Mar 14, 2024 · This technique aims at testing a set of analogue-to-digital converters and digital-to-analogue converters in a fully digital setup (using a low- ...

Nov 14, 2024 · Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. Wiley. IET Computers & Digital Techniques. June 2007; 1(3):146 ...

Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC. IET Com- puters & Digital Techniques, Institution of Engineering and ...

The trend towards highly-integrated electronic devices has lead to a growth of system-in-package and system-on-chip technologies, where data converters play ...

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC · V. Kerzérho, P. Cauvet, +3 authors. M. Renovell · Published in IET Computers & ...

... , et al.. Fully. Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC. IET Computers &. Digital Techniques, 2007, 1 (3), pp.146-153.  ...

Different DAC architectures have been developed in the years and several different specifications exist to quantify their effective performance, essential ...

The purpose of this paper is to present a new Design-for-Test (DFT) technique called “Analogue Network of Converters”. This technique aims at testing a set of ...

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. Publication. IET Computers & Digital Techniques. Record type.

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. V. Kerzerho, P. Cauvet, S. Bernard, F. Azaïs, M. Comte, and M. Renovell.