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This paper presents a new fault-independent method for maximizing local conflicting value assignments for the purpose of untestable faults identification.
This paper presents a new fault-independent method for maximizing local conflicting value assignments for the purpose of untestable faults identification.
Abstract. This paper presents a new fault-independent method for maximizing local conflicting value assignments for the purpose of untestable faults ...
This paper presents a new fault-independent method for maximizing local conflicting value assignments for the purpose of untestable faults identification.
Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02). 1530-1591/02 $17.00 © 2002 IEEE ...
Maximizing impossibilities for untestable fault identification. Hsiao M.S.. Expand. Publication type: Proceedings Article. —. DOI: 10.1109/DATE.2002.998414.
Untestable faults in circuits are defects/faults for which there exists no test pattern that can either excite the fault or propagate the fault effect to an ...
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What are the ATPG untestable faults?
Maximizing Impossibilities for Untestable Fault Identification. Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/date/Hsiao02. Home | Example ...
Since each unexcitable net generally infers to more than one untestable fault, this theorem helps us to quickly identify significantly more sequentially.
This paper considers the theorem that resulted in one of the most effective procedures for identifying undetectable faults, and shows conditions on fault free ...