Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. Abstract: Predicting the final value of the defective part level after ...
The MPG-1 model also requires that different values of T be used to accurately predict the final defective part level for the same circuit and set of defects ...
This research shows that the probability of exciting an as yet undetected defect does indeed decrease exponentially as the number of observations increases, ...
Enhanced DO-RE-ME Based Defect Level Prediction Using Defect ...
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Abstract. Predicting the final value of the defective part level af- ter the application of a set of test vectors is not a simple problem. In order for the ...
Predicting the final value of the defective part level afterthe application of a set of test vectors is not a simple problem.In order for the defective part ...
This research shows that the probability of the exciting an as yet undetected defect does indeed decrease exponentially as the number of observations increases.
Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D ; Fault coverage requirement in production testing of LSI circuits. Agrawal ...
An enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at ...
Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. Jennifer Dworak Michael R. Grimaila Sooryong Lee Li-C. Wang M. Ray ...
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2011. Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. J Dworak, MR Grimaila, S Lee, LC Wang, MR Mercer. Proceedings ...