design which can reduce the cost of test application as well as the cost of test generation for sequential ...
In this scan design methodology, only selected faults are targeted for detection. These faults are those not detected by the designer's functional vectors.
Hideo Fujiwara, Akihiro Yamamoto: Parity-scan design to reduce the cost of test application. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Parity-Scan Design to Reduce the Cost of Test Application. Conference Paper in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ...
A full-scan structure is described, in which the classic single serial scan-path and the parallel-in/serial-out scan (PASE-Scan) designs coexist.
However, scan design increases the test application cost and test power consumption drastically. ... Some methods have been proposed to reduce test application ...