Abstract: We present a combined hardware-software based approach to scan-chain diagnosis, when the outcome of a test may be affected by system faults ...
In this paper, we focus on diagnosis of multiple faults in scan chains. This diagnosis step could be followed by another step in which faulty nodes in the ...
We present a combined hardware-software based approach to scan-chain diagnosis, when the outcome of a test may be affected by system faults occurring in the ...
Experimental results on benchmark circuits show that near-perfect scan-chain diagnosis for multiple faults is possible even when a large number of random ...
Oct 22, 2024 · A diagnosis technique is presented to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique ...
People also ask
How to detect faults in scan chain?
What do you consider to diagnosis faults?
Observation points in the combinational logic of a circuit can aid in the diagnosis of logic defects by reducing the number of indistinguished fault pairs. This ...
Bibliographic details on Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects.
Locating the scan chain faults is very important for dedicated IC manufacturers to guide the failure analysis process for yield improvement. In this paper, we ...
Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects ... Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis.
This paper analyzes faulty scan chain behaviors. In addition, to stuck-at faults, we also consider timing faults due to hold time violations.