Jan 18, 2007 · The screening test is applied to the high-frequency bit-stream output of the ΣΔ modulator and has potential for on-chip implementation.
This paper proposes an alternative hybrid solution based on an initial low-cost wafer level screening test followed by a DSP based technique on marginal devices ...
This paper proposes an alternative hybrid solution based on an initial low-cost wafer level screening test followed by a DSP based technique on marginal devices ...
Kostas Georgopoulos, A. Lechner, M. Burbidge, Andrew Richardson: Investigation into the Use of Hybrid Solutions for SigmaDelta A/D Converter Testing. 359 ...
Investigation into the use of hybrid solutions for high-resolution A/D converter testing. Bookmark. by Konstantinos Georgopoulos; •. Bit stream manipulation for ...
Sigma-delta modulators are commonly used in high-resolution analog-to-digital converters (ADCs). Testing this type of modulator requires a high-resolution ...
In the present study part of a Sigma–Delta ADC is brought at pixel level leading to an even more integrated solution. Each pixel of the CMOS image sensor chip ...
Various systems and methods for capturing data are disclosed. For example, some embodiments of the present invention provide methods for performing a first ...
Missing: Investigation | Show results with:Investigation
Sep 16, 2020 · Its operating principles are to continuously compare the sampled input signal with a known voltage and then convert it into a binary number [5,6] ...
Missing: Solutions | Show results with:Solutions
Future work of LogicVision will address the use of other TSGs to enable digital testing for stand- ... methods for analog-to-digital converters: a case study of ...