The stuck-at fault model has been used over decades as a guide to the test generation process and as an evaluation mechanism for the quality of the test set ...

This paper provides some insight on the issue and shows the limitations of using the stuck-at fault coverage to predict the defect level. We demonstrate that as ...

This paper provides some insight on the issue and shows the limitations of using the stuck-at fault coverage to predict the defect level. The authors ...

The authors demonstrate that as defect level decreases the uncertainty of the estimate grows and the limitations of using the stuck-at fault coverage to ...

This paper uses a relation of fault coverage and defect level to determine the number of random patterns required to obtain a certain defect level.

Ray Mercer and T. W. Williams, "Limitations in Predicting Defect Level Based on Stuck-at Fault. Coverage," the VLSI Test Symposium 1994.

If only a subset of defects are modeled as faults, then as fault coverage approaches loo%, the tests will be more and more biased in favor of fault de- tection.

Oct 22, 2024 · The fault coverage of a specific testbench determines the ratio of identified hardware faults based on a specific fault model, which is ...

The computed fault coverage is usually the single line stuck-at fault coverage. In the Williams-Brown model, dies are assumed to have equally probable stuck-at.

This paper analyzes the possibilities and limitations of defect detection using fault model oriented test sequences.