This paper proposes two test generation methods, a fault-independent test generation method and a fault-dependent test generation method, for state-observable ...
Abstract. Since scan testing is not based on the function of the circuit, but rather its structure, this method is considered to be a form of over testing ...
Oct 22, 2024 · This paper proposes two test generation methods, a fault-independent test generation method and a fault-dependent test generation method, for ...
Conference PaperPDF Available. Fault Dependent/Independent Test Generation Methods for State Observable FSMs. November 2006. DOI:10.1109/ATS.2007.4388025.
This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible ...
This paper proposes two test methods, a fault independent functional test method and a fault dependent test generation method, for state-observable FSMs to ...
A Test Generation Methods for State Observable FSMs to Increase ...
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In this paper, we propose a test generation method to detect all testable faults for specified fault models and to increase fault coverage for other main fault ...
This paper proposes a test generation method to detect specified fault models completely and to increase defect coverage as much as possible under test length ...
Fault-dependent/independent Test Generation Methods for State Observable FSMs. ... Faults Using Stuck-at Fault Test Generation Algorithms. DATE 2003: 10310 ...
A Fault Dependent Test Generation Method for State-Observable FSMs to ... Fault-dependent/independent Test Generation Methods for State Observable FSMs.